Embodiments of a system and method for endoscope cleaning and inspection are disclosed. In an example, an endoscope cleaning and inspection unit includes cleaning and testing capabilities operated via control equipment and a display screen, to operate leak testing equipment, flush control equipment, and optical inspection equipment for leak testing, flushing, rinsing, and inspection of an endoscope interior chamber (lumen) and exterior surfaces. In a further example, the endoscope cleaning and inspection unit may further operate and receive information from a borescope imaging device or a magnification imaging device, using an imaging sensor to capture images of an endoscope lumen or surface respectively, as captured or output on the display screen. Further embodiments provide for control, monitoring, data collection, data input, and data output with such imaging devices via the endoscope cleaning and inspection unit.

Embodiments of a system and method for endoscope cleaning and inspection are disclosed. In an example, an endoscope cleaning and inspection unit includes cleaning and testing capabilities operated via control equipment and a display screen, to operate leak testing equipment, flush control equipment, and optical inspection equipment for leak testing, flushing, rinsing, and inspection of an endoscope interior chamber (lumen) and exterior surfaces. In a further example, the endoscope cleaning and inspection unit may further operate and receive information from a borescope imaging device or a magnification imaging device, using an imaging sensor to capture images of an endoscope lumen or surface respectively, as captured or output on the display screen. Further embodiments provide for control, monitoring, data collection, data input, and data output with such imaging devices via the endoscope cleaning and inspection unit.

Pipe inspection systems including a push-cable, jetter, and camera assembly are disclosed. A jetter nozzle may be configured to spin and/or propel the camera head within a pipe or other cavity. A cutter line may be attached to the camera head to clean obstructions. A sonde may be coupled to a camera head to generate magnetic field signals for use with a buried utility locator to locate a pipe or other cavity into which the camera head is deployed.

Pipe inspection systems including a push-cable, jetter, and camera assembly are disclosed. A jetter nozzle may be configured to spin and/or propel the camera head within a pipe or other cavity. A cutter line may be attached to the camera head to clean obstructions. A sonde may be coupled to a camera head to generate magnetic field signals for use with a buried utility locator to locate a pipe or other cavity into which the camera head is deployed.

Various systems and methods for non-destructive testing (NDT) devices are provided. In one embodiment, an NDT can include a tubular housing including a proximal end and a distal end. The tubular housing can include a head section arranged at the distal end, and a bendable articulation section secured to the head section and arranged proximal to the head section. A sensor can be arranged within the head section, and include a first output terminal having an output signal cable extending along the tubular housing to a control unit arranged at the proximal end of the tubular housing, and a second output terminal grounded within the tubular housing.

Various systems and methods for non-destructive testing (NDT) devices are provided. In one embodiment, an NDT can include a tubular housing including a proximal end and a distal end. The tubular housing can include a head section arranged at the distal end, and a bendable articulation section secured to the head section and arranged proximal to the head section. A sensor can be arranged within the head section, and include a first output terminal having an output signal cable extending along the tubular housing to a control unit arranged at the proximal end of the tubular housing, and a second output terminal grounded within the tubular housing.

The present disclosure may relate to a detector and a detecting system. The detector may include a probe, a first connector connected to the probe, a second connector configured to connect to an external apparatus, an elastic member arranged between and connected to the first connector and the second connector, a transmission line and a flexible protector. An end of the transmission line may pass through the first connector and connect with the probe. The other end of the transmission line may connect with the second connector. An end of the flexible protector may be connected to the first connector. The other end of the flexible protector may be connected to the second connector. The length of the flexible protector may be greater than that of the elastic member in its natural state, and less than that of the transmission line between the first connector and the second connector.

The present disclosure may relate to a detector and a detecting system. The detector may include a probe, a first connector connected to the probe, a second connector configured to connect to an external apparatus, an elastic member arranged between and connected to the first connector and the second connector, a transmission line and a flexible protector. An end of the transmission line may pass through the first connector and connect with the probe. The other end of the transmission line may connect with the second connector. An end of the flexible protector may be connected to the first connector. The other end of the flexible protector may be connected to the second connector. The length of the flexible protector may be greater than that of the elastic member in its natural state, and less than that of the transmission line between the first connector and the second connector.

Compared with a configuration in which reflected light is transmitted by an optical fiber bundle in an inspection probe, the amount of reflected light that is transmitted is increased and the configuration of the inspection probe is simplified.

An inspection probe 12 is configured by inserting a cylindrical hollow glass pipe 61 configured by quartz glass into a cylindrical exterior member 62 configured by stainless steel or the like. The glass pipe 61 transmits a laser beam from a laser light emission device 16 as irradiation light 101 to a leading end part through a hollow region. In the inspection probe 12, the irradiation light 101 is transmitted to the leading end part through the hollow region of the glass pipe 61 and is reflected by a reflection mirror 64 provided at the leading end part, whereby the inner face of an inspection target 80 is irradiated by the irradiation light 101, and reflected light 102 reflected from the inner face of the inspection target 80 is reflected by the reflection mirror 64 and transmitted to a photoelectric conversion unit 17 via a region other than the hollow region of the glass pipe 61.

Compared with a configuration in which reflected light is transmitted by an optical fiber bundle in an inspection probe, the amount of reflected light that is transmitted is increased and the configuration of the inspection probe is simplified.

An inspection probe 12 is configured by inserting a cylindrical hollow glass pipe 61 configured by quartz glass into a cylindrical exterior member 62 configured by stainless steel or the like. The glass pipe 61 transmits a laser beam from a laser light emission device 16 as irradiation light 101 to a leading end part through a hollow region. In the inspection probe 12, the irradiation light 101 is transmitted to the leading end part through the hollow region of the glass pipe 61 and is reflected by a reflection mirror 64 provided at the leading end part, whereby the inner face of an inspection target 80 is irradiated by the irradiation light 101, and reflected light 102 reflected from the inner face of the inspection target 80 is reflected by the reflection mirror 64 and transmitted to a photoelectric conversion unit 17 via a region other than the hollow region of the glass pipe 61.