A testing device includes a power supply and a plurality of testing ports. The testing ports are electrically connected to the power supply. Each of the testing ports includes a contact and a current clamper. The contact is configured to electrically couple a device under test (DUT). The current clamper is connected between the power supply and the contact and configured to allow a limited current having a predetermined current value to flow to the contact.

A measurement device is described that comprises a measurement unit configured to perform measurements on an electric signal of a device under test while applying at least one measurement parameter for performing the measurements. The measurement device has an integrated direct current source configured to power the device under test. The measurement device also comprises a monitoring unit configured to monitor at least one monitoring parameter of the direct current source. The measurement device has a control unit configured to control the measurement parameter. Further, a method for measuring a device under test is described.

An electronic apparatus is provided. The electronic apparatus includes a communication interface configured to communicate with an external device, a memory, and a processor. The processor is configured to transmit a control signal requesting the external device to apply a first signal to a transparent electrode sheet connected to the external device, to the external device, receive, from the external device, a first point at which the first signal is applied to the transparent electrode sheet, a second point at which a second signal that is a response signal to the first signal is acquired by the external device, and a waveform of the second signal, and identify whether a defect exists in the transparent electrode sheet based on a difference between the first point and the second point, and the waveform of the second signal.

A system and method for determining the linearity of a device-under-test combine a first periodic signal and a second periodic signal to produce a combined signal, wherein the second periodic signal has at least one of a phase difference and a frequency difference with respect to the first periodic signal, and applying the combined signal to an input of the device-under-test. The linearity of the device-under-test is determined from an output signal of the device-under-test based on the at least one of the phase difference and frequency difference between the first periodic signal and the second periodic signal.

A test system is disclosed. The test system includes a programmable switching array including input terminals, output terminals, and an array of programmable switches configured for selectively connecting any one of the input terminals to any one of output terminals; and a current supply device comprising a multiplexed digital bus and a plurality of a power supplies connected in parallel between the multiplexed digital bus and the input terminals of the programmable switching array.

A system for inspecting or screening electrically powered device includes a signal generator inputting a preselected signal into the electrically powered device. There is also an antenna array positioned at a pre-determined distance above the electrically powered device. Apparatus collects RF energy emitted by the electrically powered device in response to input of said preselected signal. The signature of the collected RF energy is compared with an RF energy signature of a genuine part. The comparison determines one of a genuine or counterfeit condition of the electrically powered device.

When a voltage applied to a heater assumes a low-level potential, a control section of a load drive apparatus instantaneously supplies an anomaly judgment current to the heater, and computes the electrical resistance of the heater on the basis of the anomaly judgment current. The control section judges whether or not any of anomalous states of the heater, including at least a deteriorated state of the heater and wiring anomalous states of the heater, has occurred on the basis of the electrical resistance of the heater.

A measuring process unit for executing a measuring process of, in correspondence with a plurality of combinations obtained by respectively combining a plurality of connection terminals Tx and a plurality of connection terminals Ty, and in respect of the connection terminals Tx, Ty corresponding to each of the combinations, supplying an AC voltage SA to the connection terminals Ty by means of an AC current source 2 and detecting electric current flowing in the connection terminals Tx by means of an ammeter 3, to thereby acquire currents corresponding to each of the combinations; and a calculating unit for executing a calculating process of, based on the size of the currents detected by the ammeter 3 in the measuring process and on information indicating the currents' phases, calculating capacitance and resistance values corresponding to each of the combinations.

A method of testing a semiconductor device having a DC line configured to carry either a DC signal or a DC voltage and a circuit electrically connected to the DC line includes: during a first part of a test sequence, enabling a switch device so as to electrically connect a capacitor to the DC line via the switch device and applying a test signal to the circuit while the capacitor is electrically connected to the DC line; and during a second part of the test sequence, disabling the switch device so as to electrically disconnect the capacitor from the DC line via the switch device, injecting an AC signal onto the DC line after the capacitor is electrically disconnected from the DC line, and measuring a response of the circuit to the AC signal.

An evaluation test apparatus is configured to evaluate or test measurement precision of a biological information measurement device configured to measure biological information. The evaluation test apparatus includes: a function generator configured to generate a plurality of input waveform signals by a predetermined operation; an indenter configured to pressure a piezoelectric element of the biological information measurement device; a vibration driver selected from a motor and a solenoid and configured to vibrate the indenter; and a control board configured to control the vibration driver. The control board includes an adder configured to combine the plurality of input waveform signals generated by the function generator. The vibration driver vibrates the indenter based on a composite waveform signal combined by the adder.