Embodiments are directed to microscale and millimeter scale multi-layer structures (e.g., probe structures for making contact between two electronic components for example in semiconductor wafer, chip, and electronic component test applications). One or more layers of the structures include shell and core regions formed of different materials wherein the core regions are offset from a symmetric, longitudinally extending position

A circuit assembly for forming and testing batteries connected in parallel and in series includes a parallel test management device (PTMD) that connects to each battery and includes a main relay and a current transducer in series and an auxiliary relay in series with a current limiting resistor, which are parallel to the main relay. Parallel battery groups are formed by connecting multiple PTMD-battery combinations and a voltage equalizer in parallel. Multiple parallel battery groups are connected in series. A battery testing system (BTS) connects to the battery groups. The equalizers and the BTS pass current through the batteries simultaneously. The current through batteries and the voltage drop across the current transducer are about zero at the end of charge and discharge.

A current-sensing resistor for measuring a current with two connection parts for introducing and discharging the current to be measured includes a resistor element made of a resistor material, a first voltage measurement contact at the first connection part for measuring the voltage at the first connection part, a second voltage measurement contact at the second connection part for voltage measurement at the second connection part, and a cut in the second connection part, the cut surrounding the second voltage measurement contact and preventing current flow across the cut. The resistor also includes a third voltage measurement contact arranged at the second connection part for measuring the voltage at the second connection part, and that the third voltage measurement contact is arranged at the second connection part offset with respect to the main current flow direction transversely to the second voltage measurement contact at the second connection part.

An engaging device in a Mass-Interconnect, which provides an apparatus and method to change test adapters for testing applications. An engaging device of a Mass-Interconnect includes an interchangeable test adapter (ITA) and a locking mechanism. The locking mechanism includes a plunger having a plunger head at a first end thereof, a leaflet insert disposed over the plunger, a sleeve disposed over the leaflet insert, an over-dead-center (ODC) link connected to the plunger at a second end thereof opposite to the first end, and a rotatable handle connected to the ODC link. The plunger, the leaflet insert, and the sleeve of the locking mechanism engage or disengage the ITA when a user rotates the rotatable handle.

An apparatus includes a fixed substrate having at least two contact structures, a movable substrate having at least two electrically conductive paths, a housing containing the fixed substrate and the movable substrate, a plurality of connectors in the housing, each connector connecting to one of the at least two contact structures to connect to ground and a spring contact, the plurality of connectors arranged to connect to at least one of the conductive paths depending upon a position of the movable substrate, and a motorized stage in the housing to move the movable substrate to align one of the at least two conductive paths to form a connection between two of the connectors. The apparatus may be part of a test and measurement instrument, and a method of operating the apparatus is also included.

A USB integrated circuit (IC), a testing platform and an operating method for USB integrated circuit are provided. The USB integrated circuit includes a USB port physical layer (PHY) circuit, a first lane adapter, a second lane adapter, a routing circuit, and a USB transport layer circuit. The USB PHY circuit is configured to transmit a differential signal between the USB integrated circuit and an outside device. When the USB integrated circuit operates in a testing mode, the routing circuit electrically connects the first lane adapter to the USB PHY circuit. When the USB integrated circuit operates in a working mode, the routing circuit electrically connects the second lane adapter to the USB PHY circuit. The USB transport layer circuit is coupled to the first lane adapter and the second lane adapter.

A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; a lid member that covers the DUT and is attached to the carrier body; and an identifier for identifying an individual of the test carrier.

A power supply processing device includes three electric control valve groups, a positive output terminal and a conversion control switch group. The conversion control switch group includes a selection switch group configured to selectively connect the current valve control components in each electric control valve group to the positive output terminal or the phase output terminal, and a connection switch group configured to connect or disconnect a current path between two electric control valve groups connected one another. In such a way, both AC experiments and DC experiments of high voltage and large capacity may be performed to the connectors without changing experimental site and experimental equipment, thereby effectively reducing the experimental cost.

A method for testing air tightness includes connecting a testing chamber and a storage chamber, supplying negative pressure to the storage chamber, measuring the pressure in the storage or testing chamber to obtain a first pressure value, determining air tightness of the testing chamber according to the negative pressure and the first pressure value, stopping the negative pressure to the storage chamber, measuring the pressure in the storage chamber to obtain a second pressure value, measuring the pressure in the storage chamber after stopping the negative pressure to the storage chamber to obtain a third pressure value, and determining air tightness of the testing chamber according to the second and third pressure values. The device includes testing and storage chambers, a negative pressure generator, and a pressure gauge connected to the storage chamber, which is connected to the testing chamber. The negative pressure generator is connected to the storage chamber.

A test point adaptor for coaxial cables includes a main body, a test body, and a cap. The main body has a first longitudinal axis and includes a first end comprising a first interface, a second end comprising a second interface, and a first center conductor extending at least from the first interface to the second interface. The test body has a second longitudinal axis arranged transversely to the main body and includes an outer conductive sleeve, a test body end comprising a third interface, an electrically conductive contact member in electrical contact with the first center conductor, and a gripping arrangement electrically coupled with the electrically conductive contact member. The third interface includes a conical contact surface of the outer conductive sleeve. The cap includes a sleeve configured to matingly engage an outer surface of the outer conductive sleeve. The outer conductive sleeve includes a conical contact surface configured to engage the conical contact surface of the outer conductive sleeve when the cap is matingly engaged with the outer sleeve. The cap includes a terminator configured to be aligned with and received by the gripping arrangement, which electrically couples the terminator to the electrically conductive contact member.