An optical sensing device adopted to use structured light to detect an object is provided. The optical sensing device includes a structured light projector and a sensor. The structured light projector includes a light source and at least one beam multiplication film. The light source is configured to emit a light beam. The at least one beam multiplication film is disposed on a transmission path of the light beam and is made of anisotropic refractive index material, wherein a plurality of separated light beams are produced after the light beam from the light source passes through the at least one beam multiplication film, so as to form the structured light. The sensor is configured to sense the structured light reflected from the object. Besides, a structured light projector is also provided.

A method and an apparatus of inspecting a substrate with a component mounted thereon, which are capable of inspecting whether the component is properly mounted or not without additional setting or changing inspection condition, are provided. The method comprises measuring a three-dimensional shape by irradiating the pattern image toward the substrate through at least one illumination unit and by taking a reflected image through an imaging unit, extracting a shield region from the three-dimensional shape, and inspecting a component mounting defect in an area excluding the shield region in the three-dimensional shape.

A defect inspection apparatus includes a first slit light source together with a machine base in which a through hole is formed. A second slit light source and a half mirror are provided inside the through hole. First slit light from the first slit light source is directly incident on an object to be photographed (for example, an automobile body). On the other hand, second slit light from the second slit light source proceeds in a direction perpendicular to the direction in which the first slit light proceeds, and thereafter, is refracted by the half mirror, led out from the through hole, and made incident on the object to be photographed.

Slit light is irradiated onto an object to be photographed (for example, an automobile body) in order to obtain a source image. Next, either one of a maximum value filtering process or a minimum value filtering process is performed on the source image to thereby obtain a first filter-processed image. Furthermore, after obtaining a second filter-processed image by carrying out a remaining one of the minimum value filtering process or the maximum value filtering process with respect to the first filter-processed image, a difference is determined between the second filter-processed image and the source image, and a difference image is obtained. Thereafter, a binarization process is implemented with respect to the difference image.

A method and device recognize and analyze surface defects in three-dimensional objects having a reflective surface, in particular motor vehicle bodies. In which method the surface defects are identified by the evaluation of an image, recorded by a camera in the form of a raster image of pixels, of an illumination pattern projected by a first illumination device onto a part of the reflective surface using a two-dimensional raster coordinate system. The surface defects are identified exclusively using two-dimensional image information with the aid of image processing algorithms without the need for “environmental parameters”, and complex geometric calculations can be omitted. The solution is fast and robust and can be carried out using differently configured first illumination devices, which makes it suitable for mobile applications, for example as a hand-held module. It is also made possible for the method to be optimized by a “deep learning” strategy.

A device for optically inspecting a surface of a sample includes: a screen providing a first light profile pattern formed with lighter and darker areas wherein the areas form a first spatial intensity profile having a first spatial period, a holder for positioning the sample with the surface relative to the first pattern such that the first pattern is reflected by the surface, an auxiliary lens and/or curved mirror arranged between the screen and the holder for providing a second light profile pattern having areas which form a second spatial intensity profile with a second spatial period when at least a part of the first pattern passes the lens or is reflected by the mirror, an image recording unit for receiving an image of the second pattern reflected from the surface of the sample, and an evaluation unit for determining properties of the surface in dependence on the image.

A method of determining a physical characteristic of an adhesive material on a semiconductor device element using structured light is provided. The method includes the steps of: (1) applying a structured light pattern to an adhesive material on a semiconductor device element; (2) creating an image of the structured light pattern using a camera; and (3) analyzing the image of the structured light pattern to determine a physical characteristic of the adhesive material. Additional methods and systems for determining physical characteristics of semiconductor devices and elements using structured light are also provided.

The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.

An improved vehicle surface scanning system for assessing the damaged surfaces of a vehicle with resulting estimates of repair costs. A mobile scanning booth is assembled in an open-ended tunnel-like rig having a plurality of reflective panels positioned along opposite sides and across the roof of the booth to serve as deflection screens. A plurality of scanner modules are mounted in fixed positions about opposite ends of the booth and positioned to face the interior of the booth. Wheels provide controlled locomotion/movement of the scanning booth over the vehicle. The scanner modules use a combined hybrid methodology of active stereo 3D reconstruction and deflectometry to acquire data measurements along the surfaces of the vehicle incrementally as the booth is moved. The incremental measurement data acquired during the mobile scanning is processed and furthermore combined to produce accurate reports of the damage surfaces and estimates of associated repair costs.

An optical sensing device adopted to use structured light to detect an object is provided. The optical sensing device includes a structured light projector and a sensor. The structured light projector includes a light source and at least one beam multiplication film. The light source is configured to emit a light beam. The at least one beam multiplication film is disposed on a transmission path of the light beam and is made of anisotropic refractive index material, wherein a plurality of separated light beams are produced after the light beam from the light source passes through the at least one beam multiplication film, so as to form the structured light. The sensor is configured to sense the structured light reflected from the object. Besides, a structured light projector is also provided.