According to various embodiments of the disclosure, disclosed is an antenna chamber which includes a mounting part to receive an external electronic device including an antenna module including a plurality of radiators to radiate a millimeter wave signal, a lens spaced apart from the mounting part to refract the millimeter wave signal radiated from the antenna module, an antenna spaced apart from the lens in a direction opposite to a direction of the mounting part to receive the millimeter wave signal refracted from the lens, and a lens driving unit to move the lens based at least on a first direction, which is set, such that the millimeter wave signal set to be radiated in the first direction from an external electronic device is refracted toward the antenna. Moreover, various embodiments found through the disclosure are possible

An apparatus for measuring over-the-air (OTA) wireless communication performance in an automotive application of a device under test arranged on or in a vehicle. The apparatus includes a chamber and a platform for supporting the vehicle within the chamber. The platform is a rotatable platform that can rotate the vehicle, and the floor is inwardly reflective, and optionally covered with a top layer to resemble asphalt or other road covers. In one embodiment, the chamber is a reverberation chamber, simulating a multi-path environment, and preferably a rich isotropic multipath (RIMP) environment. In another embodiment, the chamber has inwardly absorbing walls, simulating a random-LOS environment.

In a general aspect, vapor cells are disclosed that include a dielectric body having a first surface and a second surface. The dielectric body includes a plurality of cavities extending from the first surface to the second surface and ordered periodically to define a photonic crystal structure in the dielectric body. Each cavity has a first opening defined by the first surface and a second opening defined by the second surface. The photonic crystal structure has a photonic band gap. The vapor cells additionally include a first optical window covering the first openings and having a surface bonded to the first surface of the dielectric body to form a seal around each of the first openings. A second optical window covers the second openings and has a surface bonded to the second surface of the dielectric body to form a seal around each of the second openings.

A multi-panel base station test system includes a base station radio unit configured with a plurality of antenna panels positioned at a first end of a test chamber of the multi-panel base station test system. The multi-panel base station test system includes a plurality of test antennas positioned at a second end of the test chamber opposing the first end. The multi-panel base station test system includes a microwave lens positioned between the plurality of antenna panels and the plurality of test antennas in the test chamber. The microwave lens is configured to focus respective beams transmitted from each of the plurality of antenna panels toward respective focal points associated with each of the plurality of test antennas based on steering of the plurality of antenna panels.

A test device 1 that measures the transmission properties or reception properties of the test object 100 having the test antenna 110, and includes an anechoic box 50, a plurality of test antennas 6 that transmit or receive radio signals to or from the antenna under tests, a posture changeable mechanism 56 that changes the posture of the test object arranged in the quiet zone QZ, a measurement device 2 that measures the transmission properties or reception properties of the test object with respect to the test object whose posture is changed by the posture changeable mechanism using the test antenna, and the reflector 7 that radio signal is reflected, The plurality of test antennas include a reflection type test antenna 6a and the plurality of direct-type test antennas 6b, 6c, 6d.

A measurement module receives a defined system topology and system component characteristics information for a system. The measurement module calculates an expected system impedance for the defined system topology. The measurement module collects one or more impedance measurements using a high frequency voltage stimulus. Finally, the measurement module compares the one or more impedance measurements with the expected system impedance to determine adequacy of protective grounding of the system.

A multi-probe anechoic chamber (MPAC) for beam performance testing of a phased array system, including an active electronically steered array (AESA) system. The MPAC may comprise: an AESA antenna having a plurality of subarrays capable of emitting RF energy; an anechoic chamber having a wall, comprising a plurality of horn antennas for receiving the RF energy; a switch electrically coupled to the horn antennas for selectively coupling of the horn antennas to one or more output channels; various instruments electrically coupled to the output channels for measuring the RF energy; and a processor electrically coupled to the switch and the instruments for controlling the selective coupling of the switch, such that the processor and instruments cooperatively monitor and measure various beam parameters associated with the RF energy. The various beam parameters may include: signal-to-noise ratio, signal strength, beam phase, phase stability, frequency stability, beam shape, beam pointing accuracy, and beam switching rates.

The present disclosure relates to a measurement system for testing a device under test over-the-air, the measurement system comprising a signal generation and/or analysis equipment, several antennas, several reflectors and a test location for the device under test. The antennas are connected with the signal generation and/or analysis equipment in a signal-transmitting manner. Each of the antennas is configured to transmit and/or receive an electromagnetic signal so that a beam path is provided between the respective antenna and the test location. The electromagnetic signal is reflected by the respective reflector so that the electromagnetic signal corresponds to a planar wave. Each antenna aims at a focal point of the corresponding reflector. Each antenna and the corresponding reflector together are configured to provide a corresponding quiet zone at the test location. At least two of the several antennas are located within a main plane, whereas at least one of the several antennas is located in an auxiliary plane that is offset with respect to the main plane.

Disclosed is a radio wave device test system, comprising a fixed part configured to fix a radio wave device; a positioner system configured to control a rotation of the radio wave device by controlling the fixed part; an arch structure whose central point is located at a position where the radio wave device is located; a plurality of probes disposed to be spaced apart from one another at fixed intervals in the arch structure, and configured to receive a radio frequency (RF) signal from the raid wave device; and a plurality of receiving modules located at the plurality of probes, respectively, and configured to transform the RF signal into in-phase/quadrature (I/Q) data by carrying out digital transformation for the RF signal and to detect information on amplitude and a phase from the I/Q data.

A method and apparatus for production testing of a device under test (DUT) in a chamber is disclosed, the chamber defining an internal cavity therein, adapted to enclose the DUT, and including walls having inwardly facing surfaces of an electromagnetically reflective material, thereby supporting several resonant modes within the internal cavity. The method comprises: arranging the DUT at one or several measurement position(s) in the internal cavity; measuring radio frequency transmission between the DUT and at least one chamber antenna arranged in the internal cavity sequentially in a number of different static mode distribution configurations; comparing the measured radio frequency transmission at said predetermined mode distribution configurations with reference values obtained from measurement of a reference device arranged at the same measurement position(s) within the internal cavity, and at the same static mode distribution configurations; and determining whether the DUT is acceptable or non-acceptable based on said comparing.