An apparatus divides a photographed image of a sheet-like inspection object into blocks each of which has a size of a predetermined number of pixels by a predetermined number of pixels, calculates a longitudinal variance based on pixel values in a longitudinal direction in each block and a lateral variance based on pixel values in a lateral direction in the block, determines whether the block is a defect candidate using the longitudinal variance and the lateral variance as sheet-like inspection object defect determination evaluation values, and determines, based on one of a length and an area of the blocks determined as the defect candidates, whether the sheet-like inspection object has defect.

An optical apparatus and a method for color scanning a surface of an article moving along a travel path axis make use of an imaging sensor unit including a digital color camera capable of generating highly focused color images, even when distance from surface to camera varies, by providing the camera with an objective defining an optical plane disposed in Scheimpflug configuration. A beam of collimated polychromatic light of an elongated cross-section is directed within a Scheimpflug scanning plane of focus and toward a scanning zone to form a reflected linear band of light onto the article surface of an intensity substantially uniform within the depth of sensing field. The reflected linear band of light is captured by the digital camera to generate a two-dimensional color image thereof, from which a single line color image data is extracted. The line data extraction is repeated as the article moves to generate successive line color image data, from which a two-dimensional color image of the article is built.

A base insulating layer and a cover insulating layer of a first printed circuit board are formed of a first insulating material, and a base insulating layer and a cover insulating layer of a second printed circuit board are formed of a second insulating material. During inspection of the first printed circuit board, the first printed circuit board is irradiated with first light having a peak wavelength in a first wavelength range, and an image is produced based on reflected light from the first printed circuit board. During inspection of the second printed circuit board, the second printed circuit board is irradiated with second light having a peak wavelength in a second wavelength region different from the first wavelength region, and an image is produced based on reflected light from the second printed circuit board.

A glass sheet optical inspection system installed online in a glass sheet processing system includes an apparatus for measuring small optical or obstructive defects in a first selected area of the glass sheet by acquiring and developing a first set of image data, and an apparatus for measuring transmitted optical distortion in a second selected area of the glass sheet by acquiring and developing a second set of image data. The system may also include a glass sheet part identifier and a programmable control including logic for analyzing acquired image data and identifying the glass sheet as one of a set of known part types and thereafter securing and positioning the glass sheet based upon the part-shape analysis.

Provided are methods and systems for inspecting surfaces of various components, such as evaluating height deviations on these surfaces. A method involves aggregating inspection data from multiple line scanners into a combined data set. This combined data set represents a portion of the surface that is larger than the field of measurement any one of the scanners. Furthermore, each pair of adjacent scanners operate at different periods of time to avoid interference. Because operating periods are offset, surface portions scanned by the pair of adjacent scanners can overlap without interference. This overlap of the scanned portions ensures that the entire surface is analyzed. The position of scanners relative to the inspection surface may be changed in between the scans and, in some embodiments, even during the scan. This approach allows precise scanning of large surfaces.

Provided are methods and systems for inspecting surfaces of various components, such as evaluating height deviations on these surfaces. A method involves aggregating inspection data from multiple line scanners into a combined data set. This combined data set represents a portion of the surface that is larger than the field of measurement any one of the scanners. Furthermore, each pair of adjacent scanners operate at different periods of time to avoid interference. Because operating periods are offset, surface portions scanned by the pair of adjacent scanners can overlap without interference. This overlap of the scanned portions ensures that the entire surface is analyzed. The position of scanners relative to the inspection surface may be changed in between the scans and, in some embodiments, even during the scan. This approach allows precise scanning of large surfaces.

A system that visually indicates the position of a characteristic-of-interest of a machine conveyable material. The visual indication comprising direct, indirect and combinations thereof.

Methods of inspecting a material include moving the material and identifying a defect location of a defect. Methods include moving a camera along a second travel path in a second travel direction such that a field of view (FOV) of the camera moves relative to the material along the second travel path to match the defect location. Methods include passing the defect through the field of view (FOV) as the material moves and capturing images of the defect with the camera as the material moves and the defect moves through the FOV. The images include a first image of a first major surface, a second image of a second major surface, and a third image of an intermediate portion of the material between the first major surface and the second major surface. Methods include reviewing the plurality of images to characterize the defect.

Techniques are provided for setting up a vision inspection system from a human-machine interface of a web converting system. In an example, a web converting system can include a web converting machine configured to make a first part, a vision inspection system configured to capture an image of the first part and to analyze the image according to one or more measurement tools, and a human machine interface (HMI) configured to interface with the web converting machine and with the vision inspection system, to display status information of the web converting machine and the vision inspection system, to receive one or more inputs to select, place, size and orient the one or more measurement tools, and to transform the one or more inputs for reception by the vision inspection system.

Methods for optically inspecting a surface (10) of an object (1) and an inspection device (9) including are described. With the method a temporally periodic pattern (13) with different illumination patterns (130) is generated on the surface (10) via a illumination device (8) of the inspection device (9) during an image recording sequence (13), and in the image recording sequence a number of images of the pattern (13) on the surface (10) are recorded via an image recording device (7) of the inspection device (9), wherein generating one of the different illumination patterns (130) is synchronised, respectively, with the image recording of one of the images of the pattern (13), the phase of the pattern (13) is determined from the succession of the recorded known illumination patterns (130) in at least one image point and defects (4, 5) on the surface (10) are detected from deviations of the recorded illumination pattern (130) from the generated known illumination pattern (130).