A display data generation device (10) includes: an acquisition unit (11) to acquire an input signal; a waveform generation module (161) (i) to extract, from waveform patterns predetermined as normal waveform patterns, a waveform pattern having the highest degree of similarity to the input signal for each interval of the input signal by using as the degree of similarity a degree to which waveforms are similar to each other and (ii) to generate a comparison waveform based on the waveform pattern extracted for each interval; and a data generation module (162) to generate and outputting display data for displaying a waveform of the input signal and the comparison waveform.

An equivalent-time sampling test and measurement instrument for acquiring a repeating pattern signal under test at or near a maximum sampling speed of the test and measurement instrument. The test and measurement instrument includes a first input configured to receive repeating pattern information about a signal under test, a second input configured to receive the signal under test, one or more processors configured to determine an optimized trigger holdoff period that is set based on a minimum trigger holdoff period of a test and measurement instrument, and an acquisition unit configured to acquire a portion of the signal under test every optimized trigger holdoff period.

A waveform segmentation device has a state level estimation unit that estimates a state level of input waveform data, and a segmentation identification unit that segments the waveform data at a plurality of segmentation points based on the state level estimated by the state level estimation unit. The segmentation identification unit may identify the plurality of segmentation points such that a feature value of the waveform data is included between two adjacent segmentation points among the segmentation points.

A test and measurement instrument for generating an analog waveform, including an interpolator configured to receive a digital signal and output interpolated samples of the digital signal at a sample rate, a filter modulation controller configured to output first filter coefficients at a first time and second filter coefficients at a second time, a convolver configured to generate a convolved signal by convolving the interpolated samples of the digital signal and the first filter coefficients and convolving the interpolated samples of the digital signal and the second filter coefficients; and a digital-to-analog converter configured to convert the convolved signal to an analog signal based on a fixed, constant clock signal.

A method and apparatus for providing variable analog to digital converter (ADC) resolution is described.

A test and measurement instrument including a digital down converter configured to receive a bus signal and output in-phase and quadrature-phase baseband component waveform data, a trace generator configured to receive the in-phase and quadrature-phase baseband component waveform data and generate at least one radio frequency versus time trace, a decoder configured to receive the at least one radio frequency versus time trace and decode the bus signal based on the at least one radio frequency versus time trace and a wireless modulation scheme, and a trigger configured to capture at least a portion of the bus signal based on the decoded bus signal.

A test and measurement instrument can include an input to receive an analog signal, a sampler to produce digital sample data corresponding to the analog signal, a buffer to store a portion of the sample data, a memory to store sample data from the buffer, a plurality of comparators to establish a vertical range, and a controller configured to configure the plurality of comparators to establish a first vertical range based on sample data in the buffer, and determine whether any of the sample data in the buffer transitions outside the first vertical range during a period of time.

A method and apparatus for providing variable analog to digital converter (ADC) resolution is described.

A measuring device includes a signal-processing unit for the registration of a first signal in the time domain and a histogram-generating unit for the indirect generation of a histogram in the frequency domain from the first signal. The histogram-generating unit provides a frequency grid-point variation unit.

Measurement apparatus and method for digital data acquisition. A first operation mode is provided for real-time processing of digital data having a reduced sample rate or resolution. Furthermore, a second operation mode is provided for processing the measurement signal off-line with a higher accuracy. In particular, the high accuracy data may be temporarily stored and analyzed upon the operation mode is changed from the real-time mode to the off-line mode.