G01N27/904

MEASUREMENT SYSTEM AND METHOD OF USE

A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.

MEASUREMENT SYSTEM AND METHOD OF USE

A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.

INSPECTION SYSTEM FOR A PLURALITY OF SEPARABLE INSPECTION OBJECTS

An inspection system for a plurality of separable inspection objects, including a feed device for the plurality of inspection objects, a conveying device for the plurality of inspection objects, an inspection unit and an ejecting device. The feed device is configured and disposed such that the plurality of inspection objects can be fed by the feed device to a feed position of the conveying device. The conveying device includes a plurality of receptacles, each receptacle is configured and disposed such that exactly one inspection object of the plurality of inspection objects can be conveyed along a conveying path in said receptacle and that two respective inspection objects from the plurality of inspection objects have a spacing along the conveying path that is defined by the plurality of receptacles. The inspection unit is disposed at an inspection position on the conveying path.

INSPECTION SYSTEM FOR A PLURALITY OF SEPARABLE INSPECTION OBJECTS

An inspection system for a plurality of separable inspection objects, including a feed device for the plurality of inspection objects, a conveying device for the plurality of inspection objects, an inspection unit and an ejecting device. The feed device is configured and disposed such that the plurality of inspection objects can be fed by the feed device to a feed position of the conveying device. The conveying device includes a plurality of receptacles, each receptacle is configured and disposed such that exactly one inspection object of the plurality of inspection objects can be conveyed along a conveying path in said receptacle and that two respective inspection objects from the plurality of inspection objects have a spacing along the conveying path that is defined by the plurality of receptacles. The inspection unit is disposed at an inspection position on the conveying path.

Magnetic body inspection apparatus
11644439 · 2023-05-09 · ·

A magnetic body inspection apparatus includes a magnetic field application unit configured to apply a magnetic field to a long material including a magnetic body to be inspected, a detector configured to excite, in a longitudinal direction of the long material, magnetization of the magnetic body, the detector being configured to acquire a detection signal based on the magnetic field of the magnetic body that has been excited, and a detection apparatus body including the magnetic field application unit and the detector, the detection apparatus body being configured to be attachable to the long material in a short-side direction of the long material.

Magnetic body inspection apparatus
11644439 · 2023-05-09 · ·

A magnetic body inspection apparatus includes a magnetic field application unit configured to apply a magnetic field to a long material including a magnetic body to be inspected, a detector configured to excite, in a longitudinal direction of the long material, magnetization of the magnetic body, the detector being configured to acquire a detection signal based on the magnetic field of the magnetic body that has been excited, and a detection apparatus body including the magnetic field application unit and the detector, the detection apparatus body being configured to be attachable to the long material in a short-side direction of the long material.

SENSORY ELEMENTS FOR PULSED EDDY CURRENT PROBE

Sensory elements for placement within a probe that includes at least one receiving coil disposed within a pulsed eddy current probe, and at least one sensing element disposed within a pulse eddy current probe.

Eddy current flaw detection apparatus
11674927 · 2023-06-13 · ·

The eddy current flaw detection apparatus includes: a pair of detecting coils 10a, 10b arranged in coaxial and spaced relation with a specimen 3; and a bridge circuit two sides of which are constituted by the detecting coils so that magnetic fields generated by these detecting coils 10a, 10b are in opposite phases to each other. A pair of exciting coils 11a, 11b are arranged coaxially with the detecting coils 10a, 10b in a manner to sandwich the pair of detecting coils 10a, 10b therebetween. A distance D between the detecting coil and the exciting coil adjacent thereto is set to a distance where a vibrational noise signal excited in the exciting coil and detected by its adjacent detecting coil is in opposite phase to that of a vibrational noise signal excited in the detecting coil and detected by the detecting coil.

Shoe interface wear indicator

A shoe for analyzing a component is provided. The shoe includes a housing, a NDT probe disposed on a side of the housing, and a shoe interface. The shoe interface is disposed at the side of the housing and contacts the component during the analyzing of the component. The shoe interface separates the NDT probe from the component during the analyzing of the component and moves along the component during the analyzing of the component. The shoe also includes first and second wear indicators. The first wear indicator indicates that the shoe interface is usable during the analyzing of the component. The second wear indicator indicates that the shoe interface should be replaced. Both of the wear indicators are configured similar to the shoe interface and move along the component while the shoe analyzes the component.

Contactless odometer

A contactless odometer system can include a sensor array. The sensor array can include a plurality of sensing elements adjacent to a target surface and configured to receive signals based on a distance separating the sensing element from the adjacent surface and a defect present below the adjacent surface of the target. The system can also include a controller configured to receive the signals from first and second locations within the target and to generate first and second defect maps corresponding to the first and second locations. The controller can identify overlapping portions of first and second defect maps and can determine a translation distance in at least one direction. Related methods of determining a distance traveled by a contactless odometer system are also provided.