A method of supervised machine learning-based spectrum analysis information, using a neural network trained with spectrum information, to identify a specified feature of a given material, a system for supervised machine learning-based spectrum analysis, and a method of training a neural network to analyze spectrum data. The method of supervised machine learning-base spectrum analysis comprises inputting into the neural network spectrum data obtained from a sample of the given material; and the neural network processing the spectrum data, in accordance with the training of the neural network, and outputting one or more values for the specified feature of the sample of the material. In an embodiment, the training set of data includes x-ray absorption spectroscopy data for the given material. In an embodiment, the training set of data includes electron energy loss spectra (EELS) data.

An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.

An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.

Provided is a method for estimating abrasion resistance and fracture resistance by highly accurately analyzing aggregation (dispersion) of sulfur-based materials in polymer composite materials. The present invention relates to a method for estimating abrasion resistance and fracture resistance, the method including: irradiating a polymer composite material containing at least one sulfur-based material selected from the group consisting of sulfur and sulfur compounds with high intensity X-rays; measuring X-ray absorption of a measurement region of the polymer composite material while varying the energy of the X-rays; calculating areas of spots having a high sulfur concentration equal to or greater than a predetermined level in a two-dimensional mapping image of sulfur concentration of the measurement region; and estimating abrasion resistance and fracture resistance based on the areas.

A method for performing x-ray absorption spectroscopy and an x-ray absorption spectrometer system to be used with a compact laboratory x-ray source to measure x-ray absorption of the element of interest in an object with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness laboratory x-ray source, an optical train to focus the x-rays through an object to be examined, and a spectrometer comprising a single crystal analyzer (and, in some embodiments, also a mosaic crystal) to disperse the transmitted beam onto a spatially resolving x-ray detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 105 mrad. and be coupled to an optical train that collects and focuses the high flux x-rays to spots less than 500 micrometers, leading to high flux density. The coatings of the optical train may also act as a low-pass filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.

A method for performing x-ray absorption spectroscopy and an x-ray absorption spectrometer system to be used with a compact laboratory x-ray source to measure x-ray absorption of the element of interest in an object with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness laboratory x-ray source, an optical train to focus the x-rays through an object to be examined, and a spectrometer comprising a single crystal analyzer (and, in some embodiments, also a mosaic crystal) to disperse the transmitted beam onto a spatially resolving x-ray detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 105 mrad. and be coupled to an optical train that collects and focuses the high flux x-rays to spots less than 500 micrometers, leading to high flux density. The coatings of the optical train may also act as a low-pass filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.

A darkroom type security inspection apparatus and a method of performing an inspection using the darkroom type security inspection apparatus. An apparatus includes a housing constituting a closed darkroom, and assemblies disposed inside the housing. The assemblies disposed inside the housing include: a sample collecting unit configured to collect a sample, a conveyor unit, and a X-ray detection unit to detect a position of the objected to be inspected, wherein the X-ray detection unit is configured to determine the position of the objected to be inspected within the sampling assembly so that the object to be inspected together with the conveyor unit is conveyed to an expected position; and a sample processing assembly, wherein the assemblies disposed inside the housing are communicated by fittings or connectors.

A darkroom type security inspection apparatus and a method of performing an inspection using the darkroom type security inspection apparatus. An apparatus includes a housing constituting a closed darkroom, and assemblies disposed inside the housing. The assemblies disposed inside the housing include: a sample collecting unit configured to collect a sample, a conveyor unit, and a X-ray detection unit to detect a position of the objected to be inspected, wherein the X-ray detection unit is configured to determine the position of the objected to be inspected within the sampling assembly so that the object to be inspected together with the conveyor unit is conveyed to an expected position; and a sample processing assembly, wherein the assemblies disposed inside the housing are communicated by fittings or connectors.

The present invention relates to the generation of an Atomic Therapeutic Indicator (ATI) for a test sample by the quantification of manganese; in voxels of a 3D region of the sample, wherein the 3D region is topographically defined by co-ordinates XYZ. The ATI is used to assess the radio-responsiveness i.e. sensitivity or resistance to radiation treatment, of a cancer i.e. a tumor/neoplasm. In a preferred embodiment, the present invention relates to a method of generating the ATI, assessing the radio-responsiveness of a tumor/neoplasm based on the ATI and, based on the assessment, either treating or not treating the tumor with radiation. The present invention also relates to a method of determining if a cancer is likely to reoccur post radiation treatment comprising quantifying the level of manganese in voxels of a 3D region of a test sample from the cancer and determining the frequency of high metallomic regions (HMRs) in the cancer, wherein a high frequency of HMRs is indicative that the cancer is likely to reoccur and a low frequency of HMRs is indicative that the cancer is unlikely to reoccur; and associated methods of treatment. The invention further relates to a method of determining the radio-responsiveness of a melanoma, the method comprising determining the level of melanin in a test sample from the melanoma, wherein the lower the level of melanin the more sensitive the melanoma is to radiation and the higher the level of melanin the more resistant the melanoma is to radiation; and associated methods of treatment.

The present invention relates to the generation of an Atomic Therapeutic Indicator (ATI) for a test sample by the quantification of manganese; in voxels of a 3D region of the sample, wherein the 3D region is topographically defined by co-ordinates XYZ. The ATI is used to assess the radio-responsiveness i.e. sensitivity or resistance to radiation treatment, of a cancer i.e. a tumor/neoplasm. In a preferred embodiment, the present invention relates to a method of generating the ATI, assessing the radio-responsiveness of a tumor/neoplasm based on the ATI and, based on the assessment, either treating or not treating the tumor with radiation. The present invention also relates to a method of determining if a cancer is likely to reoccur post radiation treatment comprising quantifying the level of manganese in voxels of a 3D region of a test sample from the cancer and determining the frequency of high metallomic regions (HMRs) in the cancer, wherein a high frequency of HMRs is indicative that the cancer is likely to reoccur and a low frequency of HMRs is indicative that the cancer is unlikely to reoccur; and associated methods of treatment. The invention further relates to a method of determining the radio-responsiveness of a melanoma, the method comprising determining the level of melanin in a test sample from the melanoma, wherein the lower the level of melanin the more sensitive the melanoma is to radiation and the higher the level of melanin the more resistant the melanoma is to radiation; and associated methods of treatment.