Patent classifications
G01R1/0416
SPRING LOCK INTERFACE WITH INCREASED CABLE CAPACITY
A test adapter assembly for an interface. The test adapter assembly has a test adapter frame having a first pair of opposing sides, a second pair of opposing sides and an engagement mechanism support member, the second pair of opposing sides being shorter than the first pair of opposing side, the first and second pairs of opposing sides forming a test adapter face; and a collar support member, the collar support member having plate portion mounted to one of the second pair of opposing sides of the test adapter frame and a collar mounting portion extending from the plate portion at an angle of 40-50° relative to the face of the test adapter frame;
APPARATUS FOR TESTING A BATTERY-POWERED DEVICE
An apparatus for testing a battery-powered device is provided. The apparatus is configured to be inserted into a button cell battery slot of the device to provide temporary power for testing the device. The testing apparatus may include a button cell battery, electrical contacts connected to or provided by the button cell battery and configured to engage electrical contacts within the button cell battery slot of the device, and an extension portion shaped to project from the slot when the testing apparatus is inserted into the button battery slot.
Integrated voltage sense and bus bar system and method for vehicles having a traction battery
A vehicle includes a traction battery having a plurality of battery cells positioned in an array with a non-conductive bus bar housing having a plurality of compartments insulated from one another and containing one or more bus bars each having an integrally formed voltage sense connector. Each compartment may accommodate terminals of a pair of adjacent battery cells to be coupled by the associated bus bar. The voltage sense connector may include fingers for crimping and securing a voltage sense wire or a welding pad for welding, soldering, or similar connection. The voltage sense wires connect to a battery control module.
Clamp meter and clamp probe
The present application relates to a clamp meter and a clamp probe that can be matched for use with the clamp meter. The clamp meter comprises a main meter body having an interfacing connector and one or more clamp probes, wherein each of the clamp probes is detachably connectable to the interfacing connector of the main meter body. Each of the clamp probes has a converting unit that converts a signal measured by the clamp probe to an output measurement signal within a predetermined measurement range of the main meter body, and each of the clamp probes has an identity indicator readable by the main meter body. As the clamp meter according to the present application can be matched with a plurality of clamp probes having different measurement ranges, a user only needs to purchase one main meter body and one or more clamp probes of different models to meet various measuring needs. This can enhance the flexibility and extendibility of the usage of a clamp meter, as well as reduce the user's financial burden.
Automated waveform analysis using a parallel automated development system
A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.
Garment incorporating a non destructive control system
A garment of vest type (1) incorporating a non-destructive control system includes, as constituent elements, an electronic measurement device (26) able to be connected to a measurement sensor, and linked to an electronic card (20) itself linked to an electrical power supply source (21) and to a viewing and control screen (27), and cables for electrically and electronically linking the constituent elements to one another.
CONNECTION TERMINAL
A conductive connection terminal is extensible and compressible in a longitudinal direction, and includes: a first contact member including a first tip portion configured to contact with one electrode of a contact target, and a first base end portion; a second contact member including a second tip portion configured to contact with another electrode of the contact target, and a plurality of tongue parts configured to contact with the first base end portion; an elastic member configured to extend and compress the first contact member and the second contact member in the longitudinal direction; and a load applying unit configured to apply a load to the tongue parts in a direction bringing the tongue parts into contact with an outer circumference of the first base end portion.
TEST MATRIX ADAPTER DEVICE
A test matrix adapter device having a plurality of segments arranged in a plane, the respective segments have line-shaped and column-shaped frame sections, and the segments are connected to one another in a form-fitting manner by the frame sections. Semiconductor receiving devices are arranged within the segments, that each have a plurality of first contact surfaces that are spaced apart from one another. The semiconductor receiving device are form-fittingly connected by webs to the frame sections of an assigned segment. The semiconductor receiving device has a bottom side and a base region at least partially enclosed by a frame, and an outer side. The column-shaped frame sections have projections that have second contact surfaces that are connected by conductor tracks to the first contact surfaces. The semiconductor receiving device adapted to receive a packaged semiconductor component with terminal contacts and to connect the terminal contacts to the first contact surfaces.
MULTIPLEXER-ENABLED CABLES AND TEST FIXTURES
A calibrated test and measurement cable for connecting one or more devices under test and a test and measurement instrument, including a first port structured to electrically connect to a first signal lane, a second port structured to electrically connect to a second signal lane, a third port structured to electrically connect to a test and measurement instrument, and a multiplexer configured to switch between electrically connecting the first port to the third port and connected the second port to the third port. The first and second signal lanes can be included on the same device under test or different devices under test. An input can receive instructions to operate the multiplexer.
TERMINAL BLOCK HOUSING INTENDED TO RECEIVE AT LEAST ONE MULTI-STRAND CABLE
The invention relates to a housing comprising a terminal block intended to receive at least one end of a multi-strand cable and therefore comprising at least one recess (6a, 6b, 6c, 6d) for receiving the end of the cable, the recess being provided with a wall (8) in which an opening (7a, 7b, 7c, 7d) is arranged and through which the end of the cable extends during use, and a flank (10a, 10b, 10c, 10d) arranged opposite the wall with the opening, at least one surface of the flank facing the inside of the recess being rough in order to limit the risk of at least one strand detached from the end of the cable sliding through a space between the flank and the rest of the housing.