G01N2021/8841

METHOD OF ACQUIRING IMAGES FOR AN OPTICAL INSPECTION MACHINE
20220148155 · 2022-05-12 ·

A method for acquiring images of a part to be inspected comprises the following steps framing the part with a digital video camera providing an illuminator comprising a plurality of illumination sources arranged to illuminate various portions of the part or to illuminate the part from different angles, wherein individual illumination sources or groups of illumination sources are controlled individually by means of an illumination control unit operationally connected to the digital video camera; controlling the video camera to take a series of shots of framed part, with each shot being defined by a preset exposure time with each shot and for the duration of the exposure time generating a part illumination condition through the illumination control unit by activating a portion of the individual illumination sources or groups of illumination sources so the sequence of shots is taken with different corresponding lighting conditions according to a preset lighting program.

BEVERAGE DISPENSE MONITORING WITH CAMERA

A beverage dispenser includes a nozzle to dispense a beverage. The beverage dispenser further includes a camera to capture an image of the beverage as the beverage is dispensed from the nozzle. The camera has a field of view that includes the beverage. The beverage dispenser further includes a light source that illuminates the field of view of the camera. The beverage dispenser further includes a computer. The computer analyzes the image of the beverage and determines a characteristic of the beverage.

SYSTEM AND METHOD FOR INSPECTION AND METROLOGY OF FOUR SIDES OF SEMICONDUCTOR DEVICES

A method of inspection or metrology of four sides of a sample is disclosed. The method includes providing samples in a carrier at a first side of an imaging tool and moving the samples from the carrier to the imaging tool via a pick-and-place stage assembly. The method includes imaging first and second sides of the samples via first and second channels of the imaging tool and returning the samples to the carrier. The method includes rotating the carrier by 90 degrees and translating the carrier to an opposite side of the imaging tool and moving the samples individually from the carrier to the imaging tool. The method includes imaging a third and fourth side of the sample via the first and second channel of the imaging tool and returning the one or more samples from the imaging tool to the carrier.

Method and a machine for checking the quality of a product
11327027 · 2022-05-10 · ·

The invention relates to a method for checking the quality of a product (1) comprising at least two cardboard portions (2) connected to each other such that a slot (10) extends between the cardboard portions from one side of the product (1) to the opposite side, with the slot (10) being expected to extend perpendicularly with respect to an outer edge of the product (1), comprising the steps of: capturing a 2D image of the slot (10) at one side of the product (1) and of the slot at the opposite side of the product, analyzing the images so as to recognize the slot (10), comparing the positions of the slot of one product at the opposite sides, making a determination whether or not a difference between the positions is within a predefined range of tolerance. The invention further relates to a machine for checking the quality of a product (1) made from at least two cardboard portions (2) connected to each other such that a slot (10) extends from one side of the product to the opposite side, with the slot being expected to extend perpendicularly with respect to an outer edge of the product, the machine comprising two cameras (304) adapted for capturing a 2D image in a stacking area for stacking the products, an image processing module (306) adapted for recognizing in the captured images the position of the slot on the two sides of the product, and an offset determination module (310) adapted for determining the amount of offset between the position of the slots at the opposite sides of the product.

Electronic Device Valuation System
20220136977 · 2022-05-05 ·

An electronic device valuation system is disclosed. One embodiment comprises: a display; a main body on which an electronic device is placed; a camera for capturing the electronic device by using lighting; and a controller displaying, on the display, the value of the electronic device determined on the basis of visual inspection results of the electronic device and performance inspection results of the electronic device. The visual inspection results are on the basis of an image of the electronic device captured by the camera. In addition, the lighting outputs light, but a portion of the lighting outputs light of different wavelengths so as not to offset the diffuse reflection of visual defects of the electronic device.

INSPECTION SYSTEM FOR MANUFACTURED COMPONENTS
20220130178 · 2022-04-28 · ·

An inspection station for manufactured components includes a framework and a plurality of cameras. The framework has of a plurality of vertically stacked and spaced apart plates. Each plate defines a central orifice. The central orifices of each plate are aligned along an axis. The manufactured components are configured to freefall through the central orifices defined by the plates. The plurality of cameras is secured to the framework. Each camera is focused toward a region within the framework to capture images of the manufactured components. The plurality of cameras is arranged in an array that extends radially about the axis. At least one of the cameras is positioned at an angle above a horizontal plane that is perpendicular to the axis and intersects the region within the framework. At least one of the cameras is positioned at an angle below the horizontal plane.

VISUAL INSPECTION SYSTEM FOR ANNULAR PRODUCT

A visual inspection system includes a conveyance device conveying an inspection target on a glass plate in a rotating direction of the glass plate, an outer-side-surface image capturing device capturing an image of the inspection target at an outer-side-surface image capturing position, and a judgment device judging based on the captured image whether the inspection target is defective in appearance or not. The outer-side-surface image capturing device has an illumination unit for inspection and three image capturing units arranged around the illumination unit. Each image capturing unit includes first and second mirrors receiving light reflected from an outer side surface of the inspection target at position below the illumination unit, a third mirror reflecting reflected light from the first and second mirrors upward, and an imaging camera arranged above the third mirror.

Apparatus for high-speed surface relief measurement

An apparatus for measurement of surface relief provides a phase sensitive camera and processing to reconstruct a wavefront profile matching the surface when illuminated with a known light source thereby providing noncontact surface relief measurements.

Semiconductor inspection tool system and method for wafer edge inspection

A semiconductor inspection tool system is disclosed. The system comprises a first illumination setup for generating at least one first illumination radiation and for directing the at least one first illumination radiation to at least one bonding region non-filled volume formed between two layers of a multi-layer stack. The system also comprises a second illumination setup being for generating at least one second illumination radiation and for directing the at least one second illumination radiation at multi-layer stack edges. The second illumination radiation is configured for illuminating at least a normal edge of at least two layers, the second illumination setup has different radiation parameters than the first illumination setup. The system further includes a bonding region sensor unit for collecting reflected electromagnetic radiation from a bonding region volume and generating at least one sensing data being indicative of the bonding region.

Tubular body inner surface inspection apparatus and tubular body inner surface inspection method

There is provided a tubular body inner surface inspection apparatus that detects a defect existing on an inner surface of a tubular body, the apparatus including: a tubular body imaging apparatus including N (N≥2) imaging units each including a laser light source that applies laser light, an optical element that reflects laser light applied from the laser light source in a circumferential direction of the inner surface of the tubular body, as annular laser light, an area camera that images a region of the inner surface of the tubular body where the annular laser light is applied, and thereby generates an annular beam image, and a linking member that links together and fixes the laser light source and the area camera, in which the imaging units are linked in series along a tube axial direction of the tubular body in such a manner that positions of the linking members in a plane orthogonal to a tube axis are different from each other; a movement apparatus that moves the tubular body imaging apparatus along the tube axial direction of the tubular body; and an arithmetic processing apparatus that, while moving the tubular body imaging apparatus by means of the movement apparatus, performs image processing on a plurality of annular beam images generated in each of the imaging units and assesses whether a defect exists on the inner surface of the tubular body or not.