A system for testing equipment using a test box unit for testing the equipment comprising a mate-in interface for connection to the test box unit; for connection to contacts on the equipment and a unique identifier thereon. A computing device is adapted to retrieve a connector configuration that corresponds to the unique identifier of the mate-in interface; within the connector configuration corresponding to the unique identifier of the mate-in interface, select any one of the contacts for testing; and test any one of the contacts to ground, and/or test any one of the contacts against each other one of the contacts.

A large scale automated test system employs one or more relay boxes that contain and support one or more relay boards. Each relay board is operated to selectively communicate an item being designed, for example a cell phone, an automobile, or an aircraft, with two or more electrical components being considered in the design of the item to evaluate the performance of each electrical component in the item being designed.

A method and apparatus for testing electronic devices installed in a portable device. The apparatus incorporates a socket with receptacles for alignment pins, and an alignment plate with openings for the alignment pins. The holes for the alignment pins are matched to the socket receptacles, providing secure alignment. The spring loaded socket pin mates with at least one solder ball. The apparatus also includes a circuit card, which may be a modem test platform circuit card that has contacts that mate with the at least one solder ball. Other functions may be tested using other circuit card assemblies. A method of testing includes: installing the electronic device to be tested into a socket assembly, aligning the electronic device to be tested into the socket assembly; installing the socket assembly into a test apparatus, and testing the device.

A waveguide alignment system with dual plates is disclosed. The disclosed system comprises: a base component, a lower plate coupled to the base component, and an upper plate coupled to the lower plate, wherein the upper plate is configured to attach to an electronic testing equipment component.

A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT, and a lid member that covers the DUT and is attached to the carrier body. The carrier body has a first through-hole for positioning that is provided to face the DUT.

A current-sensing resistor for measuring a current with two connection parts for introducing and discharging the current to be measured includes a resistor element made of a resistor material, a first voltage measurement contact at the first connection part for measuring the voltage at the first connection part, a second voltage measurement contact at the second connection part for voltage measurement at the second connection part, and a cut in the second connection part, the cut surrounding the second voltage measurement contact and preventing current flow across the cut. The resistor also includes a third voltage measurement contact arranged at the second connection part for measuring the voltage at the second connection part, and that the third voltage measurement contact is arranged at the second connection part offset with respect to the main current flow direction transversely to the second voltage measurement contact at the second connection part.

An adapter alignment device, that can be added on the coaxial RF connectors of instruments, especially slide screw impedance tuners, aligns and guides precisely and repeat ably the male and female adapters into each-other. This leaves the internal center conductors of the tuner slabline, which are attached to the connectors and to external manually handled cables, intact; this is crucial for all instruments, most of all electro-mechanical impedance tuners, where data generated by previous calibrations are used in later measurement and where any other type of numeric adapter error correction or error model is impossible.

A signal lead structured to be attached to an electrical device that comprises a signal pad, a spring housing, a spring, and a flexible conduit. The spring is carried in the spring housing, and a portion of the spring extends beyond a surface of the spring housing when the spring is unsprung. The spring is structured to touch the electrical device and carry an electrical signal between the electrical device and the signal pad when the signal lead is attached to the electrical device. The flexible conduit is coupled to the signal pad at an end of the flexible electrical conduit and extends away from the spring housing.

An oscilloscope probe includes: a connector pod; a probe identification module disposed in the connector pod, the probe identification module having a cross-sectional area; and a resistor disposed in the connector pod, and in-line with the probe identification module and having a substantially identical cross-sectional area as the probe identification module.

An electronic test and control system is provided. The electronic test and control system includes an enclosure configured to enclose one or more electronic boards and connective electrical wires. An adaptable interface assembly is attached to a face of the enclosure. The adaptable interface assembly includes a customized interface panel and one or more connectors connected to the customized interface panel. The adaptable interface assembly is configured to interface with application specific instruments and devices such as to eliminate the need for custom adapters positioned to interface with standard electronic test and control systems and application specific instruments and devices.