A method for detecting damage to a converter device of a lighting apparatus is provided. The method may include irradiating the converter device with input light, detecting a useful light portion emitted principally by a first section of the converter device by means of a first sensor element. A first detection signal is obtained, detecting a useful light portion emitted principally by a second section of the converter device, said second section being different than the first section, by means of a second sensor element. A second detection signal is obtained. The method further may include automatically obtaining damage information about the converter device from a ratio or a difference of the first detection signal with respect to either the second detection signal or a comparison signal formed therefrom.

A polarization analysis apparatus includes: a light source that radiates light to a sample; a liquid crystal panel that outputs polarized light in a specific direction from light radiated from an excited state sample; an image sensor that measures a luminance of polarized light; and a controller that controls the liquid crystal panel and the image sensor. The controller calculates a reference voltage of a rectangular wave; calculates a corrected reference voltage by correcting the reference voltage in the rectangular wave where an absolute value of the reference voltage changes in response to a phase change; applies the reference voltage and the corrected reference voltage to the liquid crystal panel; operates the image sensor in accordance with a light exposure time to measure luminance of polarized light; and calculates a degree of polarization of the sample based on results of the measurement.

An apparatus for characterizing luminescent entities by excitation comprising: a substrate (6) being in contact with a solution comprising luminescent entities; a source of electromagnetic radiation (4) providing at least a primary beam of radiation (8); an objective (5); a first optical element (1) capable of transforming the intensity profile of the primary beam (8) into an arbitrary secondary intensity profile (distribution) (9); a second optical element (2) capable of separating (discriminating) radiation by wavelength; and a detector (7), where the arbitrary secondary intensity profile has at least an off-center circular continuous intensity distribution (33) focused on the back focal plane (12) of the objective forming a collimated beam (10) capable of creating an evanescent field on the side of the substrate where the solution comprising luminescent entities are located, where the evanescent field excites the luminescent entities thereby creating emission radiation separated by the second optical element (2) and captioned by the detector (7). The invention also relates to an apparatus comprising two optical elements providing a final third intensity profile (distribution) which is the convolution of two mathematical transformations corresponding to each of optical element one and four, respectively.

Method and system for measuring a physical parameter of a target region of a medium are provided, wherein: an excitation wave having a periodic modulation over time of a physical characteristic is emitted, a return wave is periodically deflected with a controllable deflecting element so that the deflected wave scans a transducer array, each transducer being associated with a predefined phase range of the periodic modulation, a phase image is recorded during at least one period of the periodic modulation, a phase shift between a periodic modulation of the return wave and the periodic modulation of the excitation wave is determined from the phase image, a physical parameter of the target region is determined from the phase shift.

A non-invasive measurement of biological tissue reveals information about the function of that tissue. Polarized light is directed onto the tissue, stimulating the emission of fluorescence, due to one or more endogenous fluorophors in the tissue. Fluorescence anisotropy is then calculated. Such measurements of fluorescence anisotropy are then used to assess the functional status of the tissue, and to identify the existence and severity of disease states. Such assessment can be made by comparing a fluorescence anisotropy profile with a known profile of a control.

Systems, devices, and methods for producing an optimized phase mask for use in a single-molecule orientation localization microscopy (SMOLM) imaging system are disclosed.

Systems and methods for hyperspectral imaging are described. In one implementation, a hyperspectral imaging system includes a sample holder configured to hold a sample, an illumination system, and a detection system. The illumination system includes a light source configured to emit excitation light having one or more wavelengths, and a first set of optical elements that include a first spatial light modulator (SLM), at least one lens, and at least one dispersive element. The illumination system is configured to structure the excitation light into a predetermined two-dimensional pattern at a conjugate plane of a focal plane in the sample, spectrally disperse the structured excitation light in a first lateral direction, and illuminate the sample in an excitation pattern with the one or more wavelengths dispersed in the first lateral direction.

A super resolution microscope system is disclosed and described. The system can include a sample stage (180) adapted to receive a sample (185) including probe molecules. At least one light source (105) is provided to produce a coherent excitation light to excite the probe molecules and cause luminescence of the probe molecules. An image detector (100) can detect the luminescence from the probe molecules. A microlens array (125) can be positioned in a beam path (110) of the coherent light from the at least one light source (105). The beam path (110) of the coherent light extends between the light source (105) and the sample stage (180). The microlens array (125) can also be positioned in a beam path (112) of the luminescence from the probe molecules. The beam path (112) of the luminescence extends between the sample stage (180) and the image detector (100).

In one aspect, presence and/or level of an analyte within a sample is determined by use of a construct comprising a magnetic moiety and a fluorescent moiety. In one embodiment, the construct is magnetically migrated to a transparent surface and then dragged along the surface. In one aspect, an evanescent field is applied and changes in the diffusional or rotational properties of the fluorescent moiety as it migrates in and out of the evanescent field are measured by changes in its fluorescent emission, providing a measure of the interaction between the construct and a component of the sample.

A inspection system includes an illumination source to generate an illumination beam, focusing elements to direct the illumination beam to a sample, a detector, collection elements configured to direct radiation emanating from the sample to the detector, a detection mode control device to image the sample in two or more detection modes such that the detector generates two or more collection signals based on the two or more detection modes, and a controller. Radiation emanating from the sample includes at least radiation specularly reflected by the sample and radiation scattered by the sample. The controller determines defect scattering characteristics associated with radiation scattered by defects on the sample based on the two or more collection signals. The controller also classifies the one or more particles according to a set of predetermined defect classifications based on the one or more defect scattering characteristics.