An electromagnet for a thermography system comprising a first elongated magnetic core spaced apart from a second elongated magnetic core; at least a first shorting bar connecting substantially at a first end of the first elongated magnetic core and a first end of the second elongated magnetic core; and at least a first excitation coil configured to conduct electrical current.

An apparatus for measuring material properties of an object of ferromagnetic material, the apparatus including a probe, the probe including an electromagnet core defining two spaced-apart poles for inducing a magnetic field in the object, and a drive coil wound around the electromagnet core, and means to supply an alternating electric current to the drive coil to generate an alternating magnetic field in the electromagnet core and consequently in the object, wherein the probe also includes two sensing coils arranged in the vicinity of each of the poles, for sensing the magnetic flux density that links the core and the object, such sensing coils are significantly more sensitive to changes in material properties than are sensing coils overwound onto the drive coil.

There is disclosed a device for use in evaluating the integrity of soil behind a wall of an infrastructure. The device generally has a frame having a plurality of rests adapted to be received onto the wall during use; a hammer assembly having an actuator fixedly mounted to the frame and a hammer element having a head movably mounted to the frame, the actuator being actuatable to move the head to strike the wall while the plurality of rests hold the frame in a fixed position relative to the wall; and a sensor configured and adapted to sense vibrations of a portion of the wall resulting from the strike and to generate a vibration signal indicative thereof.

An apparatus for chemical mechanical polishing includes a platen having a surface to support a polishing pad, a carrier head to hold a substrate against a polishing surface of the polishing pad, a pad conditioner to hold a conditioning disk against the polishing surface, an in-situ polishing pad thickness monitoring system, and a controller. The controller is configured to store data associating each of a plurality of conditioner disk products with a respective threshold value, receive an input selecting a conditioner disk product from the plurality of conditioner disk products, determine a particular threshold value associated with the selected conditioner disk product, receive a signal from the monitoring system, generate a measure of a pad cut rate from the signal, and generate an alert if the pad cut rate falls beyond the particular threshold value.

The present application discloses a detection structure for chip edge cracks and a detection method thereof. In one embodiment, the detection structure comprises a test ring located between a chip scribe line and a sealing ring, wherein the chip internally comprises two test pads for detecting continuity of the test ring, the sealing ring comprises a P-type doped ring located in a substrate and a shallow trench isolation area for isolating the sealing ring the test ring, the shallow trench isolation area is formed with N-type doped regions electrically connected to the two test pads respectively; the test ring comprises a multi-layer interconnection structure located on the substrate and the interconnection structure is electrically connected to the two test pads through the N-type doped regions. The present application can detect edge cracks caused by wafer manufacturing, die sawing, and chip packaging processes to reduce reliability risk.

A shoe for analyzing a component is provided. The shoe includes a housing, a NDT probe disposed on a side of the housing, and a shoe interface. The shoe interface is disposed at the side of the housing and contacts the component during the analyzing of the component. The shoe interface separates the NDT probe from the component during the analyzing of the component and moves along the component during the analyzing of the component. The shoe also includes first and second wear indicators. The first wear indicator indicates that the shoe interface is usable during the analyzing of the component. The second wear indicator indicates that the shoe interface should be replaced. Both of the wear indicators are configured similar to the shoe interface and move along the component while the shoe analyzes the component.

An eddy-current flaw detector includes a trace data calculator configured to calculate each coordinate with respect to flaw detection points on which an inspection probe is used upon performing an eddy-current testing based on an inputted condition of eddy-current flaw detection and surface shape data of an inspection-object surface measured by a profilometer, and to calculate a normal vector of each flaw detection point; a gap evaluation calculator configured to acquire an evaluation result on a gap between the inspection-object surface and the inspection probe for each flaw detection point; a flaw detection data collector configured to acquire flaw detection data of an inspection object for each flaw detection point; a flaw detection data analyzer configured to evaluate presence/absence of a flaw in the inspection-object surface based on the flaw detection data of the inspection object and the evaluation result on the gap for each flaw detection point.

A readout circuit for an electromagnetic inspection system for nondestructive testing of a test object is disclosed. The inspection system includes a plurality of sensors for sensing an electromagnetic response from the test object and generating therefrom a plurality of response signals. The readout circuit can include a plurality of anti-aliasing filters, each configured to receive the response signal from one of the sensors and bandlimit the response signal to produce one of a plurality of bandlimited signals. The readout circuit can also include a time-division multiplexer configured to multiplex the bandlimited signals into a time-division multiplexed (TDM) signal including a sequence of frames outputted at a TDM frame rate, each frame including a plurality of time slots, each time slot assigned to one of the bandlimited signals, wherein the anti-aliasing filters are configured to operate based on the TDM frame rate to attenuate aliasing artifacts in the TDM signal.

Reconfigurable electromagnetic pipe inspection tools are designed and assembled using optimized parameters determined using modeling. The reconfigurable tools include multiple modules connected to one another in a stackable fashion guided by optimized tool parameters customized based on well diagrams.

A probe including a plurality of links connected together in series, wherein the plurality of links create a flexible compartment containing at least a first and second exciter means and at least one pair of detector means, wherein the exciter means are driven by an alternating current to produce an alternating magnetic field, and the detector means are configured to detect the magnetic field of an induced eddy current caused by the exciter means magnetic field.