Systems and methods for driving optical sources operating at different wavelengths within a smoke sensor are described herein. Multiple optical sources such as light emitting diodes may be used in a photoelectric smoke sensor to detect particles of different sizes. Photoelectric smoke sensors can operate by pulsing the LEDs and measuring a response in a light sensor. The signal measured at the light sensor changes based on the quantity of particles existing in a smoke chamber. Each optical source may have different operational characteristics and thus require different drive currents to operate. LED driving circuitry according to embodiments discussed herein provide a consistent and reliable drive current to each optical source, while maximizing efficiency of power consumption across a range of possible voltages provided by different power sources.

An optical inspection system for pre-bonding inspection system includes a stage on which a sample to be inspected is placed, a sensor, optical assemblies, each including an optical head having optics to direct a sample field-of-view (FOV) to a portion of the sample, a first light source configured to illuminate the sample at a first oblique angle, a second light source configured to illuminate the sample at a second oblique angle, a focusing lens to focus a first optical image of the portion of the sample generated by the first light source, and a second optical image of the portion of the sample generated by the second light source onto a segment of the sensor, and a controller configured to combine the first optical image and the second optical image generated by each optical assembly, and generate a map of point defects on the sample.

An optical inspection system for pre-bonding inspection includes a stage having a surface on which a sample to be inspected is placed, the surface of the sample having at least parts with a two dimensional (2D) periodic pattern which may include defects, an optical head including optics, a dark-field illuminator configured to illuminate the surface of the sample at an first angle, wherein the first angle is an oblique angle, a bright-field illuminator configured to illuminate the surface at a second angle, a dark-field collection path, a bright-field collection path, and a sensor configured to detect light transmitted from the dark-field illuminator, scattered at the surface of the sample, collected by the optical head, and relayed through the dark-field collection path, and light transmitted from the bright-field illuminator, reflected at the surface of the sample, and relayed through the bright-field collection path.

A device for optical detection of analytes in a sample includes at least two optoelectronic components. The optoelectronic components include at least one optical detector configured to receive a photon and at least one optical emitter configured to emit a photon. The at least one optical emitter includes at least three optical emitters disposed in a flat, non-linear arrangement, and the at least one optical detector includes at least three optical detectors disposed in a flat, non-linear arrangement. The at least three optical emitters and the at least three optical detectors include at least three different wavelength characteristics.

Aspects of inventive concepts described herein relate to an interferometric reflectance imaging system. The system can include an imaging sensor including pixels that are preferentially sensitive to a plurality of light components; an illumination source configured to emit illumination light along an illumination path, the illumination light including the plurality of light components; and a target including a target substrate configured to support one or more nanoparticles on a surface of the target substrate. The system may be configured to, at a nominal focus position: generate an image at the imaging sensor based, at least in part, on the light reflected from the target interfering with light scattered from nanoparticles on the target substrate; and process the image to detect the nanoparticles on the target substrate.

A light-sensing device and a manufacturing method thereof are provided. The light-sensing device includes a substrate, at least one light-emitting component and a light-sensing component. The light-emitting component is used to emit a light, and the light-sensing component is used to receive the diffuse-reflected light after the light is diffuse-reflected by an external object. Moreover, the light-emitting component and the light-sensing component are individually and separately mounted on the substrate.

Provided is an automatic analysis device capable of obtaining a stable light intensity over a wide wavelength band by multiplexing a plurality of LED lights and adjusting the temperature characteristics of each LED element. The automatic analysis device according to the present disclosure is configured such that light emitted from a second LED is reflected to be multiplexed on the same optical axis as the light emitted from a first LED, and the first LED and the second LED are in contact with the same temperature adjustment member.

The present invention relates to a method and device for determining a property of an ambient environment. The device comprises a plasmonic sensing element; a first light source for illuminating a first and a second light sensor, the first sensor via the plasmonic sensing element; a second light source for illuminating the light sensors; circuitry for executing: a control function controlling light sources, a function receiving a measurement from the first sensor, and a first signal from the second sensor, a function receiving a reference from the first sensor, and a second signal from the second sensor, a function determining the property by comparing the measurement and reference signals, and the control function further controlling light sources such that a relation of intensities of light emitted by the light sources is constant over time.

The present invention relates to a device for detecting a defect in a structural element made of composite material. The device includes a structural element made of composite material and having an elongate shape, at least one detection optical fiber arranged inside the structural element, and a light-emitting device comprising a plurality of light sources connected to a strand of optical fibers, all of the strands being grouped into a bundle of strands.

Aspects of inventive concepts described herein relate to an interferometric reflectance imaging system. The system can include an imaging sensor including pixels that are preferentially sensitive to a plurality of light components; an illumination source configured to emit illumination light along an illumination path, the illumination light including the plurality of light components; and a target including a target substrate configured to support one or more nanoparticles on a surface of the target substrate. The system may be configured to, at a nominal focus position: generate an image at the imaging sensor based, at least in part, on the light reflected from the target interfering with light scattered from nanoparticles on the target substrate; and process the image to detect the nanoparticles on the target substrate.