An apparatus and methods of inspecting, analyzing, classifying, and/or grading quality of a transparent sheet using a data set of photoelasticity measurements, thickness measurements, segmentation specifications, measurement specifications and quality control specifications of the transparent sheet. A results measurement is calculated on a computing system, quality control specifications are applied to the results measurement allowing writing to the database and creating reports, sending results to an operator interface and machine control.

An apparatus and methods of inspecting, analyzing, classifying, and/or grading quality of a transparent sheet using a data set of photoelasticity measurements, thickness measurements, segmentation specifications, measurement specifications and quality control specifications of the transparent sheet. A results measurement is calculated on a computing system, quality control specifications are applied to the results measurement allowing writing to the database and creating reports, sending results to an operator interface and machine control.

A method for measuring the optical quality of a delineated region of a glazing, the delineated region being intended to be placed in front of an acquiring or measuring device such as a camera. The method is particularly suitable for measuring the optical quality of a delineated region of a transportation-vehicle glazing, such as an airplane or automobile windshield, in front of which an optical device for recording images or a device for measuring the environment outside the vehicle is placed with a view to enabling operation of an advanced driver-assistance system of the vehicle.

A method for measuring the optical quality of a delineated region of a glazing, the delineated region being intended to be placed in front of an acquiring or measuring device such as a camera. The method is particularly suitable for measuring the optical quality of a delineated region of a transportation-vehicle glazing, such as an airplane or automobile windshield, in front of which an optical device for recording images or a device for measuring the environment outside the vehicle is placed with a view to enabling operation of an advanced driver-assistance system of the vehicle.

A glue overflow detection system and method, includes a camera module and a processor. The camera module is configured to capture an image which includes a blue chromaticity image and a red chromaticity image. The processor obtains a chromatic-aberration difference image according to the blue chromaticity image and the red chromaticity image. The processor obtains a block feature image according to the chromatic-aberration difference image. The processor obtains a longitudinal inter-block difference image and a transverse inter-block difference image according to the block feature image. The longitudinal inter-block difference image includes a plurality of longitudinal block difference blocks each of which has a longitudinal difference value. The transverse inter-block difference image includes a plurality of transverse block difference blocks each of which has a transverse difference vale. The processor determines that a glue overflow image exists in the image according to the longitudinal difference values and the transverse difference values.

A system and method for high-throughput testing and module integration of rotationally variant optical lens systems is provided. In some examples, the system may be a metrology system that includes a light source to generate optical illumination. The metrology system may also include a null element. The null element may generate, using the optical illumination from the light source, a prescribed wavefront corresponding to a unit under test (UUT). In addition, the metrology system may further include a null element fixture to position the null element with respect to the unit under test (UUT).

A system and method for high-throughput testing and module integration of rotationally variant optical lens systems is provided. In some examples, the system may be a metrology system that includes a light source to generate optical illumination. The metrology system may also include a null element. The null element may generate, using the optical illumination from the light source, a prescribed wavefront corresponding to a unit under test (UUT). In addition, the metrology system may further include a null element fixture to position the null element with respect to the unit under test (UUT).

A detection apparatus according to an embodiment of the present technology includes: an imaging unit; an illumination unit; a polarization control unit; and a generation unit. The imaging unit generates image data on the basis of incident light. The illumination unit illuminates a subject with linearly polarized light. The polarization control unit controls a polarization state of light to be detected, the light to be detected travelling toward the imaging unit. The generation unit generates information regarding a degree of linear polarization of the light to be detected, on the basis of image data regarding the light to be detected, the polarization state of the light to be detected having been controlled, the image data regarding the light to be detected being generated by the imaging unit.

A detection apparatus according to an embodiment of the present technology includes: an imaging unit; an illumination unit; a polarization control unit; and a generation unit. The imaging unit generates image data on the basis of incident light. The illumination unit illuminates a subject with linearly polarized light. The polarization control unit controls a polarization state of light to be detected, the light to be detected travelling toward the imaging unit. The generation unit generates information regarding a degree of linear polarization of the light to be detected, on the basis of image data regarding the light to be detected, the polarization state of the light to be detected having been controlled, the image data regarding the light to be detected being generated by the imaging unit.

A workpiece holder is configured to hold a workpiece and is utilized in a metrology system which includes a sensing configuration for obtaining 3-dimensional surface data for the workpiece. The workpiece holder includes at least three reference features (e.g., spherical reference features extending from sides) that are configured to be sensed by the sensing configuration when the workpiece holder is in different orientations (e.g., as rotated 180 degrees between first and second orientations for presenting front and back sides of the workpiece towards the sensing configuration). A determination of 3-dimensional positions of the reference features for each orientation enables a combining (e.g., in a common coordinate system) of 3-dimensional surface data that is acquired for the workpiece in each orientation. Interchangeable workpiece holding portions may be provided that fit within the workpiece holder for holding workpieces with different characteristics (e.g., having different sizes and/or shapes).