According to one embodiment, an optical imaging apparatus includes: an image-forming optical portion, a wavelength selection portion, and an imaging portion. The image-forming optical portion forms an image of an object by means of light beams that include a first wavelength and a second wavelength different from the first wavelength. The first wavelength selection portion has wavelength selection regions. The wavelength selection regions are an anisotropic wavelength selection opening having a different distribution of the wavelength selection regions depending on a direction along a first axis and a direction along a second axis. The imaging portion is configured to simultaneously acquire an image of the first light beam and the second light beam.

An additive manufacturing system comprises an apparatus arranged to distribute layer of metallic powder across a build plane and a power source arranged to emit a beam of energy at the build plane and fuse the metallic powder into a portion of a part. The system includes a processor configured to steer the beam of energy across the build plane and receive data generated by one or more sensors that detect electromagnetic energy emitted from the build plane when the beam of energy fuses the metallic powder. The received data is converted into one or more parameters that indicate one or more conditions at the build plane while the beam of energy fuses the metallic powder. The one or more parameters are used as input into a machine learning algorithm to detect one or more defects in the fused metallic powder.

A power station inspection system and a power station inspection method are disclosed. A power station inspection system includes an unmanned aerial vehicle, and an unmanned aerial vehicle flight controller, a central controller, and at least two types of data collection terminals that are disposed on the unmanned aerial vehicle. The central controller is configured to control the unmanned aerial vehicle flight controller, so that the unmanned aerial vehicle flight controller controls flight of the unmanned aerial vehicle. The central controller is further configured to control the at least two types of data collection terminals to collect at least two types of component image data of a power station component in a flight process of the unmanned aerial vehicle.

A device is provided for IR-spectroscopy and for determining an impairment of a surface which is exposed to measuring radiation during the IR-spectroscopy. The device includes a radiation source to generate the measuring radiation a detector and a sample receptacle for receiving a sample. The sample receptacle is at least partially delimited by the surface. The detector measures radiation after interaction with the sample. The device is configured to measure an IR-reference spectrum of a reference sample which is received in the sample receptacle, evaluate the reference spectrum, determine an indicator of the impairment, wherein evaluating encompasses an integration of a quantity which is based on the reference spectrum over a predetermined integration spectral range, wherein the indicator is determined dependently on a value of the integration.

A physical body inspection system includes a light source device, an image pickup device and a display. The light source device is configured to apply light in a predetermined wavelength band to a physical body, the physical body being an inspection object, the predetermined wavelength band being a wavelength band in wavelength bands constituting environment light at an inspection time-of-day, and the light in the predetermined wavelength band being low in intensity. The inspection time-of-day is a time of day when the physical body is inspected. The image pickup device is configured to pick up an image of the physical body. The display is configured to display the picked-up image of the physical body.

An electronic device valuation system is disclosed. One embodiment comprises: a display; a main body on which an electronic device is placed; a camera for capturing the electronic device by using lighting; and a controller displaying, on the display, the value of the electronic device determined on the basis of visual inspection results of the electronic device and performance inspection results of the electronic device. The visual inspection results are on the basis of an image of the electronic device captured by the camera. In addition, the lighting outputs light, but a portion of the lighting outputs light of different wavelengths so as not to offset the diffuse reflection of visual defects of the electronic device.

An inspection system includes an acquisition unit and a determination unit. The acquisition unit acquires an image representing a surface of an object. The determination unit performs color determination processing. The color determination processing is performed to determine a color of the surface of the object based on a plurality of conditions of reflection. The plurality of conditions of reflection are obtained from the image representing the surface of the object as acquired by the acquisition unit, and have a specular reflection component and a diffuse reflection component at respectively different ratios on the surface of the object.

Evaluation of a rotating wheel is described. The evaluation utilizes information acquired by radiation reflecting off of one or more regions of the rotating wheel. An imaging device can acquire image data which is processed to evaluate the wheel. The radiation can comprise diffuse and/or coherent radiation. Image data for substantially an entire circumference of the wheel can be used in the evaluation.

A multispectral light assembly includes a multispectral light source configured to generate a plurality of different wavelengths of light, a light pipe positioned in front of the multispectral light source and configured to provide color mixing for two or more of the plurality of different wavelengths, a diffusive surface on the light pipe exit surface, and a projection lens positioned in front of the diffusive surface. A processor device is in communication with the multispectral light assemblies to control activation of the multispectral light source. A machine vision system includes an illumination assembly with a plurality of multispectral light assemblies, an optics assembly, a sensor assembly, and a processor device in communication with the optics assembly, the sensor assembly, and the illumination assembly.

According to the embodiment, an optical inspection method includes: acquiring an image by capturing the image, using light from a surface of an object, which passes through a wavelength selection portion configured to selectively pass light components of a plurality of predetermined wavelengths different from each other, the image sensor including color channels configured to discriminately receive the light components of the plurality of predetermined wavelengths, performing color count estimation processing configured to estimate the number of colors based on the intensity ratio of the color channels that have received the light in each pixel of the image, and performing scattered light distribution identification processing configured to identify a scattered light distribution as BRDF from the surface of the object based on the number of colors or surface state identification processing configured to identify a state of the surface of the object based on the number of colors.