A system for analyzing a sample includes an illumination source with a plurality of transmitting optical fibers optically coupled to the illumination source and a detector with a plurality of receiving optical fibers optically coupled to the detector. The system further includes a plurality of probes coupled to respective ones of the plurality of transmitting optical fibers and respective ones of the plurality of receiving optical fibers. The plurality of probes are configured to illuminate respective portions of a surface of the sample and configured to receive illumination reflected, refracted, or radiated from the respective portions of the surface of the sample. The system may further include one or more switches and/or splitters configured to optically couple respective ones of the plurality of transmitting optical fibers to the illumination source and/or configured to optically couple respective ones of the plurality of receiving optical fibers to the detector.

An inspection system is provided to inspect an inspection target efficiently. The inspection system includes a second chamber separate from a first chamber in which a radiation source section is present. The second chamber is surrounded by a wall that blocks an electromagnetic wave that the radiation source section emits. A separator roll is stocked in the second chamber.

A cosmetic testing device for electronic devices that uses the electronic device's own camera to take photographs of the electronic device in order to determine its cosmetic condition.

A lighting apparatus which indicates a condition and positions of a product moving along a conveyor is provided. The lighting apparatus includes one or more sensors configured to capture a condition reading of the product and a position reading of the product; a line of lights configured for installation proximate to the conveyor and along the path of the conveyor, the lights of the line of lights configurable between different visual states; a controller to determine a condition of the product based on the condition reading, determine an initial position of the product based on the position reading, generate a schedule for controlling visual states of the lights of the line of lights to indicate the condition of the product and positions of the product, and control the visual states of the lights of the line of lights according to the schedule.

Provided are a microneedle array imaging device, a microneedle array imaging method, a microneedle array inspection device, and a microneedle array inspection method which enable inspection of a microneedle array with high accuracy based on an obtained image. A microneedle array 1 is imaged from a side of a surface on which microneedles 2 are arranged by irradiating a surface on a side opposite to the surface on which the microneedles 2 are arranged with parallel light as illumination light. At this time, the surface is irradiated with the illumination light under conditions in which an incident angle of light onto a bottom surface 2a of the microneedle 2 is 90 or greater and an incident angle of light onto a side surface 2b of the microneedle 2 is less than a critical angle . In this manner, a state in which almost no light is emitted from a tip portion of the microneedle 2 can be generated. As the result, an image in which only the tip portion of the microneedle 2 is dark and other portions, in other words, a base portion of the microneedle 2 and a portion of a sheet 3 are bright can be imaged.

An inspection apparatus has: a gripping unit that grips a container filled with a liquid; a first lighting unit that emits light onto the liquid from one longitudinal end side of the container; and a second lighting unit that emits light onto the liquid from the other longitudinal end side of the container. The first lighting unit and the second lighting unit are arranged on a same side as an imaging device that acquires image data showing a state of the liquid as seen from the container, and are each installed so as to emit light onto the liquid from a position where a center axis passing through a center of the container is tilted by any angle of 0 degrees or more and 40 degrees or less.

A system for inspecting a slab of material may include an optical fiber, a broadband light source configured to emit light having wavelengths of 780-1800 nanometers over the optical fiber, a beam-forming assembly configured to receive the light over the optical fiber and direct the light toward a slab of material, the beam-forming assembly may be configured to maintain the position of one or more elements within the beam-forming assembly despite changes in environmental temperature; a computer-controlled etalon filter configured to receive the light over the optical fiber, filter the light, and direct the light over the optical fiber; and a computer-controlled spectrometer configured to receive the light over the optical fiber after the light has been filtered by the etalon filter and after the light has been reflected from or transmitted through the slab of material and spectrally analyze the light.

An image capturing unit in an inspection system for performing an inspection target appearance inspection, the image capturing unit comprising, an image capture unit, an illumination unit arranged in a periphery of the image capture unit, and a protective unit covering the image capture unit and the illumination unit, wherein the protective unit includes a plate-like member configured by a first planar portion and a second planar portion being connected through a bent portion bent in a dog leg shape, and the image capture unit is located on a back side of the first planar portion.

An automatic inspection station is presented for inspecting exterior of vehicles. The inspection station comprises a physical structure configured to be deployable at a predetermined location and, when deployed defining first and second adjacent compartments and exposing an inner space of the first compartment to vehicle's entry and exit into and from said inner space and at least partially isolate said inner space from ambient light. The first compartment comprises an inspection system, and the second compartment comprises a control system in data communication with the inspection system. The inspection system comprises an optical imaging system configured and operable for imaging a vehicle located within at least part of said inner space and generating image data which is processed and analyzed by the control system to generate data indicative of vehicle's status.

The inventions describes an apparatus for inspection of a component comprising an adjustable optical element for image detection in two stepswith focus on the second (or bottom) face of the component and with a focus on the sides. This allows the degree of image degradation in one or more of the images to be reduced.