Methods and systems for generating inspection results for a specimen with an adaptive nuisance filter are provided. One method includes selecting a portion of events detected during inspection of a specimen having values for at least one feature of the events that are closer to at least one value of at least one parameter of the nuisance filter than the values for at least one feature of another portion of the events. The method also includes acquiring output of an output acquisition subsystem for the sample of events, classifying the events in the sample based on the acquired output, and determining if one or more parameters of the nuisance filter should be modified based on results of the classifying. The nuisance filter or the modified nuisance filter can then be applied to results of the inspection of the specimen to generate final inspection results for the specimen.

A method and device recognize and analyze surface defects in three-dimensional objects having a reflective surface, in particular motor vehicle bodies. In which method the surface defects are identified by the evaluation of an image, recorded by a camera in the form of a raster image of pixels, of an illumination pattern projected by a first illumination device onto a part of the reflective surface using a two-dimensional raster coordinate system. The surface defects are identified exclusively using two-dimensional image information with the aid of image processing algorithms without the need for “environmental parameters”, and complex geometric calculations can be omitted. The solution is fast and robust and can be carried out using differently configured first illumination devices, which makes it suitable for mobile applications, for example as a hand-held module. It is also made possible for the method to be optimized by a “deep learning” strategy.

A die bonding apparatus includes a first illumination device for irradiating a die with light along an optical axis of a photographing device, and a second illumination device that is located above the first illumination device and irradiates the die with light having a predefined angle with respect to the optical axis. The second illumination device includes a second light emitting section, and a light path control member that limits a light path of second irradiation light emitted from the second light emitting section. The second illumination device is disposed in such a way that the second irradiation light, the light path of which is limited by the light path control member, passes through the cylinder of the first illumination device, and the top surface of the die is irradiated with the second irradiation light.

A method of nondestructive testing includes receiving data characterizing an image of an inspection region of an industrial machine acquired by an inspection device configured to inspect the inspection region. The inspection device includes a camera and a light source. The camera has a first position and a first orientation and the light source has a second position and a second orientation when the image is acquired. The method also includes identifying a defect in the inspection region of the industrial machine based on the received data characterizing the image of the inspection region. The method further includes determining that a new image of the inspection region needs to be acquired. The method also includes varying one or more of position of the camera, orientation of the camera, position of the light source and orientation of the light source.

A spectroscopic camera according to the present disclosure includes a spectroscopic section configured by a variable wavelength interference filter that selectively transmits light at a predetermined wavelength and changes the light to transmitted light, a receiving section configured to receive sensitivity information indicating a sensitivity curve in a wavelength region of a predetermined color imaged by an RGB camera, a wavelength-table generating section configured to generate, based on the sensitivity information, a wavelength table indicating a relation between the predetermined wavelength and a transmission time, which is a time for transmitting the transmitted light, an imaging section configured to acquire a spectral image formed by the transmitted light transmitted through the spectroscopic section, and a control section configured to control the spectroscopic section and the imaging section based on the wavelength table.

An optical fiber, manufacturing intermediate for forming an optical fiber and a method for forming an optical fiber. The method includes providing a manufacturing intermediate having an elongate body and having an aperture extending through the elongate body along an axial dimension of the elongate body, a boundary of the aperture defining an internal surface of the manufacturing intermediate. The method further includes etching the internal surface of the manufacturing intermediate using an etching substance, and drawing the manufacturing intermediate along the axial dimension so as to form the optical fiber.

An inspection apparatus includes: a changing unit configured to change a condition for shooting an object to various shooting conditions; a shooting condition selecting unit configured to select all of the various shooting conditions in inspection of the object executed before a predetermined condition is established, and select one or a plurality of shooting conditions from the various shooting conditions based on effectiveness of each of the shooting conditions in inspection of the object executed after the predetermined condition is established; an image acquiring unit configured to control the changing unit and thereby acquire an image of the object under each of the selected shooting conditions; an anomaly detecting unit configured to detect an anomaly of the object based on the acquired image; and an effectiveness updating unit configured to update the effectiveness based on the acquired image.

An optical scanning system includes a first radiating source capable of outputting a first source light beam, a second radiating source capable of outputting a second source light beam, a first time-varying beam reflector configured to direct the first source light beam and the second source light beam toward the sample, a scan lens configured to focus the first source light beam and the second source light beam reflected by the first time-varying beam reflector onto the sample, and a compound ellipsoidal collector configured to direct light scattered from the sample toward a scattered radiation detector. The optical scanner causes one of the first or second source light beams to be directed towards a sample at an incident angle. The first light beam has a first wavelength, the second light beam has a second wavelength, and the first wavelength and the second wavelength are not the same.

The invention relates to a method for inspecting a coated surface for a surface defect. The method comprises: using (102) a device (200, 300, 400, 700, 800, 900) for covering the coated surface to be inspected, the device being configured to create an enclosed space to isolate the surface coating to be inspected from ambient illumination in order to provide predefined photographic acquisition conditions within the enclosed space; acquiring (104) a photo of the coated surface being within the enclosed space; and inspecting (106) the photo for the presence of the surface defect.

An example system for detecting pipe defects is provided. The system includes a transmitter, a receiver and a processing device. The transmitter is oriented to transmit Terahertz (THz) waveform pulses towards at least one of an outer surface of a pipe or an inner surface of the pipe. The receiver is oriented to receive reflected Terahertz (THz) waveform pulses from at least one of the outer surface of the pipe or the inner surface of the pipe. The processing device configured is to receive as input the Terahertz (THz) waveform pulses transmitted from the transmitter and the reflected Terahertz (THz) waveform pulses received by the receiver and, based on the received input, determine if a defect in the pipe exists.