A surface detection system and method for continuous casting billet using two-dimensional and three-dimensional combined imaging. The detection system comprises an encoder (2), a position sensing mechanism, and a mounting rack (3), sequentially provided along a running direction of a continuous casting billet (1). The mounting rack (3) is provided with a three-dimensional imaging mechanism (4) and a two-dimensional imaging mechanism (5) sequentially along the running direction of the continuous casting billet (1). The position sensing mechanism starts the encoder (2), which records position information of the continuous casting billet (1). The mounting rack (3) is further provided with a lifting device (6). The three-dimensional imaging mechanism (4) moves up and down along the lifting device (6). The mounting rack (3) is further provided with an insulation plate (7). The two-dimensional imaging mechanism (5) is located above the insulation plate (7), and the continuous casting billet (1) is located below the insulation plate (7). Two-dimensional image data information and three-dimensional image data information are integrated to effectively detect real defects on the surface of the continuous casting billet (1) and filter pseudo defects.

The invention embodies methods and apparatuses to monitor and control the characteristics of a creping process. The method involves measuring optical properties of various points along a creped paper sheet and converting those measurements into characteristic defining data. The invention allows for determining the magnitude and distribution of crepe structures and their frequency and distribution. This allows for the generation of information that is accurate and is much more reliable than the coarse guessing that is currently used in the industry. Feeding this information to papermaking process equipment can result in increases in both quality and efficiency in papermaking.

A surface inspection system for foil article is disclosed. The surface inspection system comprises a box having a top long narrow opening and a bottom long narrow opening, a bridge interface, a first light source, a second light source, a first modular camera device having a first camera, and a second modular camera device having a second camera. In which, the first light source, the second light source, the first modular camera device, and the second modular camera device all accommodated in the box, and are coupled to a control box through the bridge interface. Particularly, this surface inspection system is allowed to be integrated in an automatic production line of a foil article like electro-forming aluminum foil (also called electronic aluminum foil), so as to achieve an in-line inspection of the surface morphology of the electro-forming aluminum foil.

A panel inspection apparatus is provided. The panel inspection apparatus has a support platform, a delivery platform and a panel inspection assembly. The delivery platform is disposed on the support platform, and the delivery platform has a push module for delivering the panel. The panel inspection assembly includes a plurality of light source modules and a plurality of image-taking modules corresponding to the light source modules. The light source modules include a front light source, a first horizontal light source, and a back light source. The image-taking modules include a front light image-taking module, a first horizontal light image-taking module, and a back light image-taking module. The push module delivers the panel across the support platform so that a plurality of light beams emitted from the light source modules can scan the panel to finish the panel inspection process.

A spectroscopic analysis apparatus includes: a light projecting device; a light receiving device; and an output device, wherein the light receiving device includes: a separator configured to separate reflected light into s-polarized light and p-polarized light; a detector for s-polarized light configured to output an electric signal indicating an intensity of the s-polarized light; and a detector for p-polarized light configured to output an electric signal indicating an intensity of the p-polarized light; and the output device is configured to: calculate an absorbance based on a ratio between the intensities of the s-polarized light and the p-polarized light using the electric signals output from the detector for s-polarized light and the detector for p-polarized light; and calculate either or both of the composition and the composition ratio of the surface of the measurement target object using an intensity of the absorbance at any desired wavenumber.

To inspect the shape of a metallic body further accurately, regardless of surface roughness of the metallic body. A shape inspection apparatus for a metallic body according to the present invention includes: a measurement apparatus configured to irradiate a metallic body with at least two illumination light beams, and measure reflected light of the two illumination light beams from the metallic body separately; and an arithmetic processing apparatus configured to calculate information used for shape inspection of the metallic body on the basis of luminance values of the reflected light. The measurement apparatus includes a first illumination light source and a second illumination light source configured to irradiate the metallic body with strip-shaped illumination light having mutually different peak wavelengths, and a color line sensor camera configured to measure reflected light of first illumination light and reflected light of second illumination light, separately. The first illumination light source and the second illumination light source are provided in a manner that their optical axes form substantially equal angles with a direction of regular reflection of an optical axis of the color line sensor camera at a surface of the metallic body. A wavelength difference between a peak wavelength of the first illumination light and a peak wavelength of the second illumination light is equal to or more than 5 nm and equal to or less than 90 nm.

An inspection device of the present invention includes: THz wave irradiation unit for irradiating a specimen with THz waves; a THz wave sensing unit for detecting transmitted waves or reflected waves of the THz waves emitted to the specimen; and an information processing unit for acquiring intensity distribution of the transmitted waves of the reflected waves of the specimen from the intensity data of the transmitted waves or the reflected waves of the specimen irradiated with the THz waves, wherein the information processing unit acquires 2-dimensional intensity distribution of the transmitted waves or reflected waves, and detects whether a foreign matter is adhering to the specimen by comparing the intensity distribution obtained when the specimen without attachment of the foreign matter is detected and the intensity distribution obtained when the specimen is detected at the time of inspection. The specimen is a sheet of paper, for example.

A method includes: sensing a defect on a cast strip surface, the cast strip being cast from molten metal or alloy by a casting system, determining an adjustment amount and/or direction of a casting system component based on the identified surface defect, and providing the adjustment amount and/or direction to an operator for adjustment of the casting system component and/or commanding that the casting system component be adjusted by the adjustment amount and/or direction.

The invention relates to a method and arrangement for detecting free fiber ends in a paper surface. The method comprises illuminating a target sample (6) surface, which comprises free fiber ends, from at least two directions one at the time, with at least one light source (1). Original reflectance images are obtained for the target sample (6) surface with an imaging device (4), and a surface normal is estimated for each image pixel of the original reflectance image. Thus it is possible to reconstruct a reconstructed reflectance image from the estimated surface normals, and to compare the reconstructed reflectance image and the corresponding original reflectance image and to construct a difference image, where the differences represent shadow objects of the free fiber ends in a paper surface.

The invention relates to a method for analysing defects in transformer laminations using an inspection system, and to an inspection system (24), wherein the inspection system comprises a detection unit (26), a conveyance device (27) and a processing device, wherein the detection unit includes an optical detecting device (31), wherein the conveyance device is used to continuously transport a plurality of transformer laminations (25) relative to the detecting device, wherein the detecting device is arranged transversely, preferably orthogonally, to a direction of movement of a transformer lamination, wherein a velocity of movement of a transformer lamination relative to the detecting device is measured via a measurement device (40) of the detection unit, wherein an image of a contour of a transformer lamination is captured with the detecting device, wherein images of a transformer lamination are assembled into a combined image of the transformer lamination via the processing device while considering the velocity of movement of the transformer lamination, wherein a shape of the transformer lamination is determined on the basis of the combined image via the processing device.