The present disclosure relates to a measurement arrangement including a sensor, an electronics module, a signal cable having a cable circuit, and a superordinate unit. The sensor is releasably pluggable to the electronics module which itself is releasably pluggable to the signal cable. The signal cable is connected with the superordinate unit. The plug connections between the sensor and the electronics module and between the electronics module and the signal cable may be galvanically isolated. The sensor outputs digital data in a first format to the electronics module. The electronics module outputs digital data in a second format to the signal cable. The superordinate unit is configured to receive and to process the digital data in the second format.

An adjustable tool configured to facilitate mounting an electromechanical device relative to a tester is contemplated. The adjustable tool may be operable to facilitate adjustably mounting a belt tensioner, pulley or other rotating element of the electromechanical device relative to a belt drive or other rotatable testing element included on the tester in a manner sufficient to enable adjusting tensioning and/or positioning therebetween.

The present invention provides a printed circuit board assembly including a substrate having a plurality of conductive layers vertically sandwiched between a first cap-insulation layer and a second cap-insulation layer. The substrate has a first part, a second part and a third part. For protecting the conductive layers from moisture, each of the areas of the conductive layers corresponding to the second part is smaller than the area of the first cap-insulation layer corresponding to the second part for at least a first predetermined percentage, and each of the areas of the conductive layers corresponding to the second part is smaller than the area of the second cap-insulation layer corresponding to the second part for at least the first predetermined percentage.

Interconnection meter socket adapters are provided. An interconnection meter socket adapter comprises a housing enclosing a set of electrical connections. The interconnection meter socket adapter may be configured to be coupled to a standard distribution panel and a standard electrical meter, thereby establishing connections between a distribution panel and a user such that electrical power may be delivered to the user while an electrical meter measures the power consumption of the user. An interconnection meter socket adapter may be configured to be coupled to a DC-AC converter, which may be coupled to various energy sources. As such, the energy sources are coupled to an electrical power system. In addition, a connector such as a flexible cable or flexible conduit containing insulated wires can be provided for connecting various energy sources and/or sinks.

Embodiments of the present invention provide an improved two-cable connection system for connecting electrical test instrumentation to a device under test (DUT). In one embodiment, a single pair of equal-length triaxial cables each has a desired characteristic impedance. Each cable has a center connecter, intermediate conductor, and outer conductor. The proximal end of each cable is connected to the test instrumentation, and the distal ends are located at the DUT. At the distal end, the center conductors are connected to the DUT, the intermediate conductors are allowed to float, and the outer conductors are connected to each other. The proximal end of each cable is connected to the device using an appropriate connection for the test that will be performed. This allows the test instrumentation to perform different types of tests without changing connections to the DUT.

A method and device for detecting a defect of a display panel, the method comprises steps of: connecting at least one electrical test pad on the display panel to a first detecting terminal, and connecting another at least one electrical test pad on the display panel to a second detecting terminal; providing a preset voltage between the first detecting terminal and the second detecting terminal; and, detecting whether magnitudes of currents passing through the first detecting terminal and the second detecting terminal within a predetermined time are less than a preset current threshold, and if not, then determining there is a defect on the display panel. The present disclosure can implement effective detection and interception of a progressive defect or badness in the display panel.

A testing device measures a characteristic of an electrical conductor. The testing device includes a substrate having at least one flexible portion, at least one sensor located on the substrate, and a holding mechanism. The at least one sensor is configured to generate a signal indicative of the characteristic of the electrical conductor. The holding mechanism is configured to hold the testing device to an outer portion of the electrical conductor such that the at least one sensor is held in a position with respect to the electrical conductor.

An example test fixture, which interfaces a tester and a unit under test (UUT), includes the following: first electrical contacts that face the tester; second electrical contacts that face the UUT; a substrate made of sections of printed first material, with the first material being electrically non-conductive, and with the substrate being between the first electrical contacts and the second electrical contacts; and structures through the substrate, with the structures including sections of second material, with the second material being electrically conductive, and with at least one of the structures electrically connecting a first electrical contact and a second electrical contact.

Disclosed herein is technology of a probe connector for a probing pad structure around a thermal attach mounting hole. A probe connector includes a socket frame including a first channel and an elongated body including a second channel. Socket conductors are disposed in the socket frame around the first channel. The second channel is disposed at a first distal end of the elongated body, and the elongated body is disposed on the socket frame. The socket conductors are to make electrical contact with a probing pad structure disposed on a surface area around a thermal attach mounting hole of a circuit board in response to a loading attachment engaging with the elongated body via the second channel, the socket frame via the first channel, and the circuit board via the thermal attach mounting hole.

A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.