G01R1/0416

Contact assembly

An electrical contact assembly includes an electrically nonconductive base, a first electrical contact supported by the base and a second electrical contact supported by the base such that the first contact and the second contact are separated by a space. The first electrical contact is configured to engage a first external conductive circuit element and the a second electrical contact is configured to engage a second external conductive circuit element. The first contact and the second contact are configured such that a portion of the first contact and a portion of the second contact converge as the base moves in a first direction relative to the first and second external conductive circuit elements and diverge as the base moves in a second direction relative to the first and second external conductive circuit elements.

Sheet connector, sheet set, electrical inspection device, and electrical inspection method

A sheet connector according to the present invention has: a first insulating layer having a first surface positioned on one side in the thickness direction, a second surface positioned on the other side, and a plurality of first through-holes passing through between the first surface and the second surface; and a plurality of first conductive layers arranged on the inner wall surfaces of the first through-holes. First ends of the first conductive layers on the first surface side project from the first surface.

APPARATUSES, SYSTEMS, AND METHODS FOR SCREENING ELECTRONIC COMPONENTS

A system may include a device under test, a body having a plurality of conductors, a rotation section, a probe associated with the rotation section, the probe configured to house at least a portion of one or more of the plurality of conductors, and a nest having at least one terminal, the nest configured to couple to the device under test and to permit at least a portion of the probe to pass through an opening of the device under test.

CHARGING TEST APPARATUS AND METHOD
20240219483 · 2024-07-04 ·

An embodiment of this application provides a charging test apparatus and method, where the charging test apparatus includes: a first USB interface, a second USB interface matching the first USB interface, a plurality of conductive paths, and a control module, where the first USB interface is configured to connect to an electronic device, and the second USB interface is configured to connect to a charger. The control module is separately electrically connected to each conductive path, and is configured to control connection and disconnection of each conductive path based on a preset on/off time parameter, where the preset on/off time parameter is used to determine a connection start moment of each conductive path. The charging test apparatus provided in this application can improve efficiency of a charging test.

Connector apparatus for a field device as well as field device with such a connector apparatus

A connection apparatus comprises a platform, a plug connector having a plug connector part secured to the platform and electrically connected to the circuit of the field device and a plug connector part connectable with the connection cable and complementary to the first plug connector part, as well as a lid held movably relative to the platform for at least partially covering the plug connector formed by connecting the plug connector parts. The lid is swingable between a first end position, in which the lid at least partially covers the plug connector, and a second end position, and is additionally adapted in at least one open position located between the first end position and the second end position to expose the plug connector such that the plug connector part can be separated from the plug connector part, as well as at least in the first end position to secure the plug connector part connected with the plug connector part.

Test device
10302674 · 2019-05-28 · ·

A test device for testing electric properties of an object. The test device includes an object support unit configured to support an object; a cover unit configured to include a cover body coupled to the object support unit and a pusher supported by the cover body so as to move toward and away from the object; and a pressure adjuster configured to include a multi-stage adjusting cam which is rotatably provided in the cover body while contacting the pusher and has a multi-stage contact pressing portion with contact radii varied depending on rotated angles so that the pusher can be in a moving-back position and be positioned at a plurality of pressing distances from the cover body, and an operation unit which operates the multi-stage adjusting cam.

SYSTEMS AND METHODS OF TESTING MULTIPLE DIES

In a method of testing a semiconductor wafer including a scribe line and multiple dies, the method includes implementing a first landing pad on the scribe line, and implementing a first interconnect on the scribe line and between the first landing pad and a first cluster of the dies, thereby coupling the first landing pad to the first cluster of dies. The method also includes performing the testing of the first cluster of dies using automated test equipment (ATE) coupled to a probe tip by contacting the first landing pad with the probe tip, and applying an ATE resource to the first cluster of dies.

APPARATUS AND METHOD FOR PACKAGING, HANDLING OR TESTING OF SENSORS
20190154729 · 2019-05-23 ·

A method of testing sensors includes providing a test sheet that includes a plurality of sensor assemblies, a plurality of test pads, and traces extending from the sensor assemblies to the plurality of test pads. A sensor is positioned on each sensor assembly. Each sensor is connected to the sensor assembly with wire bonds. An enclosure is formed over the plurality of sensor assemblies. An electrical signal is detected from each of the plurality of sensor assemblies at the test pads.

TESTING INTERPOSER METHOD AND APPARATUS
20190146004 · 2019-05-16 ·

The disclosure describes a novel method and apparatus for improving silicon interposers to include test circuitry for testing stacked die mounted on the interposer. The improvement allows for the stacked die to be selectively tested by an external tester or by the test circuitry included in the interposer.

MECHANISM FOR SECURING A CONNECTOR DEVICE TO A MATING CONNECTOR DEVICE
20190148881 · 2019-05-16 · ·

A mechanism for securing a connector device and a mating connector device to one another and for releasing them from one another, the mechanism having at least one catch arranged on the connector device and a drive with a shaft, the rotation of which is capable of moving the catch to and fro between an open position and a locking position of the catch. The mechanism is constructed such that, during travel between the open position and the locking position, the catch performs a combined pivoting and translational movement, and/or a translational movement on a curved path. The mechanism has a slotted link with a link guide and a link block, wherein the link guide is arranged on the catch and the link block lies on the axis of the shaft or is formed by the shaft. The drive has a crank drive for converting the rotation of the shaft into a movement of the catch between the open position and the locking position and the mechanism has a second slotted link for guiding the catch, wherein a link block of the second slotted link is formed by part of a connecting rod shaft on the catch side with which a connecting rod of the crank drive is coupled to the catch. The catch takes the form of a toggle lever. Furthermore, a connector device with the mechanism and a system consisting of a connector device with a mechanism and a mating connector device having at least one mating catch.