A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element, e.g., a round rod resistor, coupled with the plunger component at one end and with the tip component at the opposite end.

A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to the input signal to generate an output signal, and/or a control unit output port to provide the clamped/limited output signal to an oscilloscope.

Embodiments of a drain monitor of this disclosure monitors an active, horizontal- or vertical-oriented hose, pipe, or drain and allows a draining liquid to pass through or by the monitor without “alarming” if there is no blockage or stoppage of the drain and alarming if there is a blockage or stoppage of the drain. The monitor may include a housing having an open bottom end, a hollow interior, and a plurality of inclined thru ports providing fluid passage to the interior but preventing a draining liquid flowing past the probe from entering the hollow interior. In some embodiments, the monitor may work in reverse, meaning if the pipe or hose is supposed to have a certain level of liquid, the monitor alarms if the liquid falls below that level. A second monitor may be installed in series with the first, alarming if the liquid rises above a predetermined level.

A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

Embodiments of the present invention provide an RF probe for coupling out a probe signal from a transmission line of a circuit. The RF probe includes at least two probe pins having first ends for contacting the circuit and second ends. Furthermore, the RF probe includes a provider for providing a variable impedance at the second ends of the probe pins. The RF probe is configured to provide the probe signal based on a signal propagating along at least one of the probe pins.

To provide a measurement device which allows long-term accurate measurement of voltage without adversely affecting a device under test, by ensuring a predetermined level of resistance to ESD and reducing leakage current. A measurement device includes a probe needle for contacting a device under test, a first FET for detecting voltage of the device under test, and a protection circuit for protecting the first FET from static electricity. The protection circuit includes a second FET having an oxide semiconductor film as a channel formation region.

In a measurement system, a signal probing circuit may provide probed signals by probing voltages and currents and/or incident and reflected waves at a port of a device under test (DUT). A multi-channel receiver structure may include receivers that receive two probed signals from the signal probing hardware circuit, each receiver having its own sample clock derived from a master clock and further having a respective digitizer for digitizing a corresponding one of the two probed signals. A synchronization block, external to the receivers and including a reference clock derived from the master clock, may enable the two probed signals to be phase coherently digitized across the receivers by synchronizing the respective sample clocks of the receivers while the reference clock is being shared with the receivers. A signal processing circuit may then process the phase coherently digitized probed signals.

An electronic device test system includes a contactor having probe pairs with first and second conductive probes to couple to a respective conductive feature of a packaged electronic device or wafer die region. The system also includes a test circuit having a voltage source to provide a common mode voltage signal; a first buffer with a first input coupled to an output of the voltage source, an output coupled to a first conductive probe of a first probe pair, and a second input coupled to a second conductive probe of the first probe pair; and a second buffer with a first input coupled to the output of the voltage source, an output coupled to a first conductive probe of a second probe pair, and a second input coupled to a second conductive probe of the second probe pair.

The present disclosure provides a circuitry distortion corrector for correcting distortions of electrical signals. The circuitry distortion corrector comprises a first correction filter that filters the received signals, and a second correction filter that is coupled to the first correction filter and filters the signals that are filtered by the first correction filter. The first correction filter operates based on first filter coefficients that are based on first value tuples, each first value tuple comprising a first frequency and a respective first circuitry characterizing value, and wherein the first frequencies are equally spaced apart, and the second correction filter operates with second filter coefficients that are based on second value tuples, each second value tuple comprising a second frequency and a respective second circuitry characterizing value, wherein the second frequencies are logarithmically spaced apart.