The invention relates to a semiconductor switch and to a method for determining a current in the power path of a semiconductor switch. For this purpose, a semiconductor switch, according to the invention, has a plurality of sense connections, wherein each of said sense connections provides an individual output signal that is proportional to the current in the power path of the semiconductor switch. The evaluation of the current in the power path can be optimized by the appropriate selection of one of the plurality of sense connections in accordance with the current in the power path of the semiconductor switch.

A method for inspecting electronic components and an electronic device are provided. The electronic device includes electronic elements, signal lines, an inspection structure, a substrate and a first driving element electrically connected to the signal lines. The signal lines include a first and a second signal lines. The electronic components include a first group of electronic components electrically connected to the first signal line and a second group of electronic components electrically connected to the second signal line. The first signal line has a first portion overlapping a first inspection region and a second portion overlapping the first driving element. The second signal line has a third portion overlapping a second inspection region and a fourth portion overlapping the first driving element. A distance between the second portion and the fourth portion is smaller than a distance between the first portion and the third portion.