The device for testing a motherboard includes a power adapter, a first DC-DC converter, and a microcontroller. The power adapter converts an AC input voltage to a DC supply voltage. The DC-DC converter converts the DC supply voltage to a DC voltage at a channel coupled to the motherboard, and adjusts a voltage level of the DC voltage in response to a control signal. The DC-DC converter is enabled according to an enable signal. The microcontroller is configured to provide the control signal and the enable signal, and to determine whether a power on/off operation of the motherboard is normal. The microcontroller is configured to perform a test procedure on the motherboard to obtain a workable voltage range of the motherboard. The voltage level of the DC voltage in the test procedure is dynamically adjusted within a predetermined range around a nominal voltage value of the DC voltage.

After measuring electrical characteristics, a component favorably drops from a measuring element. An inspection device includes a pair of measuring elements configured to measure electrical characteristics of a component by gripping the components due to being capable of approaching and separating from each other; and air supply device configured to supply air to at least one of a pair of opposing surfaces that oppose each of the pair of measuring elements, and by supplying air to at least one of the opposing surfaces from air supply device, a component s adhered to the at least one opposing surface can be caused to drop favorably.

A power control integrated circuit (IC) chip can include a direct current (DC)-DC converter that outputs a switching voltage in response to a switching output enable signal. The power control IC chip can also include an inductor detect circuit that detects whether an inductor is conductively coupled to the DC-DC converter and a powered circuit component in response to an inductor detect signal. The power control IC chip can further include control logic that (i) controls the inductor detect signal based on an enable DC-DC signal and (ii) controls the switching output enable signal provided to the DC-DC converter and a linear output disable signal provided to a linear regulator based on a signal from the inductor detect circuit indicating whether the inductor is conductively coupled to the DC-DC converter and the powered circuit component.

A method for recognizing a usability of a control device of a safety device in a vehicle includes: applying a voltage to the control device; acquiring a voltage curve or a current curve at the control device; and recognizing a usability of the control device as a function of the acquired voltage curve or of the acquired current curve. In particular, the correct polarity of an inductive actuator having a freewheeling diode is recognized, because in the case of incorrect polarity the inductive actuator is bridged by the freewheeling diode.

Aspects of the present disclosure are directed toward detection of leakage from an enclosed component using an apparatus. The apparatus includes a printed circuit board (PCB) including a first conductive trace, a second conductive trace, and sets of terminals electrically connected to the first and second conductive traces configured and arranged to indicate changes in impedance caused by leaked liquid. The respective portions of the first and second conductive traces are interleaved, and configured and arranged to suspend flow of the leaked liquid from an enclosed component, thereby causing a change in impedance between at least one of the sets of terminals.

The present disclosure describes printed circuit board performance evaluation techniques. In some cases, a printed circuit board performance evaluation process may include determining a first set of electrical properties associated with an interface between components of a printed circuit board, where the interface is disposed on an internal or external layer of the printed circuit board. After selective application of a sheet of dielectric material to a portion of a transmission line in the interface, a second set of electrical properties associated with the interface may be determined. The first set of electrical properties may be compared to the second set of electrical properties to evaluate printed circuit board performance. In other cases, the interface may include a trace inductor, and electrical properties of the interface before and after application of a ferrous material may be compared to evaluate printed circuit board performance.

A measurement system for testing a device under test is described, with at least two antennas, at least two reflectors, a signal generation and/or analysis equipment and a test location. Each of the antennas is assigned to a corresponding reflector. Each of the antennas is configured to transmit/receive an electromagnetic signal so that a beam path is provided between the respective antenna and the test location. The electromagnetic signal is reflected by the respective reflector so that the electromagnetic signal corresponds to a planar wave. The beam paths have different angular orientations that are adjustable. At least one antenna and the corresponding reflector are coupled with each other so that an integrated beam path adjustment unit is established including at least one antenna and the corresponding reflector. Further, a testing method is described.

A test instrument performs a power supply stress test by invoking current surges in a device under test. The current surges are invoked by stimulating functional blocks in the device under test with test signals received via a network interface of the device under test.

A method, system and computer readable medium for determination of distance to an electrical fault within a device. A signal generator excites the device with an electrical input signal. The device comprises an open circuited electrical transmission line. A frequency domain analyzer analyzes part of the signal reflected from the device for determination of the locations of resonant frequency of the signal within the device. A computer calculates the distance to the fault within the device, based on the resonant frequency. The distance to the fault is one quarter wavelength distance into the device at the resonant frequency. A frequency sweeper sweeps the frequency of the input signal and repeated calculation of the distance to the fault made at a plurality of resonant frequencies during the frequency sweep confirms the distance to the fault by convergence of the result of the repeated calculations to substantially the same location.

Methods and apparatus to store fault data and/or status data associated with an integrated circuit (100) into a memristor system (106) are disclosed. An example method includes determining when a fault corresponding to an integrated circuit (100) has occurred, when first data related to the integrated circuit (100) is updated. An example method further includes storing the first data in a first subset of a plurality of resistive elements. An example method further includes, in response to the detection of the fault, storing second data in a second subset of the plurality of resistive elements, the second data corresponding to an error associated with the fault.