G01N21/958

Systems and methods for automatic visual inspection of defects in ophthalmic lenses

Automatic visual inspection (AVI) systems and methods are disclosed for inspecting transmissive lenses using a plurality of camera poses to provide deflectometric measurements using fringe patterns from at least two points of view. Phase and/or modulation visibility values of the deflectometric measurements are measured for two sensitivities of the patterns taken through an inspection area of the lens from the points of view. Defects are detected based on the phase and/or modulation visibility values at a defect location as compared to at the local area. A defect type is classified to be prismatic, transmissive, lenslet or cosmetic based on the phase and/or modulation visibility values. The defect is localized on the front or back surface of the lens based on the phase and modulation visibility values, and a geometry of the lens orientation. The lens can be invalidated based on defect types, numbers, relative positions and locations.

Systems and methods for automatic visual inspection of defects in ophthalmic lenses

Automatic visual inspection (AVI) systems and methods are disclosed for inspecting transmissive lenses using a plurality of camera poses to provide deflectometric measurements using fringe patterns from at least two points of view. Phase and/or modulation visibility values of the deflectometric measurements are measured for two sensitivities of the patterns taken through an inspection area of the lens from the points of view. Defects are detected based on the phase and/or modulation visibility values at a defect location as compared to at the local area. A defect type is classified to be prismatic, transmissive, lenslet or cosmetic based on the phase and/or modulation visibility values. The defect is localized on the front or back surface of the lens based on the phase and modulation visibility values, and a geometry of the lens orientation. The lens can be invalidated based on defect types, numbers, relative positions and locations.

METHOD AND SYSTEM FOR MUELLER MATRIX POLARIMETRIC CHARACTERIZATION OF TRANSPARENT OBJECTS

Existing Mueller Matrix polarization techniques that rely only on polarization properties are insufficient for accurate characterization of transparent objects. Embodiments of the present disclosure provide a method and system for Mueller Matrix polarimetric characterization of transparent object using optical properties along with the polarization properties to accurately characterize the transparent object. The polarization properties of are derived from a decomposed Mueller matrix element. Additionally, the method derives the optical properties by further subjecting the decomposed Mueller matrix element to Fresnel’s law-based analysis and a reverse Monte Carlo analysis to extract optical properties such as a material refractive index and a material attenuation index. Optical properties vary with changes in the material property caused due to several factors such as manufacturing defect, aberration, inclusion of an impurity such as bubble or dust etc. Thus, considering the optical properties along with the polarization properties enables enhanced, accurate characterization of the transparent object.

METHOD AND SYSTEM FOR MUELLER MATRIX POLARIMETRIC CHARACTERIZATION OF TRANSPARENT OBJECTS

Existing Mueller Matrix polarization techniques that rely only on polarization properties are insufficient for accurate characterization of transparent objects. Embodiments of the present disclosure provide a method and system for Mueller Matrix polarimetric characterization of transparent object using optical properties along with the polarization properties to accurately characterize the transparent object. The polarization properties of are derived from a decomposed Mueller matrix element. Additionally, the method derives the optical properties by further subjecting the decomposed Mueller matrix element to Fresnel’s law-based analysis and a reverse Monte Carlo analysis to extract optical properties such as a material refractive index and a material attenuation index. Optical properties vary with changes in the material property caused due to several factors such as manufacturing defect, aberration, inclusion of an impurity such as bubble or dust etc. Thus, considering the optical properties along with the polarization properties enables enhanced, accurate characterization of the transparent object.

LASER SYSTEM, LEARNING DEVICE, AND INFERENCE DEVICE

A laser system for amplifying laser light generated from a laser light source and emitting the laser light includes an optical element in an optical path of the laser light and transmits the laser light, a control device to control power to be supplied to the laser system, an imager to capture an image of the optical element, and an image processing circuitry to process the image of the optical element captured by the imager. The image processing circuitry in which reference images of the optical element corresponding to power information relating to the power are prepared in advance includes a comparison unit to compare a captured image of the optical element captured by the imager with a reference image selected by a reference image selection unit, the reference image corresponding to the power information at a time of image capturing by the imager.

LASER SYSTEM, LEARNING DEVICE, AND INFERENCE DEVICE

A laser system for amplifying laser light generated from a laser light source and emitting the laser light includes an optical element in an optical path of the laser light and transmits the laser light, a control device to control power to be supplied to the laser system, an imager to capture an image of the optical element, and an image processing circuitry to process the image of the optical element captured by the imager. The image processing circuitry in which reference images of the optical element corresponding to power information relating to the power are prepared in advance includes a comparison unit to compare a captured image of the optical element captured by the imager with a reference image selected by a reference image selection unit, the reference image corresponding to the power information at a time of image capturing by the imager.

METHOD FOR QUANTITATIVELY AND QUALITATIVELY DETECTING PARTICLES IN LIQUID

A method for the quantitative and/or qualitative detection of particles in fluid, with which the fluid to be examined is introduced into a beam path of an optical device, between at least one light source and the image acquisition sensor with a matrix of light-sensitive cells. Pixel values of the cells are detected and the distribution of the pixel values is at least partly determined. The pixel value or values which have been determined most often are used as a value or average value for a background signal. A signal is outputted or the method is interrupted, on reaching a maximal permissible value for the background signal.

METHOD FOR QUANTITATIVELY AND QUALITATIVELY DETECTING PARTICLES IN LIQUID

A method for the quantitative and/or qualitative detection of particles in fluid, with which the fluid to be examined is introduced into a beam path of an optical device, between at least one light source and the image acquisition sensor with a matrix of light-sensitive cells. Pixel values of the cells are detected and the distribution of the pixel values is at least partly determined. The pixel value or values which have been determined most often are used as a value or average value for a background signal. A signal is outputted or the method is interrupted, on reaching a maximal permissible value for the background signal.

APPARATUS FOR STORING INFORMATION ON A SPECTACLES LENS, SPECTACLES LENS BLANK OR SPECTACLES LENS SEMI-FINISHED PRODUCT

Information is stored in an optical element in the form of a glass or plastic body embodied as spectacles lens, spectacles lens blank or spectacles lens semi-finished product. The information in the form of data is stored on or in the glass or plastic body by creating at least one marking with a marking system. The marking can be read by a reading apparatus. The marking system has an interface for reading information individualizing the optical element. The marking is created permanently by the marking system on or in the optical element at a definition point of a local body-specific coordinate system set by two points on or in the optical element. In this body coordinate system, the manufacturer specifies the position of the lens horizontal and/or the far and/or the near and/or the prism reference point.

METHODS AND SYSTEMS FOR DETECTING SCREEN COVERS ON ELECTRONIC DEVICES
20170356857 · 2017-12-14 ·

Systems and methods for detecting the presence or absence of screen covers on electronic device screens are disclosed. In one embodiment, the method includes obtaining an image of a front side of an electronic device and automatically identifying line segments in the image. For each identified line segment, the method includes calculating the angle of the identified line segment. The method further includes determining an amount of the line segments having vertical or horizontal orientations. If the amount of identified vertical or horizontal line segments exceeds a predetermined threshold amount, then the presence of a screen cover is indicated.