A digital sampling oscilloscope (DSO) includes a housing, an analog measurement input interface arranged in a housing wall of the housing and a measurement acquisition system having a digitizer and an acquisition memory coupled to the digitizer. The measurement acquisition system is integrated into the housing and coupled to the analog measurement input interface. The DSO further includes a signal generator integrated into the housing. An operation mode control signal output interface is arranged in a housing wall of the housing. The signal generator is coupled to the operation mode control signal output interface and is configured to output an operation mode control signal to a device under test (DUT) connected to both the operation mode control signal output interface and the analog measurement input interface for controlling a test operation mode of the DUT.

A vector network analyzer for obtaining at least one wave frequency ratio with respect to a frequency-converting device under test is provided. The vector network analyzer comprises a transmitter side configured to be controlled by at least one transmitter side clock signal, a receiver side configured to be controlled by at least one receiver side clock signal, and a central clock configured to generate a central clock signal. The at least one transmitter side clock signal and the at least one receiver side clock signal are based on the central clock signal, the at least one transmitter side clock signal and the at least one receiver side clock signal are generated with a fixed phase relation to each other with the aid of a start pulse.

A measurement method and a measurement device for performing a measurement with respect to a frequency-converting device under test and compensating for a shifting frequency are provided. The measurement method comprises the steps of applying an input signal to an input of the device under test, receiving an output signal from an output of the device under test, converting the output signal into a digitized signal comprising digital samples, estimating a received frequency with respect to the output signal on the basis of the digital samples, and comparing the received frequency to an expected frequency.

A built-in self-test (BIST) methodology and apparatus provide for testing and calibration of an integrated circuit oscillator circuit topology that uses a one-pin (a single-pin) external resonator. The method employs dedicated test circuitry, also referred to herein as BIST apparatus, for the pass/fail verification of both the active and passive building blocks of the oscillator. At the same time, the methodology ensures accurate calibration and matching of the capacitors using dedicated digital circuitry and algorithms.

An electronic apparatus for testing an integrated circuit (IC) that includes a ring oscillator is provided. The apparatus configures the ring oscillator to produce oscillation at a first frequency and configures the ring oscillator to produce oscillation at a second frequency. The apparatus then compares the second frequency with an integer multiple of the first frequency to determine a resistive voltage drop between a voltage applied to the IC and a local voltage at the ring oscillator. The ring oscillator has a chain of inverting elements forming a long ring and a short ring. The ring oscillator also has an oscillation selection circuit that is configured to disable the short ring so that the ring oscillator produces a fundamental oscillation based on signal propagation through the long ring and enable the short ring so that the ring oscillator produces a harmonic oscillation based on a signal propagation through the short ring and the long ring.

A built-in self-test (BIST) methodology and apparatus provide for testing and calibration of an integrated circuit oscillator circuit topology that uses a one-pin (a single-pin) external resonator. The method employs dedicated test circuitry, also referred to herein as BIST apparatus, for the pass/fail verification of both the active and passive building blocks of the oscillator. At the same time, the methodology ensures accurate calibration and matching of the capacitors using dedicated digital circuitry and algorithms.

Embodiments of the present disclosure include a microcontroller with a frequency test circuit, a device-under-test (DUT) input, and a calculation engine circuit. The calculation engine circuit is configured to compare a measured frequency from the frequency test circuit measured from the DUT input to a reference frequency stored in memory, and, based on the comparison, adjust frequency of the DUT generating the DUT input.

The present disclosure provides a measurement application device calibration unit, comprising a coupling element comprising a first connection and a second connection for coupling the coupling element into a signal measurement path, and a third connection, wherein the coupling element is configured to at least one of couple out a signal from the signal measurement path into the third connection, and couple in a signal from the third connection into the signal measurement path, and comprising a signal processing device that is coupled to the third connection of the coupling element and that is configured to receive the predetermined calibration signal when the coupling element couples out a signal from the signal measurement path into the third connection, and to generate a predetermined calibration signal when the coupling element couples in a signal from the third connection into the signal measurement path.

A graphene-based broadband radiation sensor and methods for operation thereof are disclosed. The radiation sensor includes an electrical signal path for carrying electrical signals and one or more resonance structures connected to the electrical signal path. Each resonance structure includes a resonator having a resonant frequency. Each resonance structure also includes a graphene junction connected in series with the resonator, the graphene junction including a graphene layer and having an impedance that is dependent on a temperature of the graphene layer. Each resonance structure further includes a heating element that is thermally coupled to the graphene layer and is configured to receive an incident photon, where the temperature of the graphene layer increases in response to the heating element receiving the incident photon.

A built-in self-test (BIST) methodology and apparatus provide for testing and calibration of an integrated circuit oscillator circuit topology that uses a one-pin (a single-pin) external resonator. The method employs dedicated test circuitry, also referred to herein as BIST apparatus, for the pass/fail verification of both the active and passive building blocks of the oscillator. At the same time, the methodology ensures accurate calibration and matching of the capacitors using dedicated digital circuitry and algorithms.