G01R31/2617

DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
20220043048 · 2022-02-10 ·

A testing circuit includes a first circuit and a second circuit. The first circuit has a first capacitor and a second capacitor. The first circuit is configured to transfer at least a portion of a first voltage across the first capacitor to the second capacitor. The second circuit has the first capacitor and the second capacitor. The second circuit is configured to transfer at least a portion of a second voltage across the second capacitor to the first capacitor.

Adaptive blanking of over current fault detection circuits in power conversion gate drivers

An electronic circuit comprises a power switch circuit and a fault detection circuit. The power switch circuit includes a transistor. The fault detection circuit includes a first comparator circuit configured to compare a monitored voltage of the transistor to a detection threshold voltage and produce an indication of a circuit fault according to the comparing, and a delay circuit configured to delay the comparing by the first comparator circuit according to slew rate of the monitored voltage.

Method for determining the output voltage of a transistor

A method for determining an output voltage of a transistor, the transistor comprising an input electrode, a first output electrode and a second output electrode, the potential of the first output electrode being higher than the potential of the second output electrode the output voltage being the difference in potential between the first output electrode and the second output electrode. The method includes a step for measuring the evolution over time of a control voltage of the transistor, the control voltage being the difference in potential between the input electrode and the second output electrode, and determining the output voltage from the measured control voltage.

Automated test equipment for testing high-power electronic components
11067629 · 2021-07-20 · ·

Aspects of the present application are directed to an automated test equipment (ATE) and methods for operating the same for testing high-power electronic components. The inventor has recognized and appreciated an ATE that provides both high-power alternating-current (AC) and direct-current (DC) testing in a single test system can lead to high throughput testing for high-power components with reduced system hardware complexity and cost. Aspects of the present application provide a synchronized inductor switch module and both a high-precision digitizer and a high-speed digitizer for capturing DC and AC characteristics of a high-power transistor.

ADAPTIVE BLANKING OF OVER CURRENT FAULT DETECTION CIRCUITS IN POWER CONVERSION GATE DRIVERS

An electronic circuit comprises a power switch circuit and a fault detection circuit. The power switch circuit includes a transistor. The fault detection circuit includes a first comparator circuit configured to compare a monitored voltage of the transistor to a detection threshold voltage and produce an indication of a circuit fault according to the comparing, and a delay circuit configured to delay the comparing by the first comparator circuit according to slew rate of the monitored voltage.

Connection circuit and connection method thereof
11031934 · 2021-06-08 · ·

The present disclosure relates to a connection circuit including a first circuit and a second circuit. The first circuit includes a first impedance unit. The first impedance unit is electrically connected to a first detecting terminal of an electronic device for receiving a first voltage. The second circuit includes a second impedance unit. The second impedance unit is electrically connected to a second detecting terminal of the electronic device. The second impedance unit includes a transistor switch. A control terminal of the transistor switch is electrically connected to the first circuit such that the transistor switch is turned on according to the first voltage, and the second circuit receives a second voltage transmitted from the second detecting terminal.

SYSTEMS AND METHODS FOR CONTROLLING WIND CONVERTERS

A method of operating a wind converter is provided. The method includes receiving a plurality of forecasted datasets. The forecasted datasets include event signals for the wind converter during fast transient operating conditions (OCs) and operational data for the wind converter having a low sampling rate. The method further includes estimating a converter life consumption during normal OCs and a converter life consumption during the fast transient OCs. Further, the method includes computing a total converter life consumption of the wind converter. Moreover, the method includes predicting, using a remaining useful life (RUL) prediction module, an RUL for the wind converter based on the total converter life consumption. The method further includes adjusting operation of the wind converter by adjusting operating variables of the wind converter.

Method and a device for determining a switching current of a converter of a system for inductive power transfer and a method of control

A method for determining a switching current of at least one switching element of a converter of a system for inductive power transfer, including determining a phase current of at least one AC phase line of the converter; determining at least one switching time point of the at least one switching element and the phase current value at said switching time point; and determining switching current of the at least one switching element depending on the at least one phase current value.

System and method of monitoring a switching transistor

In accordance with an embodiment, a method includes using a monitoring circuit disposed on a monolithic integrated circuit to monitor an output signal of a first switching transistor for a first output edge transition at a monitoring terminal of the monolithic integrated circuit; using a time measuring circuit disposed on the monolithic integrated circuit to measure a first time delay between a first input edge transition of a first drive signal and the first output edge transition, where the first drive signal is configured to cause a change of state of the first switching transistor; using an analysis circuit disposed on the monolithic integrated circuit to compare the measured first time delay with a first predetermined threshold to form a first comparison result; and indicating a first error condition based on the first comparison result.

AUTOMATED TEST EQUIPMENT FOR TESTING HIGH-POWER ELECTRONIC COMPONENTS
20200379043 · 2020-12-03 · ·

Aspects of the present application are directed to an automated test equipment (ATE) and methods for operating the same for testing high-power electronic components. The inventor has recognized and appreciated an ATE that provides both high-power alternating-current (AC) and direct-current (DC) testing in a single test system can lead to high throughput testing for high-power components with reduced system hardware complexity and cost. Aspects of the present application provide a synchronized inductor switch module and both a high-precision digitizer and a high-speed digitizer for capturing DC and AC characteristics of a high-power transistor.