A method of inspecting stamped blanks on a stamping line includes identifying at least one target defect location for a given stamped blank configuration where a unique defect type is associated with each of the at least one target defect locations. One or more images of each of the least one identified target defect locations on blanks stamped per the given stamped blank configuration are acquired with one or more cameras assigned to each of the identified target defect locations. The method includes analyzing the one or more images of each of the least one identified target defect locations and detecting if the unique defect type associated with each of the at least one target defect locations is present. Also, each unique defect type is identified with a corresponding unique defect identification algorithm.

In a device and a method for detecting a defect in a corrugated cardboard sheet, a device for eliminating a defect in a corrugated cardboard sheet, and a device for manufacturing a corrugated cardboard sheet, the device for detecting a defect in a corrugated cardboard sheet which detects a defect in a wavy core affixed to a liner is provided with: a lighting device that lights the core; an imaging device that captures an image of a lit part in the core; an image processing device that defines a change degree of a light amount value along a conveyance direction of the corrugated cardboard sheet on the basis of the image captured by the imaging device; and a first determination device that compares the change degree of the light amount value with a previously-set first determination value to determine quality.

A inspection method for a cylindrical honeycomb structure including a step of placing a cylindrical honeycomb structure made of ceramics on a rotation stage; a step of irradiating the side surface of the cylindrical honeycomb structure with light having a wavelength of 300 to 500 nm; a step of repeatedly capturing a reflected light from the side surface with a line sensor camera having a pixel resolution of 1 to 25 μm/pix while the light is irradiated to the side surface and the cylindrical honeycomb structure is rotated around the axis of rotation, with a depth of field of the line sensor camera being adjusted to 0.5 to 5 mm; a step of generating an inspection image of the entire side surface; and a step of determining presence or absence of defects on the side surface based on the inspection image.

A surface-defect detecting method of optically detecting a surface defect of a steel material, the method including: an irradiation step of irradiating an examination target part with illumination light beams from different directions by using two or more distinguishable light sources; and a detection step of detecting a surface defect in the examination target part based on the degree of overlapping of bright portions extracted from two or more images formed by reflected light beams of the illumination light beams.

An inspection device includes an acquisition unit that acquires a plurality of images, captured from a given height, of an inspection object controlled to move at a constant velocity, a comparison unit that compares movements of the inspection object in the images on the basis of the plurality of images, and a determination unit that determines the condition of the inspection object on the basis of a comparison result.

Provided is a method for manufacturing a glass fiber strand in which a glass fiber strand is formed by bundling a plurality of glass fiber filaments comprising molten glass drawn out from a nozzle, wherein said method for manufacturing a glass fiber strand is capable of detecting breakage of the glass fiber filaments in a more reliable manner. This method comprises: an image capturing step for generating a plurality of items of image data by continuously capturing images of a plurality of glass fiber filaments f; an image processing step for extracting, from the image data, a high luminance object having a luminance of a prescribed value or more; and a breakage detection step for detecting that a glass fiber filament f has broken on the basis of the results of the image processing in the image processing step.

A surface inspection device of a metal strip includes: a first light source unit configured to emit light to a surface of a metal strip; a first imaging unit configured to image regular reflection light on the surface by emission light from the first light source unit; a second light source unit configured to emit light of a wavelength band different from the first light source unit to the surface; a second imaging unit configured to image irregular reflection light on the surface by emission light from the second light source unit; and a surface defect distinguishing unit configured to distinguish a surface defect by using the regular reflection light and irregular reflection light. The emission light from the first light source unit and the emission light from the second light source unit are simultaneously applied to a same place on the surface of the metal strip.

An electrode sheet inspection system includes an inspection unit configured to inspect the external state of an electrode sheet and an ink marking unit configured to mark a portion to be removed on the electrode sheet, wherein the ink marking unit is configured to adjust an ink marking range, whereby it is possible to prevent removal of a mark on a defective portion of an electrode even after a process of notching the electrode sheet. An electrode sheet inspection method using the same is also described.

The present invention relates to a mono-cell manufacturing apparatus with a gloss meter and a manufacturing method using the same. More particularly, a mono-cell manufacturing apparatus includes a first separator supply unit configured to supply a first separators; a negative electrode supply unit configured to locate a negative electrode at an upper surface of the first separators; a second separator supply unit configured to supply a second separator configured to cover an upper surface of the negative electrodes; a positive electrode supply unit configured to locate a positive electrode at an upper surface of the second separators; a pressing unit configured to press the first separator, the negative electrode, the second separator, and the positive electrode, and a gloss meter located under the first separator.

An inspection device of the present invention includes: THz wave irradiation unit for irradiating a specimen with THz waves; a THz wave sensing unit for detecting transmitted waves or reflected waves of the THz waves emitted to the specimen; and an information processing unit for acquiring intensity distribution of the transmitted waves of the reflected waves of the specimen from the intensity data of the transmitted waves or the reflected waves of the specimen irradiated with the THz waves, wherein the information processing unit acquires 2-dimensional intensity distribution of the transmitted waves or reflected waves, and detects whether a foreign matter is adhering to the specimen by comparing the intensity distribution obtained when the specimen without attachment of the foreign matter is detected and the intensity distribution obtained when the specimen is detected at the time of inspection. The specimen is a sheet of paper, for example.