Integrating a bracket with planarity adjustment holding a wafer probe securely, with a low-profile impedance tuner that is mounted on a 3-axis tuner positioner under an angle matching the angle of the wafer probe. The low-profile tuner has its tuning probe operating as close as physically possible within the distance of an RF adapter from the wafer-probe and is connected directly with the wafer-probe. This integration offers the maximum possible tuning range, while simultaneously offering planarity (THETA) control. It also eliminates the need for an extension RF cable between the instrument (tuner) and the wafer-probe, including a set of two coaxial adapters.

A clamp-type AC voltage probe includes: a clamp portion that clamps a cable to be measured; an electrode disposed to be opposed to the cable clamped by the clamp portion; a parallel circuit in which a capacitor and a resistance are connected in parallel, and one end of which is connected to the electrode; a resistance one end of which is connected to the other end of the parallel circuit and the other end of which is connected to a circuit ground; a capacitor one end of which is connected to the other end of the parallel circuit and the other end of which is connected to the circuit ground; and an amplifier an input terminal of which is connected to the one end or the other end of the parallel circuit, and that amplifies and outputs a signal input into the input terminal.

Example embodiments of the described technology provide an apparatus for testing an electrochemical system. The apparatus may comprise a testing module electrically coupled to the electrochemical system. The testing module may comprise a discharge circuit configured to draw current from the electrochemical system at a plurality of different rates. The discharge circuit may be configured to continuously draw current from the electrochemical system once a test of the electrochemical system is commenced. The apparatus may also comprise a measurement module which may be configured to measure voltage across terminals of the electrochemical system and current drawn from the electrochemical system during the test. The apparatus may also comprise a processor. The processor may be configured to compensate at least in part the measured voltage for voltage drift which was generated by continuously drawing current from the electrochemical system. The processor may also be configured to compute a state of health of the electrochemical system based at least in part on the compensated voltage and the measured current.

A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that causes a voltage signal from the first testing point or a voltage signal from the second testing point to be routed to the measurement instrument as a selected voltage test signal, and a second selectable signal path that causes a current signal from an output of the current detector to be routed to the measurement instrument as a selected current test signal. Methods of testing a DUT using the measurement probe are also described, as well as a system for measuring signals from a DUT using the measurement probe.

The present disclosure relates to a battery probe set configured to plug into a battery tester and impinge upon one or more terminals of a battery. The battery probe set includes first and second probe assemblies, each including a housing with gripping portions and conductive ports, probe stems of varying lengths that attach to the housing, and probe tips that couple to the probe stems. The housing, probe stem, and probe tips are electrically coupled via conductive paths. The first and second probe assemblies are electrically coupled via a transverse connector, permitting the location of probe plugs onto one of the probe assemblies that is configured to be pluggable into the battery tester. The probe tips are interchangeable and include a light source.

A direct current (DC) power rail probe includes a single-ended probe tip, and a two-path circuit having an input coupled to the single-ended probe tip and an output configured for connection to measurement equipment such as an oscilloscope. The two-path circuit includes an alternating current (AC) path in parallel with a feed-forward (FF) path, the AC path including a capacitive element, and the FF path including a series connection of at least one resistive element and an amplifier. The probe tip and two-path circuit are selectively operable in a non-attenuating mode and an attenuating mode.

A computer-aided tester for checking a continuity of a circuit includes a computer and two or more handheld inspection parts. Each of the two handheld inspection parts is provided with a probe and an illuminating lamp, and the probe and the illuminating lamp are directly connected to the computer through a circuit. The computer-aided tester for checking the continuity of the circuit improves the efficiency and reliability of wiring quality inspection by using a computer-aided technology and method.

An electrical safety monitor is provided. The electrical safety monitor may include a housing having a face. The electrical safety monitor further includes a plurality of line inputs for hardwiring a plurality of electrical connections. The electrical safety monitor further includes a plurality of test points with each of the test points corresponding to one of the line inputs, each of the plurality of test points accessible at the face of the housing. The electrical safety monitor further includes a line monitoring circuit having a plurality of light indicators and configured to produce light if voltage exists between any two of the line inputs to thereby indicate presence of voltage to a user. The electrical safety monitor further includes illumination areas associated with each of the test points, wherein each of the illumination areas is provided light by one or more of the plurality of light indicators.

A detection data storage device includes a detection probe, an inspection instrument, a processor and a storage controller. The processor includes a software component. The storage controller includes a key and a prompt lamp. When a circuit is detected by the detection probe, a detection signal is generated. After the detection signal is received by the inspection instrument, a detection data is generated and transmitted to the software component of the processor. If the software component judges that the detection data matches a standard value, the software components issues a prompt signal to the prompt lamp of the storage controller. In response to the prompt signal, the prompt lamp emits a light beam. After the light beam from the prompt lamp is received by the user and the key is pressed, the detection data is stored in a storage unit.

The present disclosure relates to a hand-held voltmeter measuring a peak voltage of a high voltage pulse applied to an electric fence. The voltmeter includes a body case of which one side has an opening, a sensor case protruded from the opening of the body case, a voltage divider disposed over the inside and the outside of the sensor case for dividing the high voltage pulse into a low divided voltage, a peak detector for detecting the peak voltage of the divided voltage, a display unit for displaying the peak voltage, and an MCU for controlling the input and the output of the elements constituting the voltmeter. According to the present disclosure, an electric fence voltmeter that measures the peak voltage accurately without need to make a ground connection to the earth, and has a low risk of an electric shock during a measurement is provided.