G01N23/20041

Structure for pressurization analysis, X-ray diffraction apparatus and pressurization analysis system
11913891 · 2024-02-27 · ·

A structure for pressurization analysis includes a sample accommodating unit (10) for accommodating an all-solid-state battery (S) therein, and a pressurizing unit (30) having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is pressurized inside the sample accommodating unit (10) while being sandwiched between a pressure receiving member (21) and a pressing member (22). Further, an X-ray window (14) is provided in an outer radial direction orthogonal to an acting direction of the pressure from the pressurizing unit (30), and reflection type X-ray diffraction measurement can be performed through the X-ray window (14).

MODULAR SPECIMEN HOLDERS FOR HIGH PRESSURE FREEZING AND X-RAY CRYSTALLOGRAPHY OF A SPECIMEN

The present invention relates to modular specimen holder (10) for high pressure freezing and/or X-ray crystallography of a specimen comprising a specimen holding element (100) and an extension element (200) connectable with each other and separable from each other; the specimen holding element (100) comprising a tubule (120) and a base element (110), wherein the tubule (120) is adapted to hold the specimen, the base element (110) is adapted to hold the tubule (120), wherein a distance from a bottom of the base element (110) to a top of the tubule (120) is a distance d.sub.1; the extension element (200) being adapted to be connected with the base element (110), wherein, when the extension element (200) and the base element (110) are connected with each other, a distance from a bottom of the extension element (200) to the top of the tubule (120) is a second distance d.sub.2; wherein the second distance d.sub.2 is larger than the first distance d.sub.1.

Diamond anvil cell having an integrated sensor

A pressure chamber has a chamber wall. The chamber wall includes a sensor integrated within the chamber wall, wherein the sensor integrated in the chamber wall comprises defects. A method of determining an effect of pressure on a material is further described. The method includes applying pressure to a material within a pressure chamber and to a pressure chamber wall of the pressure chamber, where the pressure chamber wall has defects. A signal from the defects is sensed while the material and the pressure chamber wall are under pressure. A property of the material is determined based on the sensed signal.

Diamond anvil cell having an integrated sensor

A pressure chamber has a chamber wall. The chamber wall includes a sensor integrated within the chamber wall, wherein the sensor integrated in the chamber wall comprises defects. A method of determining an effect of pressure on a material is further described. The method includes applying pressure to a material within a pressure chamber and to a pressure chamber wall of the pressure chamber, where the pressure chamber wall has defects. A signal from the defects is sensed while the material and the pressure chamber wall are under pressure. A property of the material is determined based on the sensed signal.

SAMPLE HANDLING APPARATUS FOR PRESSURIZED FLUIDS AND X-RAY ANALYZER APPLICATIONS THEREOF

A sample handling apparatus/technique/method for a material analyze including a sample carrier for presenting a pressurized sample (e.g., LPG) to a sample focal area of the analyzer; a removable fixture for charging the pressurized sample into the sample carrier; the removable fixture including at least one port to provide sample to and from the fixture and carrier. The sample handling apparatus may include a retainer, wherein the sample carrier is removeably combined with the fixture using the retainer, the apparatus being insertable into the analyzer for sample analysis; and wherein the retainer includes an aperture for presenting the sample to the focal area from a filmed, lower end of the carrier in proximity therewith.

HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE CELLS AND ENVIRONMENTS

High-throughput high-pressure (HT HP) sample cells and sampling environments are disclosed herein. The HT HP sample cells include a top cell member and a bottom cell member that can be sealed together enclosing a sample in a pressure transmitter chamber. Further, the HT HP sample cells include a compressible, circular internal separator for compressing a sub-mL soft matter liquid sample. Further, the radiation beam windows of the HT HP sample cells are integral to the HT HP sample cell members. The novel and innovative HT HP sample cell design enables SANS measurements of the soft matter liquid sample when exposed to extreme temperatures and pressures without exhibiting leakage or cross-contamination of the soft matter liquid sample with the pressurizing fluid. Methods for using the HT HP sample cells in a pressurizing system for SANS analysis are also disclosed.

HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE CELLS AND ENVIRONMENTS

High-throughput high-pressure (HT HP) sample cells and sampling environments are disclosed herein. The HT HP sample cells include a top cell member and a bottom cell member that can be sealed together enclosing a sample in a pressure transmitter chamber. Further, the HT HP sample cells include a compressible, circular internal separator for compressing a sub-mL soft matter liquid sample. Further, the radiation beam windows of the HT HP sample cells are integral to the HT HP sample cell members. The novel and innovative HT HP sample cell design enables SANS measurements of the soft matter liquid sample when exposed to extreme temperatures and pressures without exhibiting leakage or cross-contamination of the soft matter liquid sample with the pressurizing fluid. Methods for using the HT HP sample cells in a pressurizing system for SANS analysis are also disclosed.

Structure for battery analysis and X-ray diffraction device
12080858 · 2024-09-03 · ·

A structure for battery analysis of the present invention includes a pressurizing unit (30) having a pressurizing mechanism, and a pressure receiving unit (10) for receiving pressure acting on a sample battery (S), and pressurizes the sample battery (S) accommodated in a hollow portion of a battery accommodation unit (20) between the pressurizing unit (30) and the pressure receiving unit (10) to suppress expansion and contraction of the sample battery (S).

Structure for battery analysis and X-ray diffraction device
12080858 · 2024-09-03 · ·

A structure for battery analysis of the present invention includes a pressurizing unit (30) having a pressurizing mechanism, and a pressure receiving unit (10) for receiving pressure acting on a sample battery (S), and pressurizes the sample battery (S) accommodated in a hollow portion of a battery accommodation unit (20) between the pressurizing unit (30) and the pressure receiving unit (10) to suppress expansion and contraction of the sample battery (S).