A device for testing a battery, having a transport system, wherein the transport system is configured for receiving the battery, for transporting the battery to a test position, and for transporting the battery out of the test position. The device also includes an interface configured to supply the battery arranged in the test position with electric power and configured to supply the battery arranged in the test position with gas.

A measuring apparatus ascertains measurement information relating to an input voltage. The measuring apparatus contains an operational amplifier having first and second inputs, and an output for providing the measurement information. The measuring apparatus further has a first input node for coupling to a first pole of the input voltage, and a first isolation resistor which connects the first input node to the first input of the operational amplifier. Moreover, the measuring apparatus contains a second input node for coupling to a second pole of the input voltage, and a second isolation resistor which connects the second input node to the second input of the operational amplifier. The measuring apparatus further has a feedback resistor which connects the output of the operational amplifier to the first input of the operational amplifier, and a reference resistor which connects the second input of the operational amplifier to a reference potential.

A package substrate, an apparatus for testing power supply noise, and a method for testing power supply noise are provided. The package substrate includes multiple pad arrays, and each of the multiple pad arrays at least includes power supply pads. Power supply pads belonging to a same power supply type in the multiple pad arrays are divided into a test pad and a power supply pad set. The power supply pad set includes power supply pads, other than the test pad, among the power supply pads belonging to the same power supply type, all the power supply pads in the power supply pad set are electrically connected together, and the test pad is configured to perform noise testing of at least one internal power supply corresponding to the same power supply type in a chip to be tested.

An evaluation method is a method for evaluating a charging connector in coolability by connecting an evaluation jig to the charging connector, the charging connector including a pair of male terminals coolable with a coolant, the evaluation jig including a pair of female terminals, the pair of female terminals being connected to the pair of male terminals in evaluating the charging connector in coolability. The method comprises: connecting the pair of female terminals to the pair of male terminals; adjusting a connection state between the male terminal and the female terminal such that contact resistance between the terminals is 0.06 mΩ or more and 0.15 mΩ or less; and after the adjusting, evaluating the coolability depending on whether the male and female terminals have a temperature of 90° C. or lower when a charging current of 400 A is supplied to the terminals for 30 minutes.

A pipeline AC mitigation SSD Marker Station has a shape and land surface area footprint that are similar to conventional pipeline location markers or corrosion test stations. The SSD Marker Station includes an SSD device that connects an underground metallic pipeline to an underground grounding conductor. The SSD Marker Station further includes a disconnect switch configured to disconnect the SSD device from the pipeline and/or grounding conductor. Also included is a pair of testing ports that are in electrical communication with the SSD device. Testing of the SSD device thereby requires only operating the disconnect switch to isolate the SSD device from the pipeline and/or grounding connector and performing an electrical measurement across the testing ports. In embodiments, the SSD Marker Station meets all requirements applicable to a pipeline location marker, and can be installed in lieu of a pipeline location marker.

The invention relates to a probe card (PC) for use with an automatic test equipment (ATE), wherein the probe card (PC) comprises a probe head (PH) on a first side thereof, and wherein the probe card (PC) is adapted to be attached to an interface (IF) and wherein the probe card (PC) comprises a plurality of contact pads on a second side in a region opposing at least a region of the interface (IF), arranged to contact a plurality of contacts of the interface (IF), and wherein the probe card (PC) comprises one or more coaxial connectors (CCPT) arranged to mate with one or more corresponding coaxial connectors (CCPT) of the interface (IF). The invention relates further to pogo tower (PT) for connecting a wafer probe interface (WPI) of an automatic test equipment with the probe card (PC).

An electronic monitoring circuit for detecting a variation in the power or current absorbed by an electronic circuit under test is disclosed. The circuit includes an input terminal adapted to receive a pulse-width modulation control signal, a resistor having a first terminal connected to the input terminal, and a capacitor having a first terminal connected to a second terminal of the resistor. The output terminal is adapted to generate an output signal as a function of the value of the voltage drop at the ends of the capacitor, said output signal being representative of a variation of the pulse width of the pulse-width modulation control signal. The variation of the pulse width is a function of the power or current absorbed by the electronic circuit under test.

The present disclosure provides an electrical connector and a device for testing conduction which relate to the field of testing devices. By providing a first contact end having a planar structure, the contact area between the electrical connector and a testing substrate is increased, and a large current can be conducted and damage to the product and device is avoided. A second contact end is a point or linear structure, and when poor contact is caused due to the uneven testing substrate or oxidization of the testing substrate, effective contact and electrical connection with the testing substrate can be achieved, to improve the effectiveness of an electrical connection.

Methods are provided that performs continuous semiconductor testing during long soak time testing using a chamberless single insertion model (SIM) handler and also using a chamberless asynchronous insertion model (AIM) handler having two manipulators. The methods include dividing a group of semiconductors having an ambient temperature into a first subgroup having a plurality of portions and a second subgroup having a plurality of portions, the second subgroup being identical to the first subgroup. The methods also include using thermal chucks to change the temperature of the first portion of the first subgroup and the first portion of a second subgroup prior to testing from ambient temperature to a stabilized designated temperature during a soak time. The methods also include testing all of the portions of the first subgroup and the second subgroup using predetermined protocols that include Soak Time, Test Time, Index Time, and sometimes Wait Time.

An electric meter includes: a plurality of connectors configured to form electrical connections to corresponding plurality of receptacles in an electric meter socket, wherein at least one electrical connection to the plurality of receptacles is formed with a neutral wire; and a plurality of measurement devices configured to measure electrical characteristics of voltage and current waveforms provided to the electric meter from an electric distribution system and a distributed energy resource (DER) device via the plurality of connectors. The neutral wire provides an electrical reference point for measurement of the voltage waveforms.