Method for checking a tyre. The method includes associating first and second independent light sources with a camera, applying a first force against a first surface portion of the tyre to generate a first deformed surface portion, and illuminating the first deformed surface portion with a first light radiation emitted by the first light source while keeping the second light source deactivated. A first image of the first deformed surface portion is then acquired by the camera. The first force is removed and a second surface portion partially distinct from the first surface portion is illuminated with a second light radiation emitted by the second light source without deforming the second surface portion. A second image of the second surface portion is then acquired by the camera. The first and second images are processed for detection of possible defects in the first and second surface portions.

In one embodiment, a substrate imaging apparatus includes: a rotary holding unit that holds and rotates a substrate; a mirror member having a reflecting surface that opposes an end face of the substrate and a peripheral portion of a back surface of the substrate held by the rotary holding unit, the reflecting surface being inclined with respect to a rotation axis of the rotary holding unit; and a camera having an imaging device that receives both first light and second light through a lens, the first light coming from a peripheral portion of a front surface of the substrate held by the rotary holding unit, and the second light being a reflected light of second light which comes from the end face of the substrate held by the rotary holding unit and is reflected by the reflecting surface.

Systems and methods for illuminating and/or inspecting one or more features of a unit under test (UUT) are disclosed herein. A system configured in accordance with embodiments of the present technology can include, for example, a machine, one or more diffuser elements, and/or one or more light sources. The system can create and adjust brightfield illumination profiles on portions of the UUT by, for example, using the one or more light sources and/or the one or more diffuser elements to adjust diffuse and/or specular illumination projected onto the curved features of the UUT. In some embodiments, the system includes one or more darkfield light sources configured to project illumination onto second portions of the UUT to create a darkfield illumination profile. The system can capture data of the brightfield and/or darkfield illumination profiles and can thereby inspect portions of the UUT.

In one embodiment, a substrate imaging apparatus includes: a rotary holding unit that holds and rotates a substrate; a mirror member having a reflecting surface that opposes an end face of the substrate and a peripheral portion of a back surface of the substrate held by the rotary holding unit, the reflecting surface being inclined with respect to a rotation axis of the rotary holding unit; and a camera having an imaging device that receives both first light and second light through a lens, the first light coming from a peripheral portion of a front surface of the substrate held by the rotary holding unit, and the second light being a reflected light of second light which comes from the end face of the substrate held by the rotary holding unit and is reflected by the reflecting surface.

Systems and methods here may be used for a setup of image capturing of a gemstone, such as a diamonds that are of high clarity grades. The present embodiments can provide methods to capture a diamond surface and internal clarity features from a diamond table and through and of other facets. Systems and methods may be used to convert gemstone dimension information into azimuth, slope, and distance information and adjust the motorized stage accordingly for surface imaging. Further, a calibration method can consider the offsets between design and actual system alignment. A calibration process can be used to compensate the offsets. Further, an additional conversion can be derived to compensate the offset caused by the geometry of the gemstone. The methods can automatically capture surface reflection images on facets of the gemstone and internal features taken through facets of the gemstone.

A semiconductor wafer imaging system for imaging a semiconductor wafer includes shroud panels defining a black box, a camera positioned in the black box for imaging the semiconductor wafer, and an illumination panel for directing diffuse light to the semiconductor wafer. A portion of the diffuse light is reflected off the semiconductor wafer and the camera images the semiconductor wafer by detecting the reflected diffuse light.

A system for cosmetic inspection of a test object is disclosed that includes a movable platform for receiving a test object. The movable platform is capable of positioning the test object within a dome. A plurality of cameras arranged oriented to capture different views of a plurality of surfaces of the test object. A plurality lights arranged are outside the dome, the plurality of lights selectively enabled or disabled according to which of the plurality of surfaces of the test object is to be captured.

An image inspection apparatus includes an illuminating section for irradiating illumination light, a line camera in which a plurality of imaging elements are arrayed to be linearly arranged, the line camera receiving the light irradiated from the illuminating section and reflected on the inspection target object, a display section for displaying an image captured by the line camera, an optical axis adjusting section for adjusting an optical axis of the line camera, a trigger setting section for specifying a trigger that specifies timing when the inspection target object is imaged by the line camera, an aspect ratio adjusting section for adjusting longitudinal and lateral pixel resolutions of the image captured by the line camera, and a display control section for displaying the optical axis adjusting section, the trigger setting section, and the aspect ratio adjusting section on the display section in order.

A vehicle lighting apparatus may include a backing panel. The vehicle lighting apparatus may include a light guide panel (LGP) layered over the backing panel, wherein the LGP includes a front surface, a rear surface opposite the front surface, and a plurality of side surfaces connecting the front surface with the rear surface. The vehicle lighting apparatus may include a light source positioned along a first side surface of the plurality of side surfaces of the LGP. The vehicle lighting apparatus may include a front film layered over the front surface of the LGP, wherein the LGP includes a plurality of refraction elements that refract light emitted from the light source through the front surface of the LGP and through the front film and wherein a distribution pattern of the refraction elements creates a corresponding pattern of differing light intensities visible through the front film when illuminated by the light source.

A vehicle lighting apparatus may include a backing panel. The vehicle lighting apparatus may include a light guide panel (LGP) layered over the backing panel, wherein the LGP includes a front surface, a rear surface opposite the front surface, and a plurality of side surfaces connecting the front surface with the rear surface. The vehicle lighting apparatus may include a light source positioned along a first side surface of the plurality of side surfaces of the LGP. The vehicle lighting apparatus may include a front film layered over the front surface of the LGP, wherein the LGP includes a plurality of refraction elements that refract light emitted from the light source through the front surface of the LGP and through the front film and wherein a distribution pattern of the refraction elements creates a corresponding pattern of differing light intensities visible through the front film when illuminated by the light source.