A micromachined gyroscope includes a dynamic mass suspended from at least one anchor attached to a substrate. The dynamic mass includes a first proof mass and a second proof mass, a first drive actuator configured to drive the first proof mass in a first direction in a rotary oscillation mode of the gyroscope, and second drive actuator configured to drive the second proof mass in an opposite direction in the rotary oscillation mode of the gyroscope.

Angular accelerometers are described, as are systems employing such accelerometers. The angular accelerometers may include a proof mass and rotational acceleration detection beams directed toward the center of the proof mass. The angular accelerometers may include sensing capabilities for angular acceleration about three orthogonal axes. The sensing regions for angular acceleration about one of the three axes may be positioned radially closer to the center of the proof mass than the sensing regions for angular acceleration about the other two axes. The proof mass may be connected to the substrate though one or more anchors.

A physical quantity sensor includes a substrate, a movable body that is provided displaceably in a state of being opposed to the substrate and is provided with a first through-hole and a second through-hole as through-holes, and a protrusion configured integrally with the substrate at a side of the movable body of the substrate, and in which the protrusion is provided at a position where the protrusion overlaps the through-hole and the movable body in plan view.

A micro-electro-mechanical system (MEMS) device and a method of testing a MEMS device. The device includes a MEMS sensor having first and second mobile elements, first and second electrodes arranged to deflect the mobile elements by the application of test voltages, and a differential detector circuit. The device also includes an input multiplexer circuit configured selectively to connect each electrode to a test voltage source to apply a plurality of test voltages to deflect the mobile elements during a test mode. The test voltages comprise a set of monotonically increasing test voltages and a set of monotonically decreasing voltages for performing a C(V) sweep to test for stiction. The device further includes an output multiplexer circuit configured selectively to connect the first mobile element and/or the second mobile element to a single one of the inputs of the detector circuit to detect the deflection of the mobile element.

A MEMS device includes at least one proof mass, the at least one proof mass is capable of moving to contact at least one target structure. The MEMS device further includes at least one elastic bump stop coupled to the proof mass and situated at a first distance from the target structure. The MEMS device additionally includes at least one secondary bump stop situated at a second distance from the target structure, wherein the second distance is greater than the first distance, and further wherein the at least one elastic bump stop moves to reduce the first distance when a shock is applied.

A physical quantity detection element includes: a substrate; first and second fixed electrode portions on the substrate; a movable body on the upper portion of the substrate; and a beam on the movable body, the movable body includes a first movable body on a first side of the beam, and a second movable body on a second side of the beam, the first movable body includes a first movable electrode portion facing the first fixed electrode portion and a first mass portion disposed in an opposite direction of the beam from the first movable electrode portion, the second movable body includes a second movable electrode portion facing the second fixed electrode portion, a mass of the first movable body is greater than a mass of the second movable body, and a mass of the first mass portion is greater than a mass of the first movable electrode portion.

A micromechanical component, in particular, an inertial sensor, including a seismic mass, a substrate, and a cap. The component includes a reference electrode, which is in a first electrode layer and is connected to the substrate, and a further reference electrode, which is in a second electrode layer and is connected to the cap. The seismic mass is deflectable on two sides, in a direction perpendicular to the major plane of extension of the reference electrode. The seismic mass includes a flexible limit stop in the direction of deflection towards the first electrode layer. The flexible limit stop is connected to the main part of the seismic mass using a spring element. The spring element is in an elastic layer, which is positioned between a layer of the main part of the seismic mass and the first electrode layer.

A sensor assembly. The sensor assembly has a substrate, a seismic mass, and a functional layer arranged between the substrate and the seismic mass. The seismic mass is connected to the substrate in such a way that the seismic mass can be deflected at least along a first direction running perpendicular to the substrate. Within the functional layer and between the seismic mass and the substrate, at least one stop is formed that is spring-loaded and can be deflected along the first direction.

A method for testing a multi-axis micro-electro-mechanical system(MEMS) acceleration sensor includes applying a first voltage to a first-axis excitation plate to move a first proof mass in contact with a proof mass stop. A second voltage is applied to a second-axis excitation plate while maintaining the first voltage to the first-axis excitation plate, to move the first proof mass in a direction orthogonal to the first-axis while in contact with the proof mass stop A reference voltage is applied to the first-axis excitation plate and a determination is made whether an output voltage of the MEMS device is higher than a threshold voltage. If the output voltage is higher than the threshold voltage ten stiction is detected and stiction recovery may therefore be preformed.

A physical quantity sensor includes a base substrate, a movable portion that is oscillatably provided around an axis while facing the base substrate and that is divided into a first movable portion and a second movable portion, a first fixed electrode that is disposed on the base substrate facing the first movable portion, and a second fixed electrode that is disposed on the base substrate facing the second movable portion. The first fixed electrode and the second fixed electrode are configured so as to offset at least a part of a difference between a first fringe capacitance, which is between the first movable portion and the first fixed electrode, and a second fringe capacitance, which is between the second movable portion and the second fixed electrode.