This disclosure is related to arranging micro devices in the donor substrate by either patterning or population so that there is no interfering with non-receiving pads and the non-interfering area in the donor substrate is maximized. This enables the transfer of micro devices to a receiver substrate with fewer steps.

The disclosure provides an electronic device and a diagnosis method of a light-emitting device. The light-emitting device includes at least one region, and each region of the at least one region has a plurality of light-emitting units. The diagnosis method includes the following steps. A plurality of light-emitting units of one of the at least one region are illuminated by a current. A voltage value corresponding to the current is compared with a first standard voltage value corresponding to a first standard current corresponding to the one of the at least one region. Whether the one of the at least one region is abnormal is determined according to a result of comparing the voltage value with the first standard voltage value. Therefore, the diagnosis method of the disclosure may effectively diagnose whether the at least one region of the light-emitting device is abnormal.

The present disclosure provides an apparatus for illumination inspection of micro LEDs. An apparatus for illumination inspection of micro LEDs includes a surface-contact probe making a surface contact, through an electrical resistive material, with a front surface of an LED assembly of multiple micro LEDs arranged forwardly and interconnecting LED electrodes at both ends of the micro LEDs, probe electrodes to be in line contact with one side and the other side of the surface-contact probe for supplying electric power, an imaging unit for photographing the LED assembly from an opposite surface of the surface-contact probe, to where the surface-contact probe is contacted, and a control unit for supplying electric power to the probe electrodes forwardly along the micro LEDs as aligned and for inspecting the micro LEDs illumination based on images of the LED assembly photographed by the imaging unit before and after supplying the electric power.

The present disclosure describes a probe design to measure cycles of microdevices. In particular, the probe comprises, electrodes, dielectric, stimulating capacitor, voltage stimulating source for time varying stimulating voltage signal and a series switch to control biasing condition. The probe structure further has a probe tip and resting pads (ring shape or otherwise) along with a leveling mechanism and apparatus. The disclosure also describes a method to measure cycles of microdevices using the probe structure.

Embodiments are presented herein of an open-loop test system for testing vertical-cavity surface-emitting lasers (VCSELs). A high-speed pulse generator may be used to produce nanoseconds pulses provided to the VCSEL device. A high-speed oscilloscope may be used to measure the resultant nanoseconds pulses across the VCSEL device. The VCSEL device voltage and VCSEL device current may be obtained from the measured nanosecond pulses according to compensation data derived from the system. A pre-test compensation procedure may be used to obtain the compensation data, which may include representative characteristics of each system component. The compensation procedure may also include capturing specified pulse trains under different load conditions of the pulse generator to obtain a scaling relationship between the VCSEL device current and an input voltage used for the pulse generation, and also for obtaining various parameters later used to derive an accurate VCSEL device voltage and an accurate VCSEL device current.

An automobile lighting unit is provided that includes a lighting device provided with one or more OLED light sources, and an electronic device configured in such a way as to control an OLED light source by means of a pilot signal which has a trailing edge wherein the pilot signal varies between a high value and a low value, to determine an electrical quantity indicative of the electrical behaviour of the OLED light source in a measurement time interval (toff) following the trailing edge of said pilot signal, and to determine a failure condition of the OLED light source on the basis of an electrical quantity.

A minimum voltage detector circuit is disclosed. The circuit includes a plurality of LED strings each having a plurality of series-coupled LEDs. The minimum voltage detector circuit is configured to detect a minimum voltage from among the plurality of LED strings, and also to perform open/short detection among the plurality of LED strings. The minimum voltage detector circuit includes a plurality of voltage comparators and correspondingly coupled replica circuits. Each of the voltage comparators includes an amplifier having a first input coupled to a cathode of a last LED of one of the plurality of LED strings, an output, and a second input coupled to the output. Each voltage comparator further includes a replica circuit coupled to the amplifier. The replica circuit is configured to maintain an output transistor of the amplifier in an active state when the amplifier is in an unbalanced state.

An organic light emitting diode analyzer is provided to test electrical and spectroscopic characteristics organic light emitting diodes (OLED). The analyzer includes a spectrometer, a luminance and color meter, a header of the luminance and color meter, an OLED a source meter, an OLED holder and a computer. The OLED analyzer is a characterization system to measure the electrical and spectral characteristics and feature of the OLED. The luminance and color meter includes a color sensor, and the luminance and color meter measures a luminance of the OLED, a color temperature of the OLED, and color coordinates of the OLED. The spectrometer measures a wavelength of the OLED, an irradiance, a color index, the color temperature, color coordinates and the irradiance (W/m.sup.2.Math.nm). The source meter applies positive voltages to the OLED, and the source meter measures a current through the OLED.

According to the present disclosure, an optoelectronic assembly is disclosed with at least one optoelectronic component, and a sensor circuit. The sensor circuit includes at least one energy supply circuit and an ascertainment circuit having at least one energy storage unit and a detection unit. The ascertainment circuit and the at least one optoelectronic component are electrically connected to one another in parallel. The at least one energy supply circuit is configured to supply electrical energy to the at least one optoelectronic component and the energy storage unit. The energy stored in the energy storage unit is supplied independently of the electrical energy supplied to the at least one optoelectronic component. The ascertainment circuit is configured such that the detection unit detects a change of the electrical energy stored in the energy storage unit depending on a change of the energy stored in the at least one optoelectronic component.

Example embodiments relate to systems for checking a luminaire status and methods thereof. One embodiment includes a method for checking a status of a luminaire using a mobile terminal in a vicinity of the luminaire. The mobile terminal includes a sensing means, a memory, and a communication means. The method includes obtaining, by the mobile terminal, an identifier of the luminaire. The method also includes determining, based on the obtained identifier of the luminaire, a measure of the status of the luminaire to be acquired. Additionally, the method includes acquiring, by the sensing means of the mobile terminal, the measure of the luminaire status. Further, the method includes storing, in the memory of the mobile terminal, data about the acquired measure of the luminaire status. The data is associated to the identifier of the luminaire.