A fastener locating tool equipped with a sensor head having one or more probes and a method for operating such a tool for precisely locating a fastener that is hidden or buried under a thick coating applied on a surface of a structure. The fastener locating tool may be manually or automatically operated. The fastener locating tool includes a platform having a central opening, means for temporarily attaching the platform to a coated surface, and a sensor head that may be easily mechanically coupled to and then later decoupled from the platform. Optionally, the fastener locating tool also includes a multi-stage positioning system with X and Y stages which may be used to adjust the position of the sensor head. The sensor head includes at least one probe which generates electrical signals indicating the presence of a fastener beneath a coating when the probe is within a detection range.

A touch screen testing platform may be used to engage a dynamically positioned target feature being displayed on a touch screen enabled device during a testing protocol. The platform may record imagery displayed by the touch screen device and then analyze the imagery to locate the target feature within a reference coordinate system. The platform may recognize that the target feature is missing from the imagery and respond by causing the touch screen device to scroll through a command menu and/or toggle through virtual screens. Once located, the platform may instruct a robotic device tester to select the target feature by contacting the touch screen at the identified location using a conductive tip designed to simulate a user's fingertip, Prior to running a test, the camera may be focused to a point that is offset from the display screen of the touch screen device.

An adjustment control device for precise measurement that controls an inspection equipment for inspecting an inspected object to perform precise measurement includes a lowering control unit that lowers the inspection equipment with respect to the inspected object, a rotation control unit that is coupled to the lowering control unit and that controls the lowering control unit to rotate the inspection equipment at a predetermined angle in left and right directions when viewed from a frontal point of view, and a forward and backward control unit that is disposed above the rotation control unit and that transmit a moving force to the rotation control unit to move the inspection equipment forward or forward on the inspected object.

The present disclosure describes a connection line for high currents and voltages, the connection line having an electrically conductive strand bundle enclosed by an electrically insulating cable sheath, and at least one compensation region for compensating angle tolerances, position tolerances and relative movements between two portions of the connection line. The cable sheath may be interrupted in the compensation region. The strand bundle may be widened in a spindle-like manner to form at least three arcuate strands.

A portable probe stand assembly including a hand-held frame, a gravity tilt unit, and a probe holder. The hand-held frame includes a frame body with a cut-out and two gripping handles. The gravity tilt unit includes a movable part that has a pivot portion rotatably connected to the hand-held frame. The movable part tends to pivot due to gravity to turn the portable probe stand assembly to a hand-held state where a portion of an underside abutting surface of the movable part is disposed out of the cut-out. The portable probe stand assembly is convertible from the hand-held state to a usage state where the movable part is leveled via a pivot movement of the movable part upon engaging the underside abutting surface with a surface of an object.

A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.

A probe adapter includes an adapter body including a probe aperture and a slot. The probe adapter further includes a driver slidably mounted within the slot and slidable between a first position and a second position. The driver includes a first end and a second end opposite the first end. The first end includes a ramped recess extending in a direction from the first end toward the second end. The probe adapter further includes a threaded fastener configured to contact the second end of the driver so as to retain the driver in the first position.

A touch screen testing platform may be used to engage a dynamically positioned target feature being displayed on a touch screen enabled device during a testing protocol. The platform may record imagery displayed by the touch screen device and then analyze the imagery to locate the target feature within a reference coordinate system. The platform may recognize that the target feature is missing from the imagery and respond by causing the touch screen device to scroll through a command menu and/or toggle through virtual screens. Once located, the platform may instruct a robotic device tester to select the target feature by contacting the touch screen at the identified location using a conductive tip designed to simulate a user's fingertip. Prior to running a test, the camera may be focused to a point that is offset from the display screen of the touch screen device.

A probe head may be utilized to test an electronic device. The probe head may include a probe axis extending along a length of the probe head. The probe head may include a probe core including a first metal. The probe core may include a core surface having a first dimension. The first dimension may be perpendicular to the probe axis. The probe core may include a probe tip, for instance extending from the core surface along the probe axis. The probe tip has a second dimension that may be perpendicular to the probe axis. The second dimension may be less than the first dimension of the core surface. The probe head may include a cladding layer that includes a second metal. The cladding layer may be coupled around a perimeter of the probe core. The probe tip may extend beyond the cladding layer.

A hermetically sealed adjustable link for low loss coaxial airline connection between the seamless connection of coaxial RF connector of external instruments with 30- or 45-degrees wafer probes allows continuous, micro-positioner controlled, 3-axis horizontal and vertical probe movement. A flexible sealing ring ensures airtight and/or RF-EMI shielded operation. A metallic or plastic collar ensures wafer testing under EMI shielded and high temperature conditions.