A method for analyzing flow of a multiphase fluid through a flowmeter is provided. In one embodiment, the method includes transmitting two beams of electromagnetic radiation along different paths through a multiphase fluid and detecting the two transmitted beams with detectors. The method also includes determining a gas fraction and a water-in-liquid ratio of the multiphase fluid. The gas fraction is determined based on the detected first beam of electromagnetic radiation and the water-in-liquid ratio of the multiphase fluid is determined based on the detected second beam of electromagnetic radiation. Additional systems, devices, and methods are also disclosed.

A method for analyzing flow of a multiphase fluid through a flowmeter is provided. In one embodiment, the method includes transmitting two beams of electromagnetic radiation along different paths through a multiphase fluid and detecting the two transmitted beams with detectors. The method also includes determining a gas fraction and a water-in-liquid ratio of the multiphase fluid. The gas fraction is determined based on the detected first beam of electromagnetic radiation and the water-in-liquid ratio of the multiphase fluid is determined based on the detected second beam of electromagnetic radiation. Additional systems, devices, and methods are also disclosed.

A method and apparatus for rapid measurement and analysis of structure and composition of poly-crystal materials by X-ray diffraction and X-ray spectroscopy, which uses a two-dimensional energy dispersive area detector having an array of pixels, and a white spectrum X-ray beam source. A related data processing method includes separating X-ray diffraction and spectroscopy signals in the energy dispersive X-ray spectrum detected by each pixel of the two-dimensional energy dispersive detector; correcting the detected X-ray diffraction signals by a correction function; summing the corrected X-ray diffraction signals and X-ray spectroscopy signals, respectively, over all pixels to obtain an enhanced diffraction spectrum and an enhanced spectroscopy spectrum; using the enhanced diffraction and spectroscopy spectrum respectively to determine the structure and composition of the sample. The summing step includes using Bragg's equation to convert the intensity-energy diffraction spectrum for each pixel into an intensity-lattice spacing spectrum before summing them.

A method and apparatus for rapid measurement and analysis of structure and composition of poly-crystal materials by X-ray diffraction and X-ray spectroscopy, which uses a two-dimensional energy dispersive area detector having an array of pixels, and a white spectrum X-ray beam source. A related data processing method includes separating X-ray diffraction and spectroscopy signals in the energy dispersive X-ray spectrum detected by each pixel of the two-dimensional energy dispersive detector; correcting the detected X-ray diffraction signals by a correction function; summing the corrected X-ray diffraction signals and X-ray spectroscopy signals, respectively, over all pixels to obtain an enhanced diffraction spectrum and an enhanced spectroscopy spectrum; using the enhanced diffraction and spectroscopy spectrum respectively to determine the structure and composition of the sample. The summing step includes using Bragg's equation to convert the intensity-energy diffraction spectrum for each pixel into an intensity-lattice spacing spectrum before summing them.

The present disclosure discloses a method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and identifying the item to be inspected as the item corresponding to the minimum distance. The present disclosure is based on a multi-energy-spectrum X-ray imaging system, and proposes a method of substance identification by analyzing the multi-energy-spectrum substance identification issue. Compared with the conventional dual-energy X-ray system, the multi-spectrum imaging can significantly improve the system's ability to identify substances in theory, especially in the field of security applications. The improvement of substance identification is important for contraband inspection, such as, drugs, explosives.

The present disclosure discloses a method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and identifying the item to be inspected as the item corresponding to the minimum distance. The present disclosure is based on a multi-energy-spectrum X-ray imaging system, and proposes a method of substance identification by analyzing the multi-energy-spectrum substance identification issue. Compared with the conventional dual-energy X-ray system, the multi-spectrum imaging can significantly improve the system's ability to identify substances in theory, especially in the field of security applications. The improvement of substance identification is important for contraband inspection, such as, drugs, explosives.

A specimen radiography system may include a controller and a cabinet. The cabinet may include an x-ray source, an x-ray detector, and a specimen drawer disposed between the x-ray source and the x-ray detector. The specimen drawer may be automatically positionable along a vertical axis between the x-ray source and the x-ray detector.

A specimen radiography system may include a controller and a cabinet. The cabinet may include an x-ray source, an x-ray detector, and a specimen drawer disposed between the x-ray source and the x-ray detector. The specimen drawer may be automatically positionable along a vertical axis between the x-ray source and the x-ray detector.

An X-ray detection device 30 comprises a low energy scintillator 31 configured to convert an X-ray of a low energy range into scintillation light, a low energy line sensor 32 configured to detect the scintillation light to output image data, a high energy scintillator 33 configured to convert an X-ray of a high energy range into scintillation light, and a high energy line sensor 34 configured to detect the scintillation light to output image data. Pixels L of the low energy line sensor 32 and pixels H of the high energy line sensor 34 are identical in number and are aligned at an identical pixel pitch, and a minimum filtering process is executed on the image data from the low energy line sensor 32, while an averaging process is executed on the image data from the high energy line sensor 34.

An X-ray detection device 30 comprises a low energy scintillator 31 configured to convert an X-ray of a low energy range into scintillation light, a low energy line sensor 32 configured to detect the scintillation light to output image data, a high energy scintillator 33 configured to convert an X-ray of a high energy range into scintillation light, and a high energy line sensor 34 configured to detect the scintillation light to output image data. Pixels L of the low energy line sensor 32 and pixels H of the high energy line sensor 34 are identical in number and are aligned at an identical pixel pitch, and a minimum filtering process is executed on the image data from the low energy line sensor 32, while an averaging process is executed on the image data from the high energy line sensor 34.