An x-ray transmission spectrometer system to be used with a compact x-ray source to measure x-ray absorption with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness x-ray source, an optical system with a low pass spectral filter property to focus the x-rays through an object to be examined, and a spectrometer comprising a crystal analyzer (and, in some embodiments, a mosaic crystal) to disperse the transmitted beam, and in some instances an array detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 15 degrees, and be coupled to an optical system that collects and focuses the high flux x-rays to micron-scale spots, leading to high flux density. The x-ray optical system may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.

Methods and system for decomposing a high-energy dual-energy X-ray CT material are disclosed. In the method, two types of effect such as Compton effect and electron pairing effect which dominates are reserved and the influence of the other effect such a photoelectric effect is removed so as to improve the accuracy of the material decomposition. The unique advantage of the present disclosure is to effectively remove the error of the calculated atomic number Z due to directly selecting two effects during processes of material decomposition in the conventional dual-energy CT method. This may greatly improve the accuracy of dual-energy CT identification of the material, and it is important to improve the conventional dual-use CT imaging system applications, such as clinical therapy, security inspection, industrial non-destructive testing, customs anti-smuggling and other fields.

Methods and system for decomposing a high-energy dual-energy X-ray CT material are disclosed. In the method, two types of effect such as Compton effect and electron pairing effect which dominates are reserved and the influence of the other effect such a photoelectric effect is removed so as to improve the accuracy of the material decomposition. The unique advantage of the present disclosure is to effectively remove the error of the calculated atomic number Z due to directly selecting two effects during processes of material decomposition in the conventional dual-energy CT method. This may greatly improve the accuracy of dual-energy CT identification of the material, and it is important to improve the conventional dual-use CT imaging system applications, such as clinical therapy, security inspection, industrial non-destructive testing, customs anti-smuggling and other fields.

A dual energy based X-ray scanning system has a linear detector array with high and low energy detectors. A signal processing method is employed that accounts for varying angles at which the transmitted X-rays impinge upon the detectors and also the varying order in which the transmitted X-rays pass through the high and low energy detectors. This yields both high resolution in the generated images and better penetration performance.

An IP cover having a light-shielding property is detachably mounted on an IP. The IP includes a stimulable phosphor layer on one surface thereof. The IP cover is mounted on the stimulable phosphor layer so as to be closely attached to the stimulable phosphor layer. The IP and the IP cover include notches, and a part of an inspection target is inserted into the notches at the time of inspection. An IP unit is mounted on a blade welded portion of an impeller. Radiation is applied from a radiation irradiation device and a radiation image of the blade welded portion is recorded on the IP as a latent image. The IP cover is detached from the IP unit and the IP is set on a template. The IP is set at an image reading position of a radiation image reading device by the template, and the radiation image is read.

A radiation imaging device capable of matter-element information acquisition and image based selection comprises: a radiation source generating radiation; at least one scattering device receiving radiation which includes radiation transmitting a subject and scattered radiation and scattering the received radiation; and an imaging device receiving the radiation which includes the radiation transmitting the subject and the scattered radiation to measure energy and positional information so as to calculate a two-dimensional image.

A radiation imaging device capable of matter-element information acquisition and image based selection comprises: a radiation source generating radiation; at least one scattering device receiving radiation which includes radiation transmitting a subject and scattered radiation and scattering the received radiation; and an imaging device receiving the radiation which includes the radiation transmitting the subject and the scattered radiation to measure energy and positional information so as to calculate a two-dimensional image.

An image processing apparatus that generates a material characteristic image with use of a plurality of radiation images that have been captured with different radiation energies, comprises a combining unit that combines radiation images based on two or more radiation images that are included among the plurality of radiation images, and combines radiation spectrums based on two or more radiation spectrums of the two or more radiation images, and a generating unit that generates a material characteristic image with use of two pairs of a radiation image and a radiation spectrum obtained from the plurality of radiation images. The generating unit uses, for at least one of the two pairs, a pair of the radiation image and the radiation spectrum combined by the combining unit.

An X-ray imaging system for generating X-ray projections of an object, the X-ray imaging system including an X-ray device having a single X-ray source (110) for forming a plurality of X-ray beams (104), a filter (120) positioned within the plurality of X-ray beams, an object space where the object to be imaged is accommodated, and an X-ray detector (150) including an array of a plurality of pixels (151 . . . 155). The X-ray device, the filter, and the plurality of pixels are configured such that at least one pixel is exposed to the plurality of X-ray beams. X-ray radiation received by a particular pixel undergoes a same spectral filtration by the filter. Pixels receiving the X-ray radiation undergoing the same spectral filtration are summarized to a pixel subset.

An X-ray imaging system for generating X-ray projections of an object, the X-ray imaging system including an X-ray device having a single X-ray source (110) for forming a plurality of X-ray beams (104), a filter (120) positioned within the plurality of X-ray beams, an object space where the object to be imaged is accommodated, and an X-ray detector (150) including an array of a plurality of pixels (151 . . . 155). The X-ray device, the filter, and the plurality of pixels are configured such that at least one pixel is exposed to the plurality of X-ray beams. X-ray radiation received by a particular pixel undergoes a same spectral filtration by the filter. Pixels receiving the X-ray radiation undergoing the same spectral filtration are summarized to a pixel subset.