An electronic device, a signal validator, and a method for signal validation are provided. The electronic device includes a circuit board generating a plurality of signals and a signal validator. The signal validator records a current voltage level of each signal as a sequence code and records a time interval between the sequence code and a previous sequence code as a delay time corresponding to the sequence code when a voltage level of one of the plurality of signals changes. The signal validator sequentially determines whether the sequence code matches with a prearranged sequence code. When the sequence code matches with the prearranged sequence code, the signal validator determines whether each delay time corresponding to each sequence code exceeds a predetermined delay time. When the delay time is less than the predetermined delay time, the signal validator determines that the plurality of signals passes signal validation.

A test system is disclosed. The test system includes a programmable switching array including input terminals, output terminals, and an array of programmable switches configured for selectively connecting any one of the input terminals to any one of output terminals; and a current supply device comprising a multiplexed digital bus and a plurality of a power supplies connected in parallel between the multiplexed digital bus and the input terminals of the programmable switching array.

A state output circuit that outputs a state signal indicating a state of a power supply apparatus, including: a state output terminal that outputs the state signal; a reference potential line to which a reference potential is applied; a first pull-up terminal to which a first pull-up potential is applied, wherein the first pull-up potential is a potential higher than the reference potential; a connection switch unit that is provided between the state output terminal and the reference potential line, and switches whether to connect the state output terminal to the reference potential line or not, in accordance with the state of the power supply apparatus; a first protection resistor provided between the connection switch unit and the state output terminal; and a pull-up unit that pulls up a first connection line between the first protection resistor and the connection switch unit up to the first pull-up potential.

A test and measurement system includes a power device having an interface to allow connection to one or more devices under test (DUTs), and one or more processors configured to execute code that, when executed, causes the one or more processors to receive a selection between static and dynamic characterization, and to configure the power device to perform the selected one of static or dynamic characterization of the one or more DUTs, a measurement device, having a user interface, one or more processors configured to execute code that, when executed, causes the one or more processors to: receive user inputs through the user interface, the user inputs including at least the selection between static and dynamic characterization, and send the selected one of static or dynamic characterization to the power device, and a connector to connect the power device to the measurement device. A method of operating a combined static and dynamic device characterization platform includes receiving, through a user interface on a measurement device, a user input selecting between static and dynamic characterization of one or more devices under test (DUTs), sending the user input through a connection between the measurement device and a power device, receiving the user input at a power device, controlling signals to the one or more DUTs in the power device to perform one of static or dynamic characterization of the one or more DUTs, and sending output data resulting from the characterization to the measurement device.

A method for detecting an open circuit state failure in a piezoelectric element connection includes exciting a piezoelectric element with an excitation signal and monitoring and evaluating an electrical output signal generated by the piezoelectric element in response to the excitation signal. The excitation signal is a pulse train. A frequency of the pulse train is chosen such that the piezoelectric element acts as a low pass filter.

A system and a method of diagnosing abnormality of a main control unit, in which an auxiliary control unit for diagnosing an abnormal operation of a main control unit is additionally included in a battery management system including one or more battery management modules and the main control unit controlling the battery management module, thereby more stably driving the battery management system.

A measurement system for determining a phase and amplitude influence of a device under test, comprising a measurement instrument having a signal generator, a local oscillator, a first mixer and an analysis unit is disclosed. The signal generator is configured to generate a source signal with a predetermined source frequency and a source phase, and to forward the source signal to the device under test, wherein the source signal is altered by the device under test in at least one of amplitude and phase, such that a measurement signal is generated and forwarded to the first mixer. The local oscillator is configured to generate a local oscillator signal with a predetermined local oscillator frequency and a local oscillator phase, and to forward the local oscillator signal to the first mixer. The first mixer is configured to mix the measurement signal and the local oscillator signal, thereby generating a first mixer signal. The analysis unit is located downstream of the first mixer and is configured to analyze the first mixer signal or a processed version of the first mixer signal. The measurement instrument is configured to perform at least two measurements of the phase and amplitude influence of the device under test by analyzing the first mixer signal or the processed version of the first mixer signal, wherein at least one of the source phase and the local oscillator phase is altered between the at least two measurements.

In an embodiment, an input-output (IO) device may include an IO controller and a debug controller. The IO controller may process IO data packets. The debug controller may be to: receive a first debug packet from a host system via an in-band connection, process the first debug packet to extract a command generated by the host system, and execute the extracted command to debug the IO device. Other embodiments are described and claimed.

An electronic device such as an e-fuse includes analog circuitry configured to be set to one or more self-test configurations. To that effect the device has self-test controller circuitry in turn including: an analog configuration and sensing circuit configured to set the analog circuitry to one or more self-test configurations and to sense test signals occurring in the analog circuitry set to such self-test configurations, a data acquisition circuit configured to acquire and convert to digital the test signals sensed at the analog sensing circuit, and a fault event detection circuit configured to check the test signals converted to digital against reference parameters. The device includes integrated therein a self-test controller configured to control parts or stages of the device to configure circuits, acquire data and control test execution under the coordination of a test sequencer.

A reflectometry system for the analysis of faults in a transmission line into which a complex signal, generated then modulated, has been injected, includes a means for measuring the modulated complex signal propagating in the transmission line, a demodulator of the measured signal designed to produce a demodulated complex signal, a complex correlator configured for correlating the demodulated complex signal with a copy of the generated complex signal, in order to produce a first time-domain reflectogram corresponding to the real part of the complex correlation and a second time-domain reflectogram corresponding to the imaginary part of the complex correlation, a module for joint analysis of the first time-domain reflectogram and of the second time-domain reflectogram for identifying the presence of faults in the transmission line.