A defective part recognition device includes a microscope for obtaining a magnified image of a unit area for recognizing a defective part on the surface of a multi-layer film substrate; a spectral camera having an imaging surface where the magnified image is formed; and an information processing part for processing the spectrum information from the spectral camera. The information processing part includes a machine learning part for a clustering process on the spectrum information for each pixel, and a defect recognition part for recognizing a defective part from the result of the machine learning part. The machine learning part sets a cluster in the unit area and generates a histogram with a frequency, the number of pixels clustered into the cluster. The defect recognition part compares the frequency distribution of the generated histogram with that of a histogram free of defects and recognizes a defective part.

Provided is a device for detecting a defect of an optical film, comprising a light emitting unit, a reflection unit, a screen, and an image capturing unit, and a method for detecting a defect of an optical film, comprising emitting light to a reflection unit, projecting the light reflected by the reflection unit onto an optical film, capturing an image of a screen which displays a projection shape obtained by projecting the light onto the optical film, and analyzing the image.

An inspection apparatus for a display module includes a seat part in which a first recess part including a bottom surface and a side surface extending from the bottom surface is defined, and an inspection part including an inspection connector. The seat part includes a support part having a certain stiffness and located on the bottom surface and a variable part connecting the support part and the side surface. The variable part has a certain elasticity or a portion of the variable part penetrates into the side surface.

The present application provides a method for inspecting a display panel and an inspection apparatus. Wherein the method for inspecting the display panel including the following steps: setting substrate random sampling parameters in a manufacturing process by a manufacturing execution module, and transmitting the random sampling parameters to a production line control module; receiving and storing the random sampling parameters by the production line control module; generating a random sampling control signal and transmitting to a detector according to the random sampling parameters by the production line control module; and performing a random sampling to a substrate by the detector in accordance with the random sampling control signal.

An optical measurement device and an optical measurement method are provided. The optical measurement device includes a test backplane, a light emitter, a center point detector and a movement device. The movement device is provided on the test backplane, and configured to carry a to-be-tested sample. The light emitter is configured to display a first center point on the to-be-tested sample, and the first center point corresponds to a center point of the test backplane. The center point detector is configured to detect a second center point and display the second center point on the to-be-tested sample, and the second center point is a center point of the to-be-tested sample. The movement device is further configured to move the to-be-tested sample, such that the first center point and the second center point coincide with each other.

An optical inspection apparatus includes: a first filter having a plurality of passbands; a first beam splitter to reflect a first light that exits from the first filter to transfer the first light to an inspection target; a second beam splitter to split a second light, which is provided by reflecting the first light by the inspection target, into a first split light and a second split light; a second filter to receive the first split light, and having a passband different from the passbands of the first filter; a fluorescence microscope to generate a fluorescence image from a third light that exits from the second filter; and a first imaging module to generate a first image from the second split light.

The present application provides a method for inspecting a display panel and an inspection apparatus. Wherein the method for inspecting the display panel including the following steps: setting substrate random sampling parameters in a manufacturing process by a manufacturing execution module, and transmitting the random sampling parameters to a production line control module; receiving and storing the random sampling parameters by the production line control module; generating a random sampling control signal and transmitting to a detector according to the random sampling parameters by the production line control module; and performing a random sampling to a substrate by the detector in accordance with the random sampling control signal.

A detection method and device of a display panel are disclosed. The detection method includes: selecting at least two comparison points for a detection point with a set comparison pitch, the detection point corresponding to a separation cell or a pixel cell; detecting a first defect and a second defect of a display substrate according to gray scale values of the detection point and 2 comparison points, wherein the first defect includes a normal separation cell and a pixel defect and the second defect includes a pixel defect and a defected separation cell; and determining the defected separation cell according to the first defect and the second defect.

A method for inspecting a display device includes preparing a target substrate comprising sub-pixels in which light-emitting elements are disposed, dividing each of first regions of the sub-pixels into second regions, obtaining a gray value of each of the second regions, generating a random number using the gray value, calculating a representative value of each of the first regions by reflecting variables in the random number, and summing the representative values of the first regions to calculate a number of light-emitting elements of the sub-pixels.

An optical measurement device and an optical measurement method are provided. The optical measurement device includes a test backplane, a light emitter, a center point detector and a movement device. The movement device is provided on the test backplane, and configured to carry a to-be-tested sample. The light emitter is configured to display a first center point on the to-be-tested sample, and the first center point corresponds to a center point of the test backplane. The center point detector is configured to detect a second center point and display the second center point on the to-be-tested sample, and the second center point is a center point of the to-be-tested sample. The movement device is further configured to move the to-be-tested sample, such that the first center point and the second center point coincide with each other.