In one embodiment, a substrate imaging apparatus includes: a rotary holding unit that holds and rotates a substrate; a mirror member having a reflecting surface that opposes an end face of the substrate and a peripheral portion of a back surface of the substrate held by the rotary holding unit, the reflecting surface being inclined with respect to a rotation axis of the rotary holding unit; and a camera having an imaging device that receives both first light and second light through a lens, the first light coming from a peripheral portion of a front surface of the substrate held by the rotary holding unit, and the second light being a reflected light of second light which comes from the end face of the substrate held by the rotary holding unit and is reflected by the reflecting surface.

An inspection system for detecting optical defects in a transparency includes a first rounded array of first elongated light elements, and a second rounded array of second elongated light elements. The second rounded array is positionable radially outboard of the first rounded array. The inspection system further includes a light-element-moving system configured to radially translate at least the first elongated light elements. The inspection system also includes an image recording device positionable on a side of the transparency opposite the first and second rounded arrays and configured to record images of the transparency during radial translation of at least the first elongated light elements during backlighting of the transparency. The inspection system includes a processor configured to analyze the images recorded during radial translation of at least the first elongated light elements, and detect optical defects in the transparency based on analysis of the images.

An image inspection device which can image an object with a plurality of cameras in a state in which the object is optimally illuminated and which can also be downsized is provided. The image inspection device includes a plurality of imaging parts that image the object, an illumination part that is disposed between the object and the plurality of imaging parts and radiates light toward the object and has a light-transmissive property, and a control part that controls the plurality of imaging parts and the illumination part. The illumination part includes a plurality of illumination elements which are arranged in a matrix and are allowed to be turned on independently. The control part controls the plurality of illumination elements to cause the illumination part to illuminate a region of the object corresponding to a field of view of the plurality of imaging parts.

An illumination system includes a measurement stage, a light-providing part, a light-receiving part, and a processing part. The light-providing part includes light sources arranged in a dome shape, which irradiate incident lights to a measurement target on the measurement stage. The light-receiving part acquires reflection lights. The processing part controls the light sources to be turned on/off according to a dome-shaped sine wave pattern. The processing part controls the light sources to be sequentially turned on/off by shifting N times according to the dome-shaped sine wave pattern for a specific measurement position of the measurement target, and calculates a phase at the specific measurement position, an average of intensities of N reflection lights, and a visibility of N reflection lights, from intensities of N reflection lights. Thus, material of the measurement target may be easily determined.

An inspection system for detecting optical defects in a transparency includes a first rounded array of first elongated light elements, and a second rounded array of second elongated light elements. The second rounded array is positionable radially outboard of the first rounded array. The inspection system further includes a light-element-moving system configured to radially translate at least the first elongated light elements. The inspection system also includes an image recording device positionable on a side of the transparency opposite the first and second rounded arrays and configured to record images of the transparency during radial translation of at least the first elongated light elements during backlighting of the transparency. The inspection system includes a processor configured to analyze the images recorded during radial translation of at least the first elongated light elements, and detect optical defects in the transparency based on analysis of the images.

Apparatus for checking a tyre having: a support plane; a deformation element to generate a deformed surface portion; a positioning actuator to move the deformation element; and a device with a camera, a first light source, a second light source, a processing unit and a drive and control unit. The processing unit is programmed to activate the positioning actuator to move the deformation element towards the tyre to generate a deformed surface portion. The drive and control unit is programmed to: actuate the first light source to illuminate the deformed surface portion of the tyre, the second light source being inactive during the deformation; control the camera to acquire a first image of the deformed surface portion; actuate the second light source to illuminate an undeformed surface portion of the tyre; and control the camera to acquire a second image of the undeformed surface portion.

In one embodiment, a substrate imaging apparatus includes: a rotary holding unit that holds and rotates a substrate; a mirror member having a reflecting surface that opposes an end face of the substrate and a peripheral portion of a back surface of the substrate held by the rotary holding unit, the reflecting surface being inclined with respect to a rotation axis of the rotary holding unit; and a camera having an imaging device that receives both first light and second light through a lens, the first light coming from a peripheral portion of a front surface of the substrate held by the rotary holding unit, and the second light being a reflected light of second light which comes from the end face of the substrate held by the rotary holding unit and is reflected by the reflecting surface.

An inspection system for inspecting a target includes a first lighting device configured to irradiate light onto the target from a given direction; a second lighting device, provided between the target and the first lighting device, configured to irradiate light onto the target from an oblique direction with respect to the given direction; an image capture device, provided at a position opposite to a position of the target with respect to the first lighting device and the second lighting device in the given direction; and circuitry configured to acquire a first inspection target image of the target, captured by the image capture device by irradiating the light from the first lighting device, and a second inspection target image of the target, captured by the image capture device by irradiating the light from the second lighting device, to be used for inspecting the target.

A portable lighting device has an upright configuration and a folded configuration. In the upright configuration, the portable lighting device provides lighting directed to a workspace area. In the folded configuration, the legs of the portable lighting device are rotated into a compact position for transport or storage. The portable lighting device includes lugs to hold one or more objects, which helps increase the surface area of the workspace. The portable lighting device is suitable for different uses of tradespersons and hobbyists. For example, a user can use the portable lighting device while working on radio-controlled car or electrical or hardware repairs.

A defect inspection apparatus includes: an illumination unit configured to illuminate an inspection object region of a sample with light emitted from a light source; a detection unit configured to detect scattered light in a plurality of directions, which is generated from the inspection object region; a photoelectric conversion unit configured to convert the scattered light detected by the detection unit into an electrical signal; and a signal processing unit configured to process the electrical signal converted by the photoelectric conversion unit to detect a defect in the sample. The detection unit includes a lens array configured to divide an image to form a plurality of images on the photoelectric conversion unit. The signal processing unit is configured to synthesize electrical signals corresponding to the plurality of formed images to detect a defect in the sample.