A method for characterizing the uniformity of a material includes selecting a set of size scales at which to measure uniformity within an area of interest in an image of the material; suppressing features in the image smaller than a selected size scale of interest within the set of size scales; dividing the image into patches equal to the size scale of interest; and calculating a uniformity value within each patch.

A surface inspection system for foil article is disclosed. The surface inspection system comprises a box having a top long narrow opening and a bottom long narrow opening, a bridge interface, a first light source, a second light source, a first modular camera device having a first camera, and a second modular camera device having a second camera. In which, the first light source, the second light source, the first modular camera device, and the second modular camera device all accommodated in the box, and are coupled to a control box through the bridge interface. Particularly, this surface inspection system is allowed to be integrated in an automatic production line of a foil article like electro-forming aluminum foil (also called electronic aluminum foil), so as to achieve an in-line inspection of the surface morphology of the electro-forming aluminum foil.

Methods and systems are disclosed for analyzing one or more images of a textile to determine a presence or absence of defects. In one example, an image of at least a portion of a textile may be obtained and compared to a reference image of a reference textile. Based on the comparison, one or more areas indicative of a height variation between the textile and the reference textile may be determined. An action may be performed based on the one or more areas indicative of the height variation.

A method and device for non-contact detection of a thin medium (5) is disclosed. The device comprises a light source (1), an optical splitter (2), a reference plane (3), a linearly arrayed photoelectric detector (6), a signal processing module (4) and the thin medium (5). The method involves the following steps: acquiring time for targeted light which is emitted by the light source (1) and reflected by the thin medium (5) to the linearly arrayed photoelectric detector (6), and acquiring time for reference light which is emitted by the light source (1) and reflected by the reference plane (3) to the linearly arrayed photoelectric detector (6); according to the acquired time that the targeted light and the reference light arrive at the linearly arrayed photoelectric detector (6), computing a first optical path and a second optical path corresponding to the targeted light and the reference light respectively, and acquiring quantity of bright fringes and dark fringes of interference fringes according to a predetermined computing manner by the signal processing module (4); conducting difference comparison between the quantity of the bright fringes and dark fringes of the interference fringes and the quantity of the bright fringes and dark fringes of standard interference fringes according to the predetermined manner, and if the value of the comparison result is larger than the predetermined threshold value, determining that the foreign matters are positioned on the thin medium (5). The detection method and device solves the technical problems that precision is low and measuring wavelength is long caused by an existing mechanical thickness measuring device, an infrared detector and an ultrasonic detector used to detect the foreign substance on the surface of the thin medium.

A method and device for non-contact detection of a thin medium (5) is disclosed. The device comprises a light source (1), an optical splitter (2), a reference plane (3), a linearly arrayed photoelectric detector (6), a signal processing module (4) and the thin medium (5). The method involves the following steps: acquiring time for targeted light which is emitted by the light source (1) and reflected by the thin medium (5) to the linearly arrayed photoelectric detector (6), and acquiring time for reference light which is emitted by the light source (1) and reflected by the reference plane (3) to the linearly arrayed photoelectric detector (6); according to the acquired time that the targeted light and the reference light arrive at the linearly arrayed photoelectric detector (6), computing a first optical path and a second optical path corresponding to the targeted light and the reference light respectively, and acquiring quantity of bright fringes and dark fringes of interference fringes according to a predetermined computing manner by the signal processing module (4); conducting difference comparison between the quantity of the bright fringes and dark fringes of the interference fringes and the quantity of the bright fringes and dark fringes of standard interference fringes according to the predetermined manner, and if the value of the comparison result is larger than the predetermined threshold value, determining that the foreign matters are positioned on the thin medium (5). The detection method and device solves the technical problems that precision is low and measuring wavelength is long caused by an existing mechanical thickness measuring device, an infrared detector and an ultrasonic detector used to detect the foreign substance on the surface of the thin medium.

A method for film production includes the steps of obtaining information on the position of a defect (D) in a separator (12a) and providing marks (LA, LB) at the respective positions in the vicinity of the defect (D), the marks indicating the position of the defect.

A hanging prevention roller is installed between a first suction conveyance unit on an upstream side and a second suction conveyance unit. When an inspection object is sent from the first suction conveyance unit into the second suction conveyance unit, a top edge of the inspection object abuts on and runs on the hanging prevention roller before the top edge of the inspection objects hangs down under its own weight or due to downward curling and so forth, the top edge is sandwiched between the roller and the second suction conveyance unit, and thereby stable suction conveyance is started without delay.

A hanging prevention roller is installed between a first suction conveyance unit on an upstream side and a second suction conveyance unit. When an inspection object is sent from the first suction conveyance unit into the second suction conveyance unit, a top edge of the inspection object abuts on and runs on the hanging prevention roller before the top edge of the inspection objects hangs down under its own weight or due to downward curling and so forth, the top edge is sandwiched between the roller and the second suction conveyance unit, and thereby stable suction conveyance is started without delay.

A light 2 for reflected light that emits visible light for reflected light onto a front side of a veneer 6, a light 32 for invisible light that emits near-infrared light for transmitted light onto a back side of the veneer 6, and an image processing device 1 that detects defects of the veneer 6 by analyzing a captured image generated by a line sensor camera 4 are provided. Defects of the veneer 6 are discriminated on the basis of a set of shading and shapes in an infrared-transmitted-light image based on the transmitted light, and colors in a visible-light image based on the reflected light. Consequently, even if a defect has a small color difference from a normal part in the visible-light image, difference of shading between the defective part and the normal part appears in the infrared-transmitted-light image, and a defect that is difficult to detect by seeing only a color difference in a visible-light image can be relatively easily detected.

An inspection device of the present invention includes: THz wave irradiation unit for irradiating a specimen with THz waves; a THz wave sensing unit for detecting transmitted waves or reflected waves of the THz waves emitted to the specimen; and an information processing unit for acquiring intensity distribution of the transmitted waves of the reflected waves of the specimen from the intensity data of the transmitted waves or the reflected waves of the specimen irradiated with the THz waves, wherein the information processing unit acquires 2-dimensional intensity distribution of the transmitted waves or reflected waves, and detects whether a foreign matter is adhering to the specimen by comparing the intensity distribution obtained when the specimen without attachment of the foreign matter is detected and the intensity distribution obtained when the specimen is detected at the time of inspection. The specimen is a sheet of paper, for example.