A computer-based system and method for taking clarity measurements of a gem, and a computer-readable medium having computer-executable instructions, are provided and include receiving a pixilated image of a gem and identifying pixels representing an inclusion. The method and medium further include determining characteristics of the inclusion as a function of the pixels representing the inclusion, and providing a clarity grade based upon the determined characteristics. Also provided is a method for mapping a gem, and a computer-readable medium having computer-executable instructions, which include receiving a pixilated image of a gem having facet edges, and identifying pixels representing the facet edges. The method and medium further include generating a diagram of the gem, such that the diagram is a function of the pixels representing the facet edges, and superimposing the diagram onto the pixilated image.

A lighting system for surface inspection includes an elongated substrate onto which a linear array of lights is mounted to provide extended light coverage. The lights may be dimmable and controlled by a circuit board to reduce veiling glare. A heat sink may disperse heat built up from the linear array of lights. A handle and articulated drop-in pin may provide means to focus all the lights in the same direction and point the lights onto a surface using a single hand or during hands-free use.

A method comprises: directing a laser beam onto a side of a tube, wherein the side includes a defect; moving the tube with respect to the laser beam such that the laser beam beams onto the defect; sensing a reflection of the laser beam from the side based on the defect; computationally identifying a change between the laser beam and the reflection; computationally acting based on the change. The side can be internal or external. In other implementations, the laser beam is moved with respect to the tube such that the laser beam beams onto the defect.

A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light.

An inspection condition determination device comprises: an addition unit that adds data mimicking a flaw assumed to occur in an inspection target to a designated position of a three-dimensional model of the inspection target; a generation unit that generates an image without a flaw by replicating an optical condition for capturing an image of the inspection target on the three-dimensional model, and an image with the flaw by replicating the optical condition on the three-dimensional model to which the data mimicking the flaw is added; a determination unit that determines whether or not a difference between the image without a flaw and the image with the flaw at the designated position exceeds a threshold that allows detection of the flaw in the inspection target; and an extraction unit that extracts an optical condition available for detecting flaws of multiple designated patterns from multiple optical conditions.

Systems and methods for performing one or more processes on a specimen are provided. One system includes a deposition module incorporated into an existing tool configured to perform an inspection and/or metrology process. The deposition module is configured to deposit one or more materials on a specimen prior to the inspection and/or metrology process performed on the specimen. In some embodiments, the system also includes a stripping module incorporated into the existing tool, and the stripping module is configured to remove material(s) from the specimen subsequent to the inspection and/or metrology process performed on the specimen. The existing tool includes an illumination subsystem configured to direct light having one or more illumination wavelengths to the specimen; a detection subsystem configured to detect light from the specimen; and a computer subsystem configured to determine information for the specimen using output generated by the detection subsystem responsive to the detected light.

A circular scratch inspection apparatus includes: a camera capturing an image of a workpiece surface around a hole; illumination device emitting light to the workpiece surface around the hole, the light being reflected on the workpiece surface is not directly incident on the camera; and image processor. The image processor: generates a second-derivative image by performing secondary differentiation on luminance values in an actual image obtained by the camera; generates a second-derivative curve for each of a plurality of ruler lines, extending radially from the hole center and are set in an inspection target region on the workpiece surface; counts a first reference number of times for each ruler line; calculates a first reference total number of times; and determines presence or absence of a circular scratch by using the first reference total number of times.

Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article at a number of azimuthal angles; and a processing element configured to process photon-detector-array signals corresponding to photons scattered from surface features of the article and generate one or more surface features maps for the article from the photon-detector-array signals corresponding to the photons scattered from the surface features of the article.

A computer-based system and method for taking clarity measurements of a gem, and a computer-readable medium having computer-executable instructions, are provided and include receiving a pixilated image of a gem and identifying pixels representing an inclusion. The method and medium further include determining characteristics of the inclusion as a function of the pixels representing the inclusion, and providing a clarity grade based upon the determined characteristics. Also provided is a method for mapping a gem, and a computer-readable medium having computer-executable instructions, which include receiving a pixilated image of a gem having facet edges, and identifying pixels representing the facet edges. The method and medium further include generating a diagram of the gem, such that the diagram is a function of the pixels representing the facet edges, and superimposing the diagram onto the pixilated image.

The invention relates to an inspection system (26) for analyzing defects in a product, the inspection system (26) comprising a projection device (32), an optical detection device (28) and a processing device, the projection device having at least one spectrometer member configured to split white light into its spectral components and project a multichromatic light beam (37) thus formed from monochromatic light beams onto a product, a detection unit (29) comprising an area scan camera (27) and an objective (28) being configured to detect the light beam (37) reflected on the product in a detection plane (46) perpendicular, preferably orthogonal, to a product surface (38) of the product. The detection unit has a dispersive or diffractive element (31) disposed in the detection plane in the objective or between the objective and the product, the reflected light beam being projectable onto an image plane (49) of the area scan camera, the processing device being configured to derive a height information of the product surface from a spatial distribution of saturation values of the reflected light beam in the image plane, a position of the optical detection unit relative to the product and the angle of incidence .