A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

A monitor can be installed in the terminal block having a monitor access opening. The installed monitor allows for current measurement without having to disconnect a wire from the terminal block. Similar monitors can measure voltage, detect ground loops, and provide continuous readings of circuit parameters. Embodiments can positively hold probe tips, transmit data over wires, or transmit data wirelessly. Make-before-break monitors allow parameters to be measured without ever breaking the monitored circuit. Break-before-make monitors allow the monitored circuit to be interrupted and then reconnected with a monitor in place.

A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

A clamp for establishing an electrical connection with a conductor is provided. The clamp comprises a first body and a second body. The second body is pivotally coupled to the first body. The first and second bodies define a receiving region therebetween for receiving a conductor. The first and second bodies are biased towards each other at the receiving region to clamp a conductor. The clamp also comprises a shutter, movably coupled to one of the first body and the second body. The shutter is biased into a restricting position in which entry into the receiving region is restricted.

A probe pin (100, 100′) for electronic testing of semi-conductor elements is provided. The pin contains an electrically conductive core element (200) made up of a metallic alloy, and an electrically insulating jacket element (300) which surrounds the core element (200) over regions thereof. The core element (200) contains a distal contact section (210) for electrical contacting to a semi-conductor element. The metallic alloy of the core element contains at least 67% by weight rhodium, 0.1% by weight to 1% by weight zirconium, up to 1% by weight yttrium, and up to 1% by weight cerium. A method for producing a probe pin is also described.

A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.

An installation test system has a control device and one or more hand-held test devices. The control device and the one or more hand-held devices are in wireless communication via respective communication systems. The control device performs typical pre-power tests including insulation testing and ground testing. There is at least one hand-held device dedicated to testing for residual current in circuit breakers and another hand-held device dedicated to testing for loop impedance. The control device records all test data and stores data in storage.

A probe device has a main body and a probe body with different joints, where each joint rotates along different rotatable directions relative to one another. A user of the probe device may rotate the probe body relative to the main body along two separate rotatable axes to reach behind areas that are difficult to reach into using a probe device without rotatable components.

A measurement system including a measurement device and at least a first probe unit and a second probe unit is disclosed. The first probe unit and the second probe unit are each connected to the measurement device in a signal transmitting manner The measurement device includes a control circuit. The first probe unit includes an interface module being configured to receive a user input, to generate an input data signal based on the received user input, and to provide the input data signal to the control circuit. The control circuit is configured to generate and provide a control signal at least to the second probe unit based on the input data signal. At least the second probe unit is configured to adjust an operational parameter based on the control signal, wherein the operational parameter relates to a measurement parameter to be measured Moreover, a method for operating a measurement system is disclosed.

The present disclosure relates to a battery probe set configured to plug into a battery tester and impinge upon one or more terminals of a battery. The battery probe set includes first and second probe assemblies, each including a housing with gripping portions and conductive ports, probe stems of varying lengths that attach to the housing, and probe tips that couple to the probe stems. The housing, probe stem, and probe tips are electrically coupled via conductive paths. The first and second probe assemblies are electrically coupled via a transverse connector, permitting the location of probe plugs onto one of the probe assemblies that is configured to be pluggable into the battery tester. The probe tips are interchangeable and include a light source.