An inspection system includes an inspection controller that is electronically connected to a first camera and a second camera, each of which is aligned to cooperatively examine a surface of an object. The first camera defines the first field of view of the object and the second camera defines a second field of view of the object with the first field of view and the second field of view encompassing different areas of the surface of the object. The first camera includes a first clock, and the second camera includes a second clock. The first camera generates a plurality of first images of the object defined by the first field of view and the second camera generates a plurality of second images of the object defined by the second field of view. An inspection controller is programed to synchronize one of the plurality of first images with one of the plurality of second images as defined by a first time stamp assigned by the first clock to one of the plurality of first images matching a second time stamp assigned by the second clock to one of the plurality of second images.

The disclosed test system includes: a lighting apparatus which emits light from multiple light-emitting elements to illuminate a product to be inspected; a lighting controller which divides the light-emitting elements into N number of areas, and sequentially supplies current to emit light in each lighting period; a camera which sequentially captures images of the product in an image-capturing period synchronizing with the lighting period; a test system control device; a first wiring cable which supplies DC power from the camera to the light controller; and a second wiring cable which supplies DC power from the test system control device to the camera. N number of images captured by the camera are reconstructed to one inspection image through inter-image calculation or inter-pixel calculation. The disclosed system simplifies wiring.

The disclosed test system includes: a lighting apparatus which emits light from multiple light-emitting elements to illuminate a product to be inspected; a lighting controller which divides the light-emitting elements into N number of areas, and sequentially supplies current to emit light in each lighting period; a camera which sequentially captures images of the product in an image-capturing period synchronizing with the lighting period; a test system control device; a first wiring cable which supplies DC power from the camera to the light controller; and a second wiring cable which supplies DC power from the test system control device to the camera. N number of images captured by the camera are reconstructed to one inspection image through inter-image calculation or inter-pixel calculation. The disclosed system simplifies wiring.

A stroboscopic stepped illumination defect detection system for appearance defect detection of a product is provided. The system includes an image extraction unit, a brightness adjustment unit, a data processing unit, and a stroboscopic control unit. The image extraction unit is connected to the stroboscopic control unit and used for obtaining stable and clear images in various transmission/reflection visual bright fields/dark fields; and the brightness adjustment unit is connected to the stroboscopic control unit and used for setting various transmission/reflection visual bright fields/dark fields and converting in the various transmission/reflection visual bright fields/dark fields.

An illumination module may include a laser diode array configured to emit laser radiation; a phosphor illumination unit that is configured to emit phosphor radiation following an exposure to the laser radiation; a multiple-angle illumination unit; and intermediate optics that is configured to convey the phosphor radiation to the multiple-angle illumination unit. The multiple-angle illumination unit is configured to receive the phosphor radiation and to dark field illuminate a region of a sample wafer from multiple angles during inspection of the wafer.

Techniques for wound image processing are disclosed. Access to a smartphone that includes an integrated color camera is obtained. An external light source is coupled to the smartphone. The external light source emits at least one light wavelength for illuminating a material sample. The light wavelength excites a fluorescence response from the sample. The fluorescence response comprises wavelengths along the Red-Green-Blue (RGB) light spectrum. The external light source is triggered. An illumination signature of the sample is captured, by the integrated color camera, in response to the external light. An output indicative of biophysical status of the sample is generated. The output is based on analysis of the captured illumination signature. A thermal image of the sample is further captured, using an infrared sensor coupled to the external light source. The output is augmented based on an analysis of the thermal image.

A system includes a station to support a workpiece having one or more welds and/or surface features, and first and second vision sensing assemblies. The first assembly is configured to illuminate the workpiece and generate an image of the one or more welds and/or surface features. The first assembly includes a first light source configured to emit light having a first wavelength and a first sensor configured to detect the light having the first wavelength reflected by the workpiece. The second assembly is configured to illuminate the workpiece and generate an image of the one or more welds and/or surface features. The second assembly includes a second light source configured to emit light having a second wavelength and a second sensor configured to detect the light having the second wavelength reflected by the workpiece. Other example systems and methods are also disclosed.

A system includes a station to support a workpiece having one or more welds and/or surface features, and first and second vision sensing assemblies. The first assembly is configured to illuminate the workpiece and generate an image of the one or more welds and/or surface features. The first assembly includes a first light source configured to emit light having a first wavelength and a first sensor configured to detect the light having the first wavelength reflected by the workpiece. The second assembly is configured to illuminate the workpiece and generate an image of the one or more welds and/or surface features. The second assembly includes a second light source configured to emit light having a second wavelength and a second sensor configured to detect the light having the second wavelength reflected by the workpiece. Other example systems and methods are also disclosed.