A three-dimensional shape measuring apparatus includes a fixer that fixes an illuminator and a photoreceptor to produce a measurement area to be illuminated with measuring light above a stage and to incline their optical axes with respect to a placement surface of the stage in an orientation in which the illuminator and the photoreceptor face the measurement area obliquely downward; a point cloud data generator that generates point cloud data as a set of points including three-dimensional position information representing a three-dimensional shape of a measurement object placed on the stage based on light-reception signals provided by the photoreceptor; a top view map image generator that generates a top view map image representing a plan view of the measurement object as viewed downward from a position right above the measurement object based on the point cloud data; and a display that displays the top view map image.

An optical sensing device adopted to use structured light to detect an object is provided. The optical sensing device includes a structured light projector and a sensor. The structured light projector includes a light source and at least one beam multiplication film. The light source is configured to emit a light beam. The at least one beam multiplication film is disposed on a transmission path of the light beam and is made of anisotropic refractive index material, wherein a plurality of separated light beams are produced after the light beam from the light source passes through the at least one beam multiplication film, so as to form the structured light. The sensor is configured to sense the structured light reflected from the object. Besides, a structured light projector is also provided.

An inspection apparatus includes a projector to irradiate an inspection target with light according to pattern image data associated with the inspection target, and an imaging device to capture an image of the inspection target being irradiated with the light from the projector and output image data of the captured image. The pattern image data specifies a pattern of light irradiation of the inspection target.

An optical sensing device adopted to use structured light to detect an object is provided. The optical sensing device includes a structured light projector and a sensor. The structured light projector includes a light source and at least one beam multiplication film. The light source is configured to emit a light beam. The at least one beam multiplication film is disposed on a transmission path of the light beam and is made of anisotropic refractive index material, wherein a plurality of separated light beams are produced after the light beam from the light source passes through the at least one beam multiplication film, so as to form the structured light. The sensor is configured to sense the structured light reflected from the object. Besides, a structured light projector is also provided.

An optical sensing device adopted to use structured light to detect an object is provided. The optical sensing device includes a structured light projector and a sensor. The structured light projector includes a light source and at least one beam multiplication film. The light source is configured to emit a light beam. The at least one beam multiplication film is disposed on a transmission path of the light beam and is made of anisotropic refractive index material, wherein a plurality of separated light beams are produced after the light beam from the light source passes through the at least one beam multiplication film, so as to form the structured light. The sensor is configured to sense the structured light reflected from the object. Besides, a structured light projector is also provided.

A method of imaging surface features with a large (non-microscopic) field-of-view includes projecting a structured illumination pattern onto the transparent target. The surface features modify the structured illumination pattern, and an image of the modified structured illumination pattern is imaged at each of multiple different introduced phase shifts via an imaging device. The method further provides for extracting, from each of the captured phase-shifted images, image components that correspond to frequencies exceeding a cutoff frequency of the imaging device; and using the extracted image components to construct a corrected image of the surface features of the transparent target. The corrected image has a resolution that is greater than a spatially incoherent point-to-point optical resolution of the imaging device.

A method and device recognize and analyze surface defects in three-dimensional objects having a reflective surface, in particular motor vehicle bodies. In which method the surface defects are identified by the evaluation of an image, recorded by a camera in the form of a raster image of pixels, of an illumination pattern projected by a first illumination device onto a part of the reflective surface using a two-dimensional raster coordinate system. The surface defects are identified exclusively using two-dimensional image information with the aid of image processing algorithms without the need for “environmental parameters”, and complex geometric calculations can be omitted. The solution is fast and robust and can be carried out using differently configured first illumination devices, which makes it suitable for mobile applications, for example as a hand-held module. It is also made possible for the method to be optimized by a “deep learning” strategy.

Disclosed is a defect inspection device. The defect inspection device may include a lighting system designed for transmitting a lighting pattern having different illuminances for each area on a surface of an inspection object; a photographing unit for obtaining an image data of the inspection object; one or more processors for processing the image data; and a memory for storing a deep learning-based model. In addition, the one or more processors are adapted to control, the lighting system to transmit a lighting pattern having a different illuminance for each area on a surface of an inspection object, input, an image data obtained by the photographing unit into the deep learning-based model, wherein the image data includes a rapid change of illuminance in at least a part of the object surface; and determine, a defect on a surface of the inspection object using the deep learning-based model.

A probe system and a method are provided. The probe system includes an emitter unit, a pattern generation system, and an intensity modulator. The emitter unit is for emitting light. The pattern generation system is for projecting at least one reference structured-light pattern onto an object surface to obtain at least one reference projected pattern, and including a mirror scanning unit for reflecting the light to a plurality of directions. The intensity modulator is for modulating intensity of the light according to the at least one reference projected pattern to provide modulated light to the mirror scanning unit to reflect the modulated light to the plurality of directions to project at least one modulated structured-light pattern onto the object surface to obtain at least one modulated projected pattern.

A device for detecting defects on at least one surface may include: a source configured to emit electromagnetic radiation in at least one first spectral band; a video camera sensitive in at least one second spectral band; and a diffuser configured to intercept at least part of the electromagnetic radiation emitted by the source and to make more homogeneous a spatial distribution of intensity of the electromagnetic radiation over the at least one surface. The source may be further configured to project a beam of the electromagnetic radiation onto the at least one surface. An intersection of the at least one first spectral band and the at least one second spectral band may determine a spectral working band. A bandwidth of the spectral working band may be less than or equal to 200 nanometers (nm). The spectral working band may be between 300 nm and 1,100 nm.