An electronic device, a signal validator, and a method for signal validation are provided. The electronic device includes a circuit board generating a plurality of signals and a signal validator. The signal validator records a current voltage level of each signal as a sequence code and records a time interval between the sequence code and a previous sequence code as a delay time corresponding to the sequence code when a voltage level of one of the plurality of signals changes. The signal validator sequentially determines whether the sequence code matches with a prearranged sequence code. When the sequence code matches with the prearranged sequence code, the signal validator determines whether each delay time corresponding to each sequence code exceeds a predetermined delay time. When the delay time is less than the predetermined delay time, the signal validator determines that the plurality of signals passes signal validation.

An apparatus and method for initiating thermal runaway in a battery cell are provided. The apparatus and method may be used in safety research of battery cells and packs to initiate thermal runaway. The apparatus comprises a resistive heating element for positioning in thermal contact with the battery cell for transferring heat to a region of the battery cell. An energy source is electrically coupled to the resistive heating element. A switch selectively forms a circuit to send a current pulse through the resistive heating element to generate a power pulse at the resistive heating element to heat the region of the battery cell for initiating thermal runaway. Alternatively, the heating element is heated and held at a predetermined temperature until thermal runaway is initiated. The heat generation rate may be designed to be comparable to that of an internal short circuit within a cell, which is much faster than many existing slow heating methods used to initiate thermal runaway.

A control method is provided and used to place a target object on a test platform in a cabin of a testing device, to sense the temperature of the target object by a temperature response structure, and then to receive temperature signals of the temperature response structure by a controller, where the controller can regulate the pressure inside the cabin to control the air pressure of the cabin, so that the target object can still maintain good heat dissipation under high power consumption.

Various embodiments of the invention provide a system and a method for testing one or more devices under test (DUTs) and for checking one or more test setups. Each of the one or more test setups includes a test board having several sockets for receipt of a DUT. A custom hardware interface is used to electrically connect the test board, such as a burn-in board with a test system configuration having multiple modules that can be configured using a computer device and related software to provide customized testing of the DUTs. The system is scalable to accommodate any DUT having any number of channels and to provide customized testing. Results of the testing are sent to the computing device.

A high-pressure burn-in test apparatus comprises a burn-in furnace including a high-pressure burn-in furnace cavity equipped with a driving motor, at least one intake manifold, at least one extension manifold equipped with a nozzle, a communicating tube connected to the intake manifold, and a fan. A processing chamber having a test board is formed inside the high-pressure burn-in furnace cavity. The periphery of at least one of the intake manifold is connected to the at least one extension manifold. At least one component to be tested is placed on the test board. High-pressure gas is ejected through the nozzle to disturb the gas around the component to be tested. The fan is installed in the processing chamber. The driving motor drives the fan to rotate, so that the gas in the processing chamber generates convection, to improve the uniformity of gas temperature distribution.

An apparatus including a set of one or more receivers; a first replica circuit being a substantial replica of at least a portion of one of the set of one or more receivers; a first control circuit generates an output signal selectively coupled to an input of the first replica circuit; a second replica circuit being a substantial replica of at least a portion of one of the set of one or more receivers; a comparator including a first input coupled to a first output of the first replica circuit, a second input coupled to a second output of the second replica circuit, and an output; and a second control circuit including an input coupled to the output of the comparator, and an output coupled to the first replica circuit and to the set of one or more receivers.

An integrated circuit includes a multiplexer circuit coupled to receive a first clock signal and a second clock signal and coupled to provide an output clock signal to a channel. A protection circuit is coupled to receive a feedback signal from the channel. The protection circuit causes the multiplexer circuit to provide oscillations in the second clock signal to the output clock signal in response to the feedback signal indicating that the channel is idle to cause the channel to be in a protection mode that reduces degradation from bias temperature instability. The protection circuit causes the multiplexer circuit to provide oscillations in the first clock signal to the output clock signal in response to the feedback signal indicating that the channel is active.

A test board and a test apparatus having the same are disclosed. The test board includes a base plate including a connector and a plurality of mounting areas in a matrix shape having a mounting row in a first direction and a mounting column in a second direction, a plurality of test units arranged on the mounting areas of the base plate and a test object is mounted in each of the mounting areas, and a fluid supplier disposed on the base plate and supplying a test fluid to each of the test units having a test temperature and a supplementary fluid to the test object to reduce a temperature difference between an actual temperature of the test object and the test temperature such that the actual temperature of the test objects is substantially below the test temperature.

A method of screening a lot of capacitors is provided. The method includes measuring a first leakage current of each individual capacitor in a first set of capacitors and calculating a first mean leakage current; removing each of the individual capacitors having a measured first leakage current equal to or above a first predetermined value, forming a second set of capacitors; subjecting the second set of capacitors to a burn in treatment; measuring a second leakage current for each of the individual capacitors in the second set and calculating a second mean leakage current; comparing the second leakage current for each of the individual capacitors to the first leakage current for each of the individual capacitors; and removing each of the individual capacitors having a second leakage current equal to or above a second predetermined value and/or having a second leakage current that does not change by a specified amount compared to the first leakage current for each of the individual capacitors.

A substrate testing apparatus configured to perform a hot electron analysis (HEA) test for analyzing a stand-by failure in a substrate includes a heating chuck having a first surface configured to support the substrate and a second surface opposite to the first surface. The heating chuck is configured to heat the substrate and has an aperture passing through the first surface and the second surface. A substrate moving device moves the substrate on the heating chuck in a lateral direction. A camera is under the heating chuck and photographs the substrate, which is exposed by the heating chuck aperture.