A test circuit for conducting a test on a switching device having a ground electrode, a control electrode, and a power-supply electrode. The test circuit includes: a first terminal configured to be connected to the ground electrode of the switching device; a second terminal configured to be connected to the control electrode of the switching device; a third terminal configured to be connected to the power-supply electrode of the switching device; a fourth terminal configured to receive a power supply voltage; and a first switch connected between the third terminal and the fourth terminal, and being configured to turn off in response to a predetermined time period having elapsed since turning off of the switching device. The predetermined time period is shorter than a time period from when the switching device is turned off to when a drive current flowing through the switching device reaches zero without being interrupted.