The invention relates to a device (98) for the spatial alignment of X-ray optics (100) with an entry point (104) and an exit point (108). The device (98) comprises a parallel displacement mechanism (200) for gauging the entry point (104) of the X-ray optics (100) to a first predetermined point (100) by parallel displacement of the X-ray optics (100). Further, the device (98) comprises a goniometer mechanism (300) for gauging the exit point (108) of the X-ray optics (100) to a second predetermined point (106) by at least approximate pivoting of the X-ray optics (100) around the entry point (104). Further, the invention relates to an apparatus (96) which comprises the device (98) and X-ray optics (100).

A specimen measuring device includes: a light source device that irradiates a specimen surface of a specimen with illumination light from multiple illumination units at a plurality of illumination angles; a spectral camera device that is arranged above the specimen surface, spectrally separates reflected light from the specimen surface, and acquires 2D spectral information through a single image capturing operation; and a calculating unit that calculates deflection angle spectral information of the specimen surface used to measure a measurement value of a certain evaluation item of the specimen using a change in an optical geometrical condition of an illumination direction and an image capturing direction between pixels in an X axis direction and a Y axis direction of the spectral information.

A system and method of quantifying a difference between gonioapparent colored surfaces includes determining a lightness (L*), a sparkle area (Sa), and a sparkle intensity (Si) of the first and second surfaces at a first aspecular angle and at a second aspecular angle. A sparkle metric (SpkM) to quantify the difference between the first and second surfaces is calculated utilizing the lightness (L*), the sparkle area (Sa), and the sparkle intensity (Si) of the first and second surfaces at the first and second aspecular angles.

A measuring apparatus that measures an optical characteristic of a surface in accordance with a standard selected from a plurality of standards is provided. The apparatus includes an illumination device configured to illuminate the surface with light from a light source, an imaging device configured to image the light source with reflected light from the surface illuminated by the illumination device, and a processor configured to process image data having number of pixels obtained by reducing number of pixels of the imaging device by a reduction rate to obtain the optical characteristic of the surface. The processor is configured to determine the reduction rate based on the selected standard.

An optical system (230) comprises an image sensor (231), a reference sensor (232), and an optical multiplexer (300). The optical multiplexer defines a first area for receiving a first portion of incoming light and a second area (320) for receiving a second portion of the incoming light. The second area radially surrounds the first area. The optical multiplexer is arranged to direct the first portion of the incoming light to the image sensor (231) and the second portion of the incoming light to the reference sensor (232). The optical multiplexer may take the form of a pinhole minor (300).