A deviation correction apparatus includes a width detecting apparatus configured to detect a width of a coating layer of an electrode plate, a processor communicatively connected with the width detecting apparatus and configured to determine a centerline position of the electrode plate based on the width of the coating layer, and a deviation correction mechanism configured to perform deviation correction for the electrode plate based on the centerline position of the electrode plate and a preset standard centerline position.

This disclosure is directed to techniques for utilizing various sensors and models to evaluate glass as it progresses through the tempering process in order to ensure that the tempered glass is of a proper quality. If, according to any of the various sensor measurements, the tempered glass is not of a proper quality, the system may automatically adjust one or more settings in any of the various components of the system in order to bring future panes of tempered glass back to having the proper quality. The system can measure for any number of glass characteristics or system characteristics, including edge quality, vertical flatness, haze, washing process variables, thermal imaging, distortion, blower information, production data, and furnace process data.

An image capturing system (10), and a corresponding method, for determining the position of an embossed structure (30) on a sheet element (4) moved though a viewing area (18). It includes a camera (12) adapted for capturing a line image of the surface of the sheet element (4) in the viewing area (18), and an illumination unit (14) with a plurality of light sources (20, 21, . . . ) each adapted for illuminating the viewing area (18). The light sources (20, 21, . . . ) are arranged at different inclinations with respect to the viewing area (18). An image evaluation unit (16) determines an inclination-related parameter for the surface of the sheet element (4) in the viewing area (18) across the viewing area (18).

A system for forming a homogenized illumination line which can be imaged as a low-speckle line is disclosed. The system includes a laser configured to emit a collimated laser beam; and an illumination-fan generator that includes one or more linear diffusers. The illumination-fan generator is arranged and configured to (i) receive the collimated laser beam, (ii) output a planar fan of diffused light, such that the planar fan emanates from a light line formed on the distal-most one of the one or more linear diffusers, and (iii) cause formation of an illumination line at an intersection of the planar fan and an object.

A method and system for automated in-line inspection of optically transparent material is disclosed herein. The method includes illuminating a top and bottom surface of the optically transparent material with at least one sheet of light and then generating an image based on light that is received by an imaging device. The image that is generated may either be a bright field image or a dark field image.

The disclosure relates to a wood material panel pressing device for pressing a fibrous press cake in order to produce a wood material panel including an inspection device that is designed to emit a signal in the event of a disruption. According to the disclosure, the wood material panel pressing device for pressing a fibrous press cake for producing an HDF panel or an MDF panel includes: an inspection device, which is designed to emit a signal in an event of a disruption, wherein: the inspection device has a camera and an evaluation unit, the camera is arranged in an intake region of the wood material panel pressing device; and the evaluation unit automatically emits a signal in an event of a blow-out of press cake particles.

The present invention provides a method of inspecting a surface including detecting a presence or absence of a defect derived from a surface irregularity part of a planar inspection object to be conveyed in a predetermined direction, using a change in intensity of inspection light, the inspection light including at least two inspection lights that are parallel to a surface of the inspection object in a side view of the inspection object and pass over the surface of the inspection object or through the inspection object in a direction intersecting the conveyance direction in a plan view of the inspection object, the two inspection lights being non-parallel to each other in the plan view.

A system for measuring a periodic array of structures on a sample is provided. The system includes an optical source configured to produce an optical beam; an optical system configured to control the polarization of the optical beam and to focus the optical beam with a first NA.sub.1 on a sample surface and to sweep the angle of incidence across a range of angles with an approximately fixed focal position on a sample surface with a second NA.sub.2 wherein NA.sub.2>NA.sub.1; additional optical components configured to receive the optical beam reflected from the sample surface and to focus the reflected beam onto a detector; and a recording system to record the reflectivity of the sample surface as a function of the angle of incidence. In an embodiment, the optical system provides a spot on the sample such that both the angle of incidence and the position on the sample are varied during a sweep. Electronic filtering is provided to separate low frequency signals, corresponding to structural details of the sample, and high frequency signatures, corresponding to localized defects on the sample.

An apparatus for inspecting images is disclosed. In an embodiment an apparatus includes a camera for recording a surface of a printed product, the printed product being movable relative to the apparatus, a first illumination unit of a first type for illuminating a first partial region of a region that is capturable by the camera, a second illumination unit of a second type for illuminating a second partial region of the region that is capturable by the camera, and an evaluation unit for processing image information captured by the camera, wherein the first illumination unit differs from the second illumination unit, and wherein the first illumination unit forms a diffuse illumination source and has an internally illuminated tunnel.

Disclosed is a defect inspection device according to an embodiment of the present disclosure. The defect inspection device includes: a robot arm including a hold unit for holding an object and a driving unit for moving the object; a first camera unit photographing an exterior of the object; an illumination unit irradiating light to the exterior of the object; and a control unit determining whether there is a defect in the object based on an image of the object photographed by the first camera unit.